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    • 2. 发明授权
    • Integrated circuit device incorporating DLL circuit
    • 集成电路器件结合DLL电路
    • US06522182B2
    • 2003-02-18
    • US09385008
    • 1999-08-27
    • Hiroyoshi TomitaNaoharu ShinozakiNobutaka TaniguchiWaichirou FujiedaYasuharu SatoKenichi KawasakiMasafumi YamazakiKazuhiro Ninomiya
    • Hiroyoshi TomitaNaoharu ShinozakiNobutaka TaniguchiWaichirou FujiedaYasuharu SatoKenichi KawasakiMasafumi YamazakiKazuhiro Ninomiya
    • H03L706
    • H03L7/0805G11C7/1072G11C7/222H03K5/131
    • In the present invention, an external power source supplied to an integrated circuit device is divided into a first external power source for the DLL circuit and a second external power source for circuits other than the DLL circuit. According to the present invention, it is arranged that power source noise generated in the second external power source cannot be transmitted to the variable delay circuit by utilizing the first external power source preferably for the variable delay circuit of the DLL circuit and even more preferably for its delay unit. Also, preferably, it is arranged that power source noise generated in the second external power source cannot be transmitted to the phase coincidence detection unit by utilizing the first power source for the phase coincidence detection unit in the phase comparison circuit of the DLL circuit. Also, by connecting the first external earthing power source to the variable delay circuit and/or phase coincidence detection unit, the effect of power source noise from the second external earthing power source originating from the operation of circuits other than these is suppressed.
    • 在本发明中,提供给集成电路装置的外部电源被分成用于DLL电路的第一外部电源和除了DLL电路以外的电路的第二外部电源。 根据本发明,通过利用第一外部电源优选用于DLL电路的可变延迟电路,而将第二外部电源中产生的电源噪声不能传输到可变延迟电路,甚至更优选地用于 其延迟单位。 此外,优选地,通过利用DLL电路的相位比较电路中的相位一致检测单元的第一电源,将第二外部电源中产生的电源噪声不能发送到相位一致检测单元。 此外,通过将第一外部接地电源连接到可变延迟电路和/或相位一致检测单元,抑制源于除了这些以外的电路的操作的来自第二外部接地电源的电源噪声的影响。
    • 3. 发明授权
    • Semiconductor integrated circuit and method of operating the same
    • 半导体集成电路及其运行方法
    • US06307806B1
    • 2001-10-23
    • US09652162
    • 2000-08-31
    • Hiroyoshi TomitaNaoharu Shinozaki
    • Hiroyoshi TomitaNaoharu Shinozaki
    • G11C800
    • G11C7/1018G11C8/18G11C11/4082G11C29/78
    • A command receiving circuit receives a command signal for determining a circuit operation, in synchronization with a clock signal and it outputs the received command signal as an internal command signal. An address switching circuit permits transmission of an address signal to an internal circuit upon receiving the command signal. The internal circuit receives the address signal before the reception of the command signal, thereby to start its operation. As a result, the internal circuit can be operated at high speed. Besides, the address switching circuit inhibits the transmission of the address signal to the internal circuit upon receiving the internal command signal or the clock signal. Therefore, even when the level of the address signal has changed after the reception of the command signal, the change does not lead to operating the internal circuit. Accordingly, the power consumption of the semiconductor integrated circuit is reduced. Meanwhile, the semiconductor integrated circuit comprises a plurality of memory cores and a bank switch for selecting the memory cores. The bank switch feeds the address signal to predetermined memory core(s) of the memory cores in accordance with the value of the address signal. Since the memory core can receive the address signal before the validation of a command, the circuit operation is performed at high speed even in the semiconductor integrated circuit including the plurality of memory cores are controlled as bank.
    • 命令接收电路与时钟信号同步地接收用于确定电路操作的命令信号,并且将所接收的命令信号作为内部命令信号输出。 地址切换电路允许在接收到命令信号时将地址信号发送到内部电路。 内部电路在接收到命令信号之前接收地址信号,从而开始其操作。 因此,内部电路可以高速运转。 此外,地址切换电路在接收到内部命令信号或时钟信号时,禁止向内部电路发送地址信号。 因此,即使在接收到指令信号之后地址信号的电平变化,也不会导致内部电路的工作。 因此,半导体集成电路的功耗降低。 同时,半导体集成电路包括多个存储器核和用于选择存储器核的组开关。 存储体交换机根据地址信号的值将存储器核心的地址信号提供给预定的存储器核心。 由于存储核心可以在命令验证之前接收地址信号,所以即使在包括多个存储器核心的半导体集成电路被控制为存储体的情况下,电路操作也以高速执行。
    • 6. 发明授权
    • Semiconductor memory device equipped with serial/parallel conversion circuitry for testing memory cells
    • 半导体存储器件配有用于测试存储单元的串行/并行转换电路
    • US06317372B1
    • 2001-11-13
    • US09528983
    • 2000-03-20
    • Tomonori HayashiNaoharu ShinozakiHiroyoshi Tomita
    • Tomonori HayashiNaoharu ShinozakiHiroyoshi Tomita
    • G11C2900
    • G11C29/40G11C29/34G11C29/48
    • An input conversion unit converts serial data supplied from the exterior into parallel data. Each of the converted parallel data is respectively written into a plurality of memory cell areas. An output conversion unit converts parallel data constructed by data read from each memory cell area into serial data. An operational unit is activated during a testing mode so as to logically operate on the parallel data read from each memory cell area. By writing predetermined data into each memory cell area in advance, it is confirmed by a logic operation that correct data is stored in each memory cell area. The data can be checked simultaneously for the plurality of memory cell areas so that the operation test in the memory cell areas can be carried out at high speed. Besides, serial data accepted, twice per cycle of a data strobe signal, is converted into parallel data. Each of the converted parallel data is respectively written into a first memory cell area and a second memory cell area. Parallel data read from the first and second memory cell area is logically operated in a testing mode and the operation result is output at once in synchronization with the clock signal. Accordingly, the data can be checked simultaneously for the first and the second memory cell area so that the operation test in the memory cell areas can be carried out at high speed.
    • 输入转换单元将从外部提供的串行数据转换为并行数据。 每个转换的并行数据分别写入多个存储单元区域。 输出转换单元将从每个存储单元区域读取的数据构成的并行数据转换为串行数据。 在测试模式期间激活操作单元,以便对从每个存储单元区域读取的并行数据进行逻辑运算。 通过预先将预定数据写入每个存储单元区域,通过逻辑运算来确认正确的数据被存储在每个存储单元区域中。 可以同时检查多个存储单元区域的数据,使得可以高速地执行存储单元区域中的操作测试。 此外,接受数据选通信号每周期两次的串行数据被转换为并行数据。 每个转换的并行数据分别被写入第一存储器单元区域和第二存储器单元区域中。 从第一和第二存储单元区域读取的并行数据在测试模式下逻辑运行,并且与时钟信号同步地一次输出运算结果。 因此,可以同时检查第一和第二存储单元区域的数据,使得可以高速地执行存储单元区域中的操作测试。
    • 8. 发明授权
    • Semiconductor device with current mirror circuit having two transistors of identical characteristics
    • 具有电流镜电路的半导体器件具有两个相同特性的晶体管
    • US07723796B2
    • 2010-05-25
    • US11902568
    • 2007-09-24
    • Hiroyoshi Tomita
    • Hiroyoshi Tomita
    • H01L23/62
    • G05F3/262H01L29/4238
    • A semiconductor device includes a current-mirror circuit including a first ring-shape gate, a second ring-shape gate, a first diffusion layer formed around the first ring-shape gate and the second ring-shape gate, a second diffusion layer formed inside the first ring-shape gate, a third diffusion layer formed inside the second ring-shape gate, an interconnect line electrically connecting the first ring-shape gate and the second ring-shape gate to a same potential, and an STI area formed around the first diffusion layer, wherein a first transistor corresponding to the first ring-shape gate and a second transistor corresponding to the second ring-shape gate constitute the current-mirror circuit, wherein gates of dummy transistors that do not function as transistors are situated between the STI area and the first and second ring-shape gates, and are arranged both in a first direction and in a second direction substantially perpendicular to the first direction.
    • 一种半导体器件包括:电流镜电路,包括第一环形栅极,第二环形栅极,形成在第一环状栅极和第二环形栅极周围的第一扩散层,第二扩散层, 第一环形栅极,形成在第二环形栅极内部的第三扩散层,将第一环形栅极和第二环形栅极电连接到相同电位的互连线,以及形成在第二环形栅极周围的STI区域 第一扩散层,其中对应于第一环形栅极的第一晶体管和对应于第二环形栅极的第二晶体管构成电流镜电路,其中不用作晶体管的虚拟晶体管的栅极位于 STI区域和第​​一和第二环形门,并且布置在基本上垂直于第一方向的第一方向和第二方向上。
    • 9. 发明授权
    • Semiconductor device and fabrication method thereof
    • 半导体器件及其制造方法
    • US07539042B2
    • 2009-05-26
    • US11783318
    • 2007-04-09
    • Hiroyoshi Tomita
    • Hiroyoshi Tomita
    • G11C11/24G11C7/00G11C8/00
    • G11C11/4074G11C11/401G11C29/50G11C2029/0403G11C2207/2254H01L27/0207H01L27/10829
    • The present invention suppresses the refresh failure of a DRAM due to the dispersion of a threshold of a MOSFET. The DRAM has a first unit for recording a set value of a back bias potential to be applied to a back gate of a cell transistor and a second unit for generating a back bias potential based on the set value of the back bias potential recorded in the first unit and supplying the generated back bias potential to the back gate, wherein when a threshold of a MOSFET which has a structure identical to the cell transistor and which has been fabricated in the same process as the cell transistor is greater than a target value which the cell transistor should have, a value shallower than the back bias potential for the target value is recorded in the second unit.
    • 本发明抑制由于MOSFET的阈值的偏差引起的DRAM的刷新故障。 DRAM具有第一单元,用于记录要施加到单元晶体管的背栅的背偏置电位的设定值,以及用于产生背偏电位的第二单元,其基于记录在所述单元晶体管中的背偏电位的设定值 第一单元并将所产生的反向偏置电位提供给所述后栅极,其中当具有与所述单元晶体管相同的并且已经以与所述单元晶体管相同的工艺制造的结构的MOSFET的阈值大于目标值时, 单元晶体管应当具有比目标值的背偏电位浅的值被记录在第二单元中。