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1. 发明授权

US06875984B2 Bio electron microscope and observation method of specimen 失效
标题翻译：生物电子显微镜和样品观察方法
公开(公告)号：US06875984B2
公开(公告)日：2005-04-05
申请号：US10621444
申请日：2003-07-18
申请人： Hiroshi Kakibayashi , Shigeyuki Hosoki , Yuji Takagi , Ryo Miyake , Kuniyasu Nakamura , Mitsugu Sato , Hiroyuki Kobayashi
发明人： Hiroshi Kakibayashi , Shigeyuki Hosoki , Yuji Takagi , Ryo Miyake , Kuniyasu Nakamura , Mitsugu Sato , Hiroyuki Kobayashi
IPC分类号： G01N23/04 , G01N1/28 , G01N23/225 , G01N33/483 , G01N37/00 , H01J37/20 , H01J37/22 , H01J37/26 , H01J37/28 , H01J49/44
CPC分类号： H01J37/22 , H01J37/26 , H01J2237/05 , H01J2237/2809 , H01J2237/2813
摘要： A bio electron microscope and an observation method which can observe a bio specimen by low damage and high contrast to perform high-accuracy image analysis, and conduct high-throughput specimen preparation. 1) A specimen is observed at an accelerating voltage 1.2 to 4.2 times a critical electron accelerating voltage possible to transmit a specimen obtained under predetermined conditions. 2) An electron energy filter of small and simplified construction is provided between the specimen and an electron detector for imaging by the electron beam in a specified energy region of the electron beams transmitting the specimen. 3) Similarity between an observed image such as virus or protein in the specimen and a reference image such as known virus or protein is subjected to quantitative analysis by image processing. 4) A preparation protocol of the bio specimen is made into a chip using an MEMS technique, which is then mounted on a specimen stage part of an electron microscope to conduct specimen introduction, preparation and transfer onto a specimen holder.
摘要翻译：一种生物电子显微镜和观察方法，可以通过低损伤和高对比度观察生物样品，进行高精度图像分析，并进行高通量样品制备。 1）在可能传输在预定条件下获得的样品的临界电子加速电压的1.2至4.2倍的加速电压下观察样品。 2）在样品和电子检测器之间提供小而简化结构的电子能过滤器，用于通过电子束在传输样品的电子束的规定能量区域内的电子束进行成像。 3）通过图像处理对样本中的观察图像（例如病毒或蛋白质）与已知病毒或蛋白质等参考图像之间的相似性进行定量分析。 4）使用MEMS技术将生物样品的制备方案制成芯片，然后将其安装在电子显微镜的样品台部分上，以将样品引入，准备和转移到样品架上。

2. 发明授权

US06548811B1 Transmission electron microscope apparatus with equipment for inspecting defects in specimen and method of inspecting defects in specimen using transmission electron microscope 有权
标题翻译：透射电子显微镜装置，其具有用于检查样品缺陷的设备和使用透射电子显微镜检查样品中的缺陷的方法
公开(公告)号：US06548811B1
公开(公告)日：2003-04-15
申请号：US09504044
申请日：2000-02-14
申请人： Kuniyasu Nakamura , Hiroshi Kakibayashi
发明人： Kuniyasu Nakamura , Hiroshi Kakibayashi
IPC分类号： H01J3704
CPC分类号： H01J37/26 , H01J37/295 , H01J2237/1506
摘要： In order to detect automatically at a high speed and a high probability rate the crystal defects and shape abnormalities in a specimen over a wide area of said specimen, a transmission electron microscope apparatus is employed which has an electron source, a first electrostatic lens, a second electrostatic lens, a third electrostatic lens, a first condenser lens, a second condenser lens, a pre-field objective lens, a deflection coil, a first projection lens, a second projection lens, a third projection lens, a first image shift coil, a second image shift coil, and an image acquisition apparatus, etc. The detection of crystal defects is made definite by observing the specimen image at the same location by multiple variations of the electron beam incidence direction using the deflection coil. In addition, the crystal defects are detected at a high speed by linking the deflection ratios of the deflection coil and of the first image shift coil and the second image shift coil, and carrying out compensation so that image shifts on the image acquisition apparatus due to the multiple electron beam incidence directions are mutually cancelled.
摘要翻译：为了在所述样本的广泛区域上以高速度和高概率率自动检测样品中的晶体缺陷和形状异常，使用透射型电子显微镜装置，其具有电子源，第一静电透镜，第二静电透镜，第三静电透镜，第一聚光透镜，第二聚光透镜，预场物镜，偏转线圈，第一投影透镜，第二投影透镜，第三投影透镜，第一图像移动线圈，第二图像移位线圈和图像采集装置等。通过使用偏转线圈通过电子束入射方向的多个变化在相同位置观察样本图像来确定晶体缺陷的检测。此外，通过连接偏转线圈和第一图像移位线圈与第二图像移位线圈的偏转比，高速检测晶体缺陷，并执行补偿，使得图像在图像采集装置上的偏移由于多个电子束入射方向相互抵消。

3. 发明授权

US06822233B2 Method and apparatus for scanning transmission electron microscopy 失效
标题翻译：扫描透射电子显微镜的方法和装置
公开(公告)号：US06822233B2
公开(公告)日：2004-11-23
申请号：US10346138
申请日：2003-01-17
申请人： Kuniyasu Nakamura , Hiroshi Kakibayashi , Mikio Ichihashi , Shigeto Isakozawa , Yuji Sato , Takahito Hashimoto
发明人： Kuniyasu Nakamura , Hiroshi Kakibayashi , Mikio Ichihashi , Shigeto Isakozawa , Yuji Sato , Takahito Hashimoto
IPC分类号： H01J3704
CPC分类号： H01J37/1471 , H01J37/28 , H01J2237/2802
摘要： A scanning transmission electron microscope (STEM) has an electron source for generating a primary electron beam and an electron illuminating lens system for converging the primary electron beam from the electron source onto a specimen for illumination. An electron deflecting system is provided for scanning the specimen with the primary electron beam. The STEM also has a scattered electron detector for detecting scattered electrons transmitted through the specimen. A projection lens system projects the scattered electrons onto a detection surface of the scattered electron detector. An image displaying device displays the scanning transmission electron microscope image of the specimen using a detection signal from the scattered electron detector. A detection angle changing device for establishes the range of the scattering angle of the scattered electrons detected by the scattered electron detector. This structure enhances the contrast of a desired portion of the specimen under observation for a scanning transmitted image by selective establishment of detection angle ranges for the scattered electron detector.
摘要翻译：扫描透射电子显微镜（STEM）具有用于产生一次电子束的电子源和用于将来自电子源的一次电子束聚焦到用于照明的样本上的电子照明透镜系统。提供电子偏转系统用于用一次电子束扫描样本。 STEM还具有散射电子检测器，用于检测通过样品传播的散射电子。投影透镜系统将散射的电子投射到散射电子检测器的检测表面上。图像显示装置使用来自散射电子检测器的检测信号来显示样本的扫描透射电子显微镜图像。一种用于确定由散射电子检测器检测的散射电子的散射角的范围的检测角度改变装置。该结构通过选择性地建立散射电子检测器的检测角度范围，增强了扫描透射图像观察下的样本的期望部分的对比度。

4. 发明授权

US6051834A Electron microscope 失效
标题翻译：电子显微镜
公开(公告)号：US6051834A
公开(公告)日：2000-04-18
申请号：US126432
申请日：1998-07-30
申请人： Hiroshi Kakibayashi , Yasuhiro Mitsui , Hideo Todokoro , Katsuhiro Kuroda , Masanari Koguchi , Kazutaka Tsuji , Tatsuo Makishima , Mikio Ichihashi , Shigeto Isakozawa , Ruriko Tsuneta , Kuniyasu Nakamura , Kensuke Sekihara , Jun Motoike
发明人： Hiroshi Kakibayashi , Yasuhiro Mitsui , Hideo Todokoro , Katsuhiro Kuroda , Masanari Koguchi , Kazutaka Tsuji , Tatsuo Makishima , Mikio Ichihashi , Shigeto Isakozawa , Ruriko Tsuneta , Kuniyasu Nakamura , Kensuke Sekihara , Jun Motoike
IPC分类号： H01J37/26 , H01J37/28
CPC分类号： H01J37/28 , H01J2237/226 , H01J2237/2802 , H01J2237/2807
摘要： 3-dimensional observation on the atomic arrangement and atomic species in a thin-film specimen are carried out at high speed and accuracy by an electron microscope which measures electrons emitted at high angle from the specimen. A scanning transmission electron microscope has an electron detection device comprising a scintillator converting electrons detected thereby to photons, a photoconductive-film converting photons from the scintillator detected thereby to c.a. 1000 times as many electron-hole pairs as these photons.
摘要翻译：通过电子显微镜高速准确地进行薄膜样品中的原子排列和原子物质的三维观察，该电子显微镜测量从试样以高角度发射的电子。扫描透射电子显微镜具有电子检测装置，该电子检测装置包括将由此检测的电子转化为光子的闪烁体，从其检测的闪烁体的光电导膜转换光子至c.a. 这些光子是电子 - 空穴对的1000倍。

5. 发明授权

US06531697B1 Method and apparatus for scanning transmission electron microscopy 失效
标题翻译：扫描透射电子显微镜的方法和装置
公开(公告)号：US06531697B1
公开(公告)日：2003-03-11
申请号：US09259334
申请日：1999-03-01
申请人： Kuniyasu Nakamura , Hiroshi Kakibayashi , Mikio Ichihashi , Shigeto Isakozawa , Yuji Sato , Takahito Hashimoto
发明人： Kuniyasu Nakamura , Hiroshi Kakibayashi , Mikio Ichihashi , Shigeto Isakozawa , Yuji Sato , Takahito Hashimoto
IPC分类号： H01J3700
CPC分类号： H01J37/1471 , H01J37/28 , H01J2237/2802
摘要： A scanning transmission electron microscope (STEM) has an electron source for generating a primary electron beam and an electron illuminating lens system for converging the primary electron beam from the electron source onto a specimen for illumination. An electron deflecting system is provided for scanning the specimen with the primary electron beam. The STEM also has a scattered electron detector for detecting scattered electrons transmitted through the specimen. A projection lens system projects the scattered electrons onto a detection surface of the scattered electron detector. An image displaying device displays the scanning transmission electron microscope image of the specimen using a detection signal from the scattered electron detector. A detection angle changing device for establishes the range of the scattering angle of the scattered electrons detected by the scattered electron detector. This structure enhances the contrast of a desired portion of the specimen under observation for a scanning transmitted image by selective establishment of detection angle ranges for the scattered electron detector.
摘要翻译：扫描透射电子显微镜（STEM）具有用于产生一次电子束的电子源和用于将来自电子源的一次电子束聚焦到用于照明的样本上的电子照明透镜系统。提供电子偏转系统用于用一次电子束扫描样本。 STEM还具有散射电子检测器，用于检测通过样品传播的散射电子。投影透镜系统将散射的电子投射到散射电子检测器的检测表面上。图像显示装置使用来自散射电子检测器的检测信号来显示样本的扫描透射电子显微镜图像。一种用于确定由散射电子检测器检测的散射电子的散射角的范围的检测角度改变装置。该结构通过选择性地建立散射电子检测器的检测角度范围，增强了扫描透射图像观察下的样本的期望部分的对比度。

6. 发明授权

US5866905A Electron microscope 失效
标题翻译：电子显微镜
公开(公告)号：US5866905A
公开(公告)日：1999-02-02
申请号：US686740
申请日：1996-07-26
申请人： Hiroshi Kakibayashi , Yasuhiro Mitsui , Hideo Todokoro , Katsuhiro Kuroda , Masanari Koguchi , Kazutaka Tsuji , Tatsuo Makishima , Mikio Ichihashi , Shigeto Isakozawa , Ruriko Tsuneta , Kuniyasu Nakamura , Kensuke Sekihara , Jun Motoike
发明人： Hiroshi Kakibayashi , Yasuhiro Mitsui , Hideo Todokoro , Katsuhiro Kuroda , Masanari Koguchi , Kazutaka Tsuji , Tatsuo Makishima , Mikio Ichihashi , Shigeto Isakozawa , Ruriko Tsuneta , Kuniyasu Nakamura , Kensuke Sekihara , Jun Motoike
IPC分类号： H01J37/26 , H01J37/28
CPC分类号： H01J37/28 , G01N23/046 , G01R31/305 , G01N2223/419 , H01J2237/226 , H01J2237/2802 , H01J2237/2807
摘要： A scanning transmission electron microscope including an electron detection system having a scattering angle limiting aperture (for the inner angle) and a scattering angle limiting aperture (for the outer angle) between a specimen and an electron detector (comprising a scintillator and a light guide) and only one electron detector is installed.
摘要翻译：一种扫描透射电子显微镜，包括具有散射角限制孔径（内角）的电子检测系统和检体与电子检测器（包括闪烁体和光导体）之间的散射角限制孔径（外角）并且仅安装一个电子检测器。

7. 发明申请

US20130112875A1 SCANNING TRANSMISSION ELECTRON MICROSCOPE AND AXIAL ADJUSTMENT METHOD THEREOF 失效
标题翻译：扫描传输电子显微镜及其轴向调整方法
公开(公告)号：US20130112875A1
公开(公告)日：2013-05-09
申请号：US13808134
申请日：2011-07-11
申请人： Kuniyasu Nakamura , Hiromi Inada
发明人： Kuniyasu Nakamura , Hiromi Inada
IPC分类号： H01J37/26 , H01J37/28
CPC分类号： H01J37/263 , H01J37/28 , H01J2237/0451 , H01J2237/1501 , H01J2237/2802
摘要： A scanning transmission electron microscope equipped with an aberration corrector is capable of automatically aligning the position of a convergence aperture with the center of an optical axis irrespective of skill and experience of an operator. The scanning transmission electron microscope system includes an electron source; a condenser lens configured to converge an electron beam emitted from the electron source; a deflector configured to cause the electron beam to perform scanning on a sample; an aberration correction device configured to correct an aberration of the electron beam; a convergence aperture configured to determine a convergent angle of the electron beam; and a detector configured to detect electrons passing through or diffracted by the sample. The system acquires information on contrast of a Ronchigram formed by the electron beam passing through the sample, and determines a position of the convergence aperture on the basis of the information.
摘要翻译：配备有像差校正器的扫描透射电子显微镜能够自动地将会聚孔的位置与光轴的中心对齐，而与操作者的技术和经验无关。扫描透射电子显微镜系统包括电子源; 聚光透镜，被配置为会聚从电子源发射的电子束; 配置成使电子束对样品进行扫描的偏转器; 被配置为校正电子束的像差的像差校正装置; 收敛孔，被配置为确定电子束的收敛角; 以及检测器，其被配置为检测通过所述样品的衍射的电子。该系统获取通过通过样本的电子束形成的罗尼克拉姆的对比度的信息，并且基于该信息确定会聚孔径的位置。

8. 发明授权

US4160074A Polyisocyanate foam having isotropic cells and method and apparatus for preparing same 失效
标题翻译：具有各向同性电池的聚异氰酸酯泡沫及其制备方法和装置
公开(公告)号：US4160074A
公开(公告)日：1979-07-03
申请号：US872678
申请日：1978-01-26
申请人： Hiroshi Komada , Kuniyasu Nakamura , Ryoichi Miyagaki
发明人： Hiroshi Komada , Kuniyasu Nakamura , Ryoichi Miyagaki
IPC分类号： B29C33/30 , B29C44/58 , C08J9/00
CPC分类号： C08J9/00 , B29C44/10 , B29C44/586 , B29C33/30 , B29K2075/00 , C08J2375/04 , Y10S264/84
摘要： A polyisocyanate foam having isotropic cells is manufactured by a foaming operation in an apparatus comprising a mold composed of side walls capable of extending and returning, or folding and unfolding, in directions perpendicular to the free rising direction. Mold extending means are provided to spread out the side walls of the mold perpendicular to the free rising direction. While the foamable composition is in a creamy state, it is allowed to rise freely in one direction (the free rising direction), while the side walls of the mold are in their folded condition, until a height detecting means is actuated. Then the side walls of the mold are unfolded to enlarge the cross-sectional area of the mold so that the foamable composition is then permitted further to expand freely in directions perpendicular to the initial free rising direction, until the foamable composition is transformed from the creamy state to the tack-free state, whereby a polyisocyanate foam product having essentially spherical isotropic cells is obtained.
摘要翻译：具有各向同性电池的多异氰酸酯泡沫体通过发泡操作在包括由能够在垂直于自由上升方向的方向上延伸和返回或折叠和展开的侧壁构成的模具的装置中制造。提供模延伸装置以垂直于自由上升方向展开模具的侧壁。当可发泡组合物处于乳状状态时，允许其在一个方向（自由上升方向）上自由上升，同时模具的侧壁处于折叠状态，直到高度检测装置被致动。然后模具的侧壁展开以扩大模具的横截面积，从而允许可发泡组合物进一步在垂直于初始自由上升方向的方向上自由扩张，直到可发泡组合物从奶油状状态为无粘性状态，由此获得具有基本上球形各向同性电池的多异氰酸酯泡沫产品。

9. 发明授权

US07372029B2 Scanning transmission electron microscope and scanning transmission electron microscopy 失效
标题翻译：扫描透射电子显微镜和扫描透射电子显微镜
公开(公告)号：US07372029B2
公开(公告)日：2008-05-13
申请号：US11806120
申请日：2007-05-30
申请人： Ruriko Tsuneta , Masanari Koguchi , Takahito Hashimoto , Kuniyasu Nakamura
发明人： Ruriko Tsuneta , Masanari Koguchi , Takahito Hashimoto , Kuniyasu Nakamura
IPC分类号： G21K7/00 , G01N23/00
CPC分类号： H01J37/1474 , H01J37/2955 , H01J2237/1501 , H01J2237/221 , H01J2237/2802
摘要： A scanning transmission electron microscope for scanning a primary electron beam on a sample, detecting a transmitted electron from the sample by a detector, and forming an image of the transmitted electron. The scanning transmission electron microscope includes an electron-optics system which enables switching back the transmitted electron beam to the optical axis by a predetermined quantity, and a determining unit for determining the quantity based on a displacement of the transmitted electron with respect to the detector caused by the scanning of the primary electron beam.
摘要翻译：扫描透射电子显微镜，用于扫描样品上的一次电子束，通过检测器检测来自样品的透射电子，并形成透射电子的图像。扫描透射电子显微镜包括能够将透射电子束切换到光轴预定量的电子光学系统，以及用于基于发射的电子相对于检测器的位移来确定量的确定单元通过扫描一次电子束。

10. 发明申请

US20050285037A1 Scanning transmission electron microscope and electron energy loss spectroscopy 有权
标题翻译：扫描透射电子显微镜和电子能量损失光谱
公开(公告)号：US20050285037A1
公开(公告)日：2005-12-29
申请号：US11157817
申请日：2005-06-22
申请人： Kuniyasu Nakamura , Shunichi Watanabe
发明人： Kuniyasu Nakamura , Shunichi Watanabe
IPC分类号： G01N23/00
CPC分类号： H01J37/04 , H01J37/05 , H01J37/265 , H01J37/28 , H01J2237/04922 , H01J2237/057 , H01J2237/2802
摘要： The present invention provides a scanning transmission electron microscope which is capable of setting an acceptance angular range of an energy loss spectrometer independent of an acceptance angular range of a scattered electron detector, and makes it unnecessary to change a condition for the energy loss spectrometer with respect to a change in the acceptance angular range of the scattered electron detector. In such a scanning transmission electron microscope equipped with the energy loss spectrometer, a first rotationally symmetric type magnetic lens for setting an acceptance angle of an electron scattered by a specimen is disposed above the scattered electron detector for detecting the electron, a second rotationally symmetric type magnetic lens is disposed between the scattered electron detector and the energy loss spectrometer, the first rotationally symmetric type magnetic lens sets the acceptance angle of the scattered electron, and the second rotationally symmetric type magnetic lens sets an object point of the energy loss spectrometer.
摘要翻译：本发明提供一种扫描透射电子显微镜，其能够设置与散射电子检测器的接受角度范围无关的能量损失光谱仪的可接受角度范围，并且不需要相对于能量损失光谱仪的条件改变到散射电子检测器的接受角度范围的变化。在配备有能量损失光谱仪的扫描透射电子显微镜中，设置用于设定被试样散射的电子的受理角的第一旋转对称型磁性透镜设置在用于检测电子的散射电子检测器的上方，第二旋转对称型磁性透镜设置在散射电子检测器和能量损失光谱仪之间，第一旋转对称型磁性透镜设定散射电子的接受角，第二旋转对称型磁性透镜设定能量损失光谱仪的目标点。

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