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    • 5. 发明授权
    • Nitride semiconductor light emitting device having a silver p-contact
    • 具有银p接触的氮化物半导体发光器件
    • US06194743B1
    • 2001-02-27
    • US09212150
    • 1998-12-15
    • You KondohSatoshi WatanabeYawara KanekoShigeru NakagawaNorihide Yamada
    • You KondohSatoshi WatanabeYawara KanekoShigeru NakagawaNorihide Yamada
    • H01L3300
    • H01L33/42H01L33/40H01L2224/4847
    • A light emitting device constructed on a substrate. The device includes an n-type semiconductor layer in contact with the substrate, an active layer for generating light, the active layer being in electrical contact with the n-type semiconductor layer. A p-type semiconductor layer is in electrical contact with the active layer, and a p-electrode is in electrical contact with the p-type semiconductor layer. The p-electrode includes a layer of silver in contact with the p-type semiconductor layer. In the preferred embodiment of the present invention, the n-type semiconductor layer and the p-type semiconductor layer are constructed from group III nitride semiconductor materials. In one embodiment of the invention, the silver layer is sufficiently thin to be transparent. In other embodiments, the silver layer is thick enough to reflect most of the light incident thereon. A fixation layer is preferably provided over the silver layer. The fixation layer may be a dielectric or a conductor, the choice depending on whether or not the silver layer is transparent.
    • 构造在基板上的发光器件。 该器件包括与衬底接触的n型半导体层,用于产生光的有源层,有源层与n型半导体层电接触。 p型半导体层与有源层电接触,p电极与p型半导体层电接触。 p电极包括与p型半导体层接触的银层。 在本发明的优选实施例中,n型半导体层和p型半导体层由III族氮化物半导体材料构成。 在本发明的一个实施方案中,银层足够薄以使其透明。 在其它实施例中,银层足够厚以反射入射到其上的大部分光。 优选在银层上设置固定层。 固定层可以是电介质或导体,这取决于银层是否透明。
    • 8. 发明授权
    • Hologram recording medium and method for manufacturing same
    • 全息记录介质及其制造方法
    • US07800802B2
    • 2010-09-21
    • US11989818
    • 2005-04-07
    • Yawara KanekoHideyoshi Horimai
    • Yawara KanekoHideyoshi Horimai
    • G03H1/02G03H1/28G11B7/00
    • G11B7/0065G03H1/0252G03H2001/266G03H2250/33G03H2250/34G03H2250/42G11B7/00781G11B7/0938G11B7/24038G11B7/24044G11B7/26
    • A hologram recording medium including a substrate, a hologram recording layer that records an interference pattern formed by a first wavelength beam, a wavelength selecting reflection layer provided between the substrate and the hologram recording layer that reflects the first wavelength beam and transmits a second wavelength beam, a beam absorbing layer provided between the substrate and the wavelength selecting reflection layer that absorbs the first wavelength beam, and an information layer provided between the substrate and the light absorbing layer in which information is recorded and reproduced by the second wavelength beam, a second information layer provided between the substrate and the information layer and a second wavelength selecting reflection layer provided between the information layer and the second information layer that reflects the second wavelength beam and transmits a third wavelength beam.
    • 一种全息记录介质,包括基板,记录由第一波长光束形成的干涉图案的全息图记录层,设置在基板和反射第一波长光束的全息图记录层之间的波长选择反射层,并透射第二波长光束 设置在基板和吸收第一波长光束的波长选择反射层之间的光束吸收层,以及设置在基板和由第二波长光束记录和再现信息的光吸收层之间的信息层,第二 设置在所述基板和所述信息层之间的信息层和设置在所述信息层和所述第二信息层之间的反射所述第二波长束并透射第三波长束的第二波长选择反射层。
    • 9. 发明授权
    • Method of making P-type group III-nitride semiconductor device having improved P contact
    • 制造具有改善的P接触的P型III族氮化物半导体器件的方法
    • US06238945B1
    • 2001-05-29
    • US09562494
    • 2000-05-01
    • Yawara Kaneko
    • Yawara Kaneko
    • H01L2100
    • H01L33/40H01L33/325H01L33/44H01S5/32341
    • A Group III-nitride semiconductor device that has a low voltage-drop p-contact and comprises a substrate layer, a metal electrode and an intermediate layer sandwiched between the substrate layer and the metal electrode. The substrate layer is a layer of a p-type Group III-nitride semiconductor, and the intermediate layer includes a Group III-nitride semiconductor in which atoms of a Group V element other than nitrogen have been substituted for a fraction of nitrogen atoms. The Group III-nitride semiconductor device is made by providing a substrate including a p-type Group III-nitride semiconductor having an exposed surface. Atoms of a Group V element other than nitrogen are substituted for a fraction of the nitrogen atoms of the p-type Group III-nitride semiconductor to form an intermediate layer extending into the p-type Group III-nitride semiconductor from the exposed surface. Metal is then deposited on the exposed surface to form an electrode in electrical contact with the intermediate layer.
    • 具有低压降p型接触的III族氮化物半导体器件,其包含衬底层,金属电极和夹在衬底层和金属电极之间的中间层。 衬底层是p型III族氮化物半导体层,中间层包括III族氮化物半导体,其中除了氮之外的第V族元素的原子已被氮原子的一部分代替。 III族氮化物半导体器件通过提供包括具有暴露表面的p型III族氮化物半导体的衬底制成。 除了氮之外的第V族元素的原子代替p型III族氮化物半导体的一部分氮原子以形成从暴露表面延伸到p型III族氮化物半导体中的中间层。 然后将金属沉积在暴露的表面上以形成与中间层电接触的电极。