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1. 发明授权

US07189976B2 Method for generating high-speed particle and system for generating high-speed particle 有权
标题翻译：用于生成高速粒子的方法和用于产生高速粒子的系统
公开(公告)号：US07189976B2
公开(公告)日：2007-03-13
申请号：US10533441
申请日：2003-12-19
申请人： Hironori Takahashi , Takashi Inoue , Shinji Ohsuka , Yutaka Tsuchiya
发明人： Hironori Takahashi , Takashi Inoue , Shinji Ohsuka , Yutaka Tsuchiya
IPC分类号： H01S3/10 , G21K1/00 , H05H1/24
CPC分类号： G21G1/12 , A61N2005/1088 , H05H6/00
摘要： The present invention relates to a high-speed particle generating method and so on for generating high-speed particles from a high-speed particle generating target by condensing a pulsed laser beam to a micro-spot on the surface of a high-speed particle generating target. The high-speed particle generating method is a method that generates high-speed particles by condensing a pulsed laser beam generated from a pulsed laser beam generator through an irradiation optical system at a predetermined condensing point, and irradiating the pulsed laser beam to the high-speed particle generating target that is set at the predetermined condensing point, the method including a first step of preparing a reference data, a second step of measuring the wave front of the pulsed laser beam, and a third step of compensating the wave front of the pulsed laser beam based on the reference data.
摘要翻译：本发明涉及一种高速粒子产生方法等，用于通过将脉冲激光束与高速粒子产生的表面上的微点集中而从高速粒子产生靶产生高速粒子目标。高速粒子产生方法是通过在脉冲激光束发生器产生的脉冲激光束通过照射光学系统在预定的聚光点聚光并将脉冲激光束照射到高速粒子发生方法，设定在所述规定的聚光点的高速粒子产生目标，所述方法包括准备基准数据的第一步骤，测量所述脉冲激光束的波前的第二步骤，以及补偿所述脉冲激光束的波前的第三步骤，基于参考数据的脉冲激光束。

2. 发明申请

US20060013269A1 Method for generating high-speed particle and system for generating high-speed particle 有权
标题翻译：用于生成高速粒子的方法和用于产生高速粒子的系统
公开(公告)号：US20060013269A1
公开(公告)日：2006-01-19
申请号：US10533441
申请日：2003-12-19
申请人： Hironori Takahashi , Takashi Inoue , Shinji Ohsuka , Yutaka Tsuchiya
发明人： Hironori Takahashi , Takashi Inoue , Shinji Ohsuka , Yutaka Tsuchiya
IPC分类号： H01S3/10
CPC分类号： G21G1/12 , A61N2005/1088 , H05H6/00
摘要： The present invention relates to a high-speed particle generating method and so on for generating high-speed particles from a high-speed particle generating target by condensing a pulsed laser beam to a micro-spot on the surface of a high-speed particle generating target. The high-speed particle generating method is a method that generates high-speed particles by condensing a pulsed laser beam generated from a pulsed laser beam generator through an irradiation optical system at a predetermined condensing point, and irradiating the pulsed laser beam to the high-speed particle generating target that is set at the predetermined condensing point, the method including a first step of preparing a reference data, a second step of measuring the wave front of the pulsed laser beam, and a third step of compensating the wave front of the pulsed laser beam based on the reference data.
摘要翻译：本发明涉及一种高速粒子产生方法等，用于通过将脉冲激光束与高速粒子产生的表面上的微点集中而从高速粒子产生靶产生高速粒子目标。高速粒子产生方法是通过在脉冲激光束发生器产生的脉冲激光束通过照射光学系统在预定的聚光点聚光并将脉冲激光束照射到高速粒子发生方法，设定在所述规定的聚光点的高速粒子产生目标，所述方法包括准备基准数据的第一步骤，测量所述脉冲激光束的波前的第二步骤，以及补偿所述脉冲激光束的波前的第三步骤，基于参考数据的脉冲激光束。

3. 发明申请

US20060039520A1 Target for generating deuteron and target apparatus for generating deuteron comprising the same 审中-公开
标题翻译：用于产生氘核的目标和用于产生包含该氘核的氘核的目标装置
公开(公告)号：US20060039520A1
公开(公告)日：2006-02-23
申请号：US10533453
申请日：2003-12-16
申请人： Hironori Takahashi , Shigetoshi Okazaki , Shinji Ohsuka
发明人： Hironori Takahashi , Shigetoshi Okazaki , Shinji Ohsuka
IPC分类号： H05H6/00 , G21B1/00
CPC分类号： H05H6/00 , H05H3/02
摘要： The present invention relates to a deuteron generating target having a construction for generating deuteron efficiently, and a deuteron generating target apparatus including the same. The deuteron generating target is constructed by providing an upper film mainly composed of a deuterated organic compound onto a base film mainly composed of a halogen-containing organic compound.
摘要翻译：本发明涉及具有用于有效地产生氘核的结构的氘核产生靶，以及含有该氘核产生靶的装置。氘核产生靶是通过将主要由氘代有机化合物组成的上部膜提供到主要由含卤素的有机化合物组成的基底膜上构成的。

4. 发明授权

US5811805A Charged particle guide apparatus and image viewing apparatus for charged particle microscope using the same 失效
标题翻译：带电粒子引导装置和使用其的带电粒子显微镜的图像观察装置
公开(公告)号：US5811805A
公开(公告)日：1998-09-22
申请号：US702183
申请日：1996-08-23
申请人： Nobuyuki Osakabe , Junji Endo , Tetsuji Kodama , Tsuneyuki Urakami , Hiroshi Tsuchiya , Shinji Ohsuka
发明人： Nobuyuki Osakabe , Junji Endo , Tetsuji Kodama , Tsuneyuki Urakami , Hiroshi Tsuchiya , Shinji Ohsuka
IPC分类号： H01J37/22 , H01J37/244 , H01J37/26
CPC分类号： H01J37/22 , H01J37/244
摘要： An electron-microscope image viewing apparatus capable of measuring of a moving speed or a vibration frequency of an atomic structure, a magnetic structure, an electric structure or the like of a specimen even when the structure changes at a high rate. The apparatus includes a charged particle source for emitting charged particles, an illuminating electron lens system for illuminating a specimen with a beam of the charged particles, an image magnifying/projecting lens system for magnifying an image of the specimen formed by charged particles scattered upon transmission through the specimen and projecting the magnified image onto an image forming plane, at least one charged particle extracting means provided on the image forming plane of the image magnifying/projecting lens system for taking out the charged particles from a predetermined portion of the charged particle beam projected onto the image forming plane, at least one charged particle detector for detecting the charged particles taken out through the charged particle extracting means, and a signal processing means for processing a signal outputted from the charged particle detector.
摘要翻译：即使当结构以高速率变化时，也可以测量试样的原子结构，磁性结构，电结构等的移动速度或振动频率的电子显微镜图像观察装置。该装置包括用于发射带电粒子的带电粒子源，用于用带电粒子束照射样本的照明电子透镜系统，用于放大由透射时散射的带电粒子形成的样本的图像的图像放大/投影透镜系统通过样本并将放大图像投影到图像形成平面上，至少一个带电粒子提取装置，设置在图像放大/投影透镜系统的图像形成平面上，用于从带电粒子束的预定部分中取出带电粒子投影到图像形成平面上的至少一个带电粒子检测器，用于检测通过带电粒子提取装置取出的带电粒子;以及信号处理装置，用于处理从带电粒子检测器输出的信号。

5. 发明申请

US20130270666A1 PHOTODIODE ARRAY 有权
标题翻译：光斑阵列
公开(公告)号：US20130270666A1
公开(公告)日：2013-10-17
申请号：US13881949
申请日：2011-10-24
申请人： Kenichi Sato , Kazuhisa Yamamura , Shinji Ohsuka
发明人： Kenichi Sato , Kazuhisa Yamamura , Shinji Ohsuka
IPC分类号： H01L27/144
CPC分类号： H01L27/1446 , H01L27/146 , H01L27/14643 , H01L31/02027
摘要： This photodiode array 10 includes quenching resistors 7 which are connected in series to respective avalanche photodiodes APDs, a peripheral wiring WL which surrounds a region in which the plurality of avalanche photodiodes APDs are formed, and a plurality of relay wirings 8 which are electrically connected to the peripheral wiring WL, so as to respectively connect at least two places of the peripheral wiring WL. One of an anode and a cathode of each avalanche photodiode APD is electrically connected to any one of the relay wirings 8 via the quenching resistor 7, and the other of the anode and the cathode of each avalanche photodiode APD is electrically connected to another electrode 6 provided on a semiconductor substrate.
摘要翻译：该光电二极管阵列10包括与相应的雪崩光电二极管APD串联连接的淬火电阻器7，围绕形成有多个雪崩光电二极管APD的区域的外围布线WL，以及多个继电器布线8，周边布线WL，以分别连接外围布线WL的至少两个位置。每个雪崩光电二极管APD的阳极和阴极之一经由淬火电阻7与继电器布线8中的任何一个电连接，并且每个雪崩光电二极管APD的阳极和阴极中的另一个电连接到另一个电极6 设置在半导体基板上。

6. 发明授权

US4912737A X-ray image observing device 失效
标题翻译： X射线图像观察装置
公开(公告)号：US4912737A
公开(公告)日：1990-03-27
申请号：US263254
申请日：1988-10-27
申请人： Shinji Ohsuka , Masaru Sugiyama , Tsuyoshi Hayakawa , Katsuyuki Kinoshita , Akira Ohba
发明人： Shinji Ohsuka , Masaru Sugiyama , Tsuyoshi Hayakawa , Katsuyuki Kinoshita , Akira Ohba
IPC分类号： G21K7/00
CPC分类号： G21K7/00
摘要： The X-ray image microscope according to this invention comprises an X-ray absorption imaging unit having a glazing incidence mirror, and an electron imaging unit having an electron lens connected to the X-ray absorption imaging unit. A thin support film is provided on the boundary between the X-ray absorption imaging unit and the electron imaging unit. On the support film is formed a photocathode screen which emits photoelectrons in response to an incident X-ray. The X-ray absorption image of an X-ray which has penetrated a specimen, e.g. a living cell, is magnified by the X-ray imaging unit, and the electron image corresponding to the X-ray image is magnified by an electron lens. The magnified electron image is converted into a light image by a phosphor screen, and the light image is caught by a TV camera. In this way biological materials can be observed, magnified in their living states.

7. 发明授权

US5715049A Light measuring apparatus for quantifying photons 失效
标题翻译：用于量子光子的光测量装置
公开(公告)号：US5715049A
公开(公告)日：1998-02-03
申请号：US748837
申请日：1996-11-14
申请人： Shinji Ohsuka , Hisayoshi Takamoto
发明人： Shinji Ohsuka , Hisayoshi Takamoto
IPC分类号： G01N21/64 , G01J1/02 , G01J1/44 , G01J11/00 , G01J1/46
CPC分类号： G01J11/00
摘要： When incident light is incident to a photodetector, photoelectrons are emitted therefrom and then multiplied to output an electric current signal. This current signal is integrated over a predetermined period of time in an integrator to be converted to a voltage signal. This voltage signal is converted to a digital signal by an AD converter. This digital signal is supplied to a histogramming memory, which generates a pulse height distribution of voltage signal. Based on a pulse height distribution N(h) generated with incidence of measurement-object light to the photodetector, a pulse height distribution of single photoelectron events p.sub.1 (h) generated by a generator of pulse height distribution of single photoelectron events, and pulse height distributions of k-photoelectron events p.sub.k (h) (k=2, 3, . . . ) calculated and generated in a generator of pulse height distributions of k-photoelectron events, an estimating unit estimates a distribution of numbers of photoelectrons emitted with incidence of the measurement-object light to the photodetector, and thereby obtains the intensity of the measurement-object light.
摘要翻译：当入射光入射到光检测器时，从其发射光电子，然后相乘以输出电流信号。该电流信号在积分器中在预定时间段内积分以被转换成电压信号。该电压信号由AD转换器转换为数字信号。该数字信号被提供给直方图存储器，其产生电压信号的脉冲高度分布。基于通过测量对象光入射到光电检测器产生的脉冲高度分布N（h），由单个光电子事件的脉冲高度分布的发生器产生的单个光电子事件p1（h）的脉冲高度分布和脉冲高度在k光电子事件的脉冲高度分布的发生器中计算和产生的k光电子事件pk（h）（k = 2,3，...）的分布，估计单元估计发射的光电子数量的分布的测量对象光，并且由此获得测量对象光的强度。

8. 发明授权

US09184190B2 Photodiode array 有权
标题翻译：光电二极管阵列
公开(公告)号：US09184190B2
公开(公告)日：2015-11-10
申请号：US13881949
申请日：2011-10-24
申请人： Kenichi Sato , Kazuhisa Yamamura , Shinji Ohsuka
发明人： Kenichi Sato , Kazuhisa Yamamura , Shinji Ohsuka
IPC分类号： H01L31/107 , H01L27/144 , H01L27/146 , H01L31/02
CPC分类号： H01L27/1446 , H01L27/146 , H01L27/14643 , H01L31/02027
摘要： This photodiode array 10 includes quenching resistors 7 which are connected in series to respective avalanche photodiodes APDs, a peripheral wiring WL which surrounds a region in which the plurality of avalanche photodiodes APDs are formed, and a plurality of relay wirings 8 which are electrically connected to the peripheral wiring WL, so as to respectively connect at least two places of the peripheral wiring WL. One of an anode and a cathode of each avalanche photodiode APD is electrically connected to any one of the relay wirings 8 via the quenching resistor 7, and the other of the anode and the cathode of each avalanche photodiode APD is electrically connected to another electrode 6 provided on a semiconductor substrate.
摘要翻译：该光电二极管阵列10包括与相应的雪崩光电二极管APD串联连接的淬火电阻器7，围绕形成有多个雪崩光电二极管APD的区域的外围布线WL，以及多个继电器布线8，周边布线WL，以分别连接外围布线WL的至少两个位置。每个雪崩光电二极管APD的阳极和阴极之一经由淬火电阻7与继电器布线8中的任何一个电连接，并且每个雪崩光电二极管APD的阳极和阴极中的另一个电连接到另一电极6 设置在半导体基板上。

9. 发明授权

US5694211A Light measuring apparatus for quantizing photon 失效
标题翻译：用于量子化的光测量装置
公开(公告)号：US5694211A
公开(公告)日：1997-12-02
申请号：US767933
申请日：1996-12-17
申请人： Shinji Ohsuka , Hisayoshi Takamoto
发明人： Shinji Ohsuka , Hisayoshi Takamoto
IPC分类号： G01J1/42 , G01N21/64
CPC分类号： G01J1/42 , G01N21/64
摘要： When incident light is incident to a photodetector, photoelectrons are emitted and multiplied in each of incident zones whereby a plurality of current signals are output. These current signals each are processed to estimate a distribution or a mean value of numbers of photoelectrons generated in each incident zone. Then estimated based on the estimate values of respective incident zones is the number of photoelectrons emitted from the entire photoelectric conversion surface. In this way the intensity of incident light is measured with accuracy.
摘要翻译：当入射光入射到光电检测器时，光电子被发射并在每个入射区域中相乘，从而输出多个电流信号。每个这些电流信号被处理以估计在每个入射区域中产生的光电子数量的分布或平均值。然后，基于各入射区域的估计值估计是从整个光电转换表面发射的光电子的数量。以这种方式，准确地测量入射光的强度。

10. 发明授权

US4931647A Radiation imaging apparatus 失效
标题翻译：辐射成像装置
公开(公告)号：US4931647A
公开(公告)日：1990-06-05
申请号：US186342
申请日：1988-04-26
申请人： Teruo Hiruma , Shinji Ohsuka
发明人： Teruo Hiruma , Shinji Ohsuka
IPC分类号： G01T1/20 , G01T1/28 , G01T1/29 , G03B42/02 , H04N5/32
CPC分类号： H04N5/32 , G01T1/20 , G01T1/28
摘要： A radiation imaging apparatus comprising scintillators for converting radiation from a sample into scintillation light, image intensifiers for amplifying the scintillation light and forming an amplified image of the radiation, the image guides for directing the scintillation light to the respective image intensifiers. The observing field of a sample is conceptually partitioned into plural sections with each section corresponding to a respective one of the image intensifiers. One end of each image guide faces a respective section of the sample and the other end of each image guide is connected to a respective image intensifier.
摘要翻译：一种辐射成像装置，包括用于将来自样品的辐射转换成闪烁光的闪烁体，用于放大闪烁光的图像增强器和形成辐射的放大图像的图像引导器，用于将闪烁光引导到各个图像增强器。样本的观测场在概念上被划分为多个部分，每个部分对应于图像增强器中的相应一个。每个图像引导件的一端面向样品的相应部分，并且每个图像引导件的另一端连接到相应的图像增强器。

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