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    • 3. 发明授权
    • Film formation apparatus and method for using the same
    • 成膜装置及其使用方法
    • US07993705B2
    • 2011-08-09
    • US11819500
    • 2007-06-27
    • Nobutake NoderaKazuhide HasebeKazuya Yamamoto
    • Nobutake NoderaKazuhide HasebeKazuya Yamamoto
    • C23C16/56C23C16/00C23C16/54B08B7/00B08B7/04
    • H01L21/67109C23C16/4404C23C16/4405Y10S438/905
    • A method for using a film formation apparatus includes performing film formation of a product film selected from the group consisting of a silicon nitride film and a silicon oxynitride film on a target substrate within a reaction chamber of the film formation apparatus; and unloading the target substrate from the reaction chamber. Thereafter, the method includes first heating an inner surface of the reaction chamber at a post process temperature while supplying a post process gas for nitridation into the reaction chamber, thereby performing nitridation of a by-product film deposited on the inner surface of the reaction chamber; then rapidly cooling the inner surface of the reaction chamber, thereby cracking the by-product film by a thermal stress; and then forcibly exhausting gas from inside the reaction chamber to carry the by-product film, thus peeled off from the inner surface.
    • 使用成膜装置的方法包括在成膜装置的反应室内的目标基板上进行选自由氮化硅膜和氮氧化硅膜组成的组中的产品膜的成膜; 并从反应室卸载目标衬底。 此后,该方法包括在后处理温度下先加热反应室的内表面,同时向反应室供应用于氮化的后处理气体,从而对沉积在反应室内表面上的副产物膜进行氮化 ; 然后快速冷却反应室的内表面,从而通过热应力裂解副产物膜; 然后从反应室内强制排出气体以携带副产物膜,从而从内表面剥离。
    • 4. 发明授权
    • Film formation apparatus and method for using same
    • 成膜装置及其使用方法
    • US08697578B2
    • 2014-04-15
    • US12285575
    • 2008-10-08
    • Nobutake NoderaJun SatoKazuya YamamotoKazuhide Hasebe
    • Nobutake NoderaJun SatoKazuya YamamotoKazuhide Hasebe
    • H01L21/311
    • C23C16/345C23C16/0218C23C16/4405C23C16/452C23C16/45542H01J37/32082H01J37/3244H01J37/32522
    • A method for using a film formation apparatus for a semiconductor process to form a thin film on a target substrate while supplying a film formation reactive gas from a first nozzle inside a reaction chamber includes performing a cleaning process to remove a by-product film deposited inside the reaction chamber and the first nozzle, in a state where the reaction chamber does not accommodate the target substrate. The cleaning process includes, in order, an etching step of supplying a cleaning reactive gas for etching the by-product film into the reaction chamber, and activating the cleaning reactive gas, thereby etching the by-product film, and an exhaust step of stopping supply of the cleaning reactive gas and exhausting gas from inside the reaction chamber. The etching step is arranged to use conditions that cause the cleaning reactive gas supplied in the reaction chamber to flow into the first nozzle.
    • 在反应室内的第一喷嘴供给成膜反应性气体的同时,使用半导体工艺的成膜装置在目标基板上形成薄膜的方法包括进行清洗处理以除去内部沉积的副产物膜 反应室和第一喷嘴,处于反应室不容纳目标基板的状态。 清洗工序依次包括:将清洗反应性气体供给到反应室内的蚀刻工序,激活清洗反应性气体,蚀刻副产物膜,以及停止排出工序 从反应室内供给清洗反应气体和排气。 蚀刻步骤被设置为使得在反应室中供应的清洁反应气体流入第一喷嘴的条件。
    • 5. 发明申请
    • Film formation apparatus for semiconductor process
    • 用于半导体工艺的成膜装置
    • US20090114156A1
    • 2009-05-07
    • US12285512
    • 2008-10-07
    • Nobutake NoderaJun SatoKazuya YamamotoKazuhide Hasebe
    • Nobutake NoderaJun SatoKazuya YamamotoKazuhide Hasebe
    • C23C16/00
    • C23C16/4405C23C16/345C23C16/45525H01L21/3185
    • A film formation apparatus for a semiconductor process includes a support member having a plurality of support levels configured to support target substrates inside a reaction chamber; a film formation gas supply system configured to supply a film formation gas into the reaction chamber and including a gas distribution nozzle; a cleaning gas supply system configured to supply a cleaning gas for etching a by-product film deposited inside the reaction chamber; and an exhaust system configured to exhaust gas from inside the reaction chamber. The cleaning gas supply system includes a gas nozzle disposed near a bottom of the reaction chamber and having a gas supply port at its top directed upward, and the gas supply port is located below the lowermost one of the support levels of the support member.
    • 一种用于半导体工艺的成膜装置包括:支撑构件,其具有多个支撑层,构造成支撑反应室内的目标基板; 成膜气体供给系统,其构造成将成膜气体供给到所述反应室中并且包括气体分配喷嘴; 清洁气体供给系统,被配置为提供用于蚀刻沉积在所述反应室内的副产物膜的清洁气体; 以及构造成从反应室内排出气体的排气系统。 清洁气体供给系统包括设置在反应室底部附近的气体喷嘴,其顶部朝向上方具有气体供给口,气体供给口位于支撑构件的支撑水平面的最下方。
    • 6. 发明申请
    • Film formation apparatus and method for using the same
    • 成膜装置及其使用方法
    • US20080003362A1
    • 2008-01-03
    • US11819500
    • 2007-06-27
    • Nobutake NoderaKazuhide HasebeKazuya Yamamoto
    • Nobutake NoderaKazuhide HasebeKazuya Yamamoto
    • C23C16/00B05C11/00
    • H01L21/67109C23C16/4404C23C16/4405Y10S438/905
    • A method for using a film formation apparatus includes performing film formation of a product film selected from the group consisting of a silicon nitride film and a silicon oxynitride film on a target substrate within a reaction chamber of the film formation apparatus; and unloading the target substrate from the reaction chamber. Thereafter, the method includes first heating an inner surface of the reaction chamber at a post process temperature while supplying a post process gas for nitridation into the reaction chamber, thereby performing nitridation of a by-product film deposited on the inner surface of the reaction chamber; then rapidly cooling the inner surface of the reaction chamber, thereby cracking the by-product film by a thermal stress; and then forcibly exhausting gas from inside the reaction chamber to carry the by-product film, thus peeled off from the inner surface.
    • 使用成膜装置的方法包括在成膜装置的反应室内的目标基板上进行选自由氮化硅膜和氮氧化硅膜组成的组中的产品膜的成膜; 并从反应室卸载目标衬底。 此后,该方法包括在后处理温度下先加热反应室的内表面,同时向反应室供应用于氮化的后处理气体,从而对沉积在反应室内表面上的副产物膜进行氮化 ; 然后快速冷却反应室的内表面,从而通过热应力裂解副产物膜; 然后从反应室内强制排出气体以携带副产物膜,从而从内表面剥离。
    • 7. 发明授权
    • Image formation apparatus
    • 图像形成装置
    • US09007605B2
    • 2015-04-14
    • US13473804
    • 2012-05-17
    • Kazuya Yamamoto
    • Kazuya Yamamoto
    • G06F3/12H04N1/00G06F15/00
    • H04N1/00952H04N1/00236H04N1/00896H04N2201/0094
    • An image formation apparatus includes an image reading control unit and a print control unit. The print control unit includes: a first communication control unit connected to the image reading control unit; and a power supply control unit configured to control power supply to the image reading control unit. The image reading control unit includes: a second communication control unit connected to the first communication control unit. When completing a process to transition to a power save mode in accordance with an instruction from the print control unit, the image reading control unit cuts off the communications through the second communication control unit. After sending the image reading control unit the instruction to transition to the power save mode, the print control unit detects the cutoff of the communications and then cuts off the power supply to the image reading control unit through the power supply control unit.
    • 图像形成装置包括图像读取控制单元和打印控制单元。 打印控制单元包括:连接到图像读取控制单元的第一通信控制单元; 以及电源控制单元,被配置为控制对所述图像读取控制单元的电力供应。 图像读取控制单元包括:连接到第一通信控制单元的第二通信控制单元。 当完成根据来自打印控制单元的指令转换到省电模式的处理时,图像读取控制单元通过第二通信控制单元切断通信。 在将图像读取控制单元发送到转换到省电模式的指令之后,打印控制单元检测通信的截止,然后通过电源控制单元切断对图像读取控制单元的电源。
    • 10. 发明授权
    • Detector circuit and semiconductor device using same
    • 检测电路和使用其的半导体器件
    • US08558549B2
    • 2013-10-15
    • US12941134
    • 2010-11-08
    • Kazuya YamamotoTomoyuki AsadaMiyo Miyashita
    • Kazuya YamamotoTomoyuki AsadaMiyo Miyashita
    • G01R31/00G01R25/02
    • G01R31/2822G01R23/20H03F3/24H04B1/0475H04B17/103
    • A detector circuit for detecting degradation in the distortion characteristics of a power amplifier based on signals from both ends of a coupled line of a directional coupler. The detector circuit includes a phase shifter/attenuator for phase shifting and attenuating a signal from a coupled terminal of the coupled line, a differential amplifier for outputting difference between an output signal from the phase shifter/attenuator and a signal from the isolated terminal of the coupled line, a wave detector circuit for converting the difference into a DC signal, and a comparing circuit for determining whether the voltage level of the DC signal exceeds a predetermined level. When degradation in the distortion characteristics of the power amplifier arises, the phase shifter/attenuator phase shifts the signal from the coupled terminal and outputs a signal 180° out of phase with the signal from the isolated terminal.
    • 一种用于根据来自定向耦合器的耦合线的两端的信号来检测功率放大器的失真特性的劣化的检测器电路。 检测器电路包括用于相移和衰减来自耦合线的耦合端的信号的移相器/衰减器,用于输出来自移相器/衰减器的输出信号与来自该移相器/衰减器的隔离端的信号的差分放大器 耦合线,用于将差值转换为DC信号的波检测器电路,以及用于确定DC信号的电压电平是否超过预定电平的比较电路。 当功率放大器的失真特性出现降低时,移相器/衰减器将来自耦合端子的信号相移,并输出与隔离端子信号180°异相的信号。