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1. 发明申请

US20110052189A1 OPTICAL DEVICE FOR REARRANGING WAVELENGTH CHANNELS 有权
标题翻译：用于重新分配波长通道的光学设备
公开(公告)号：US20110052189A1
公开(公告)日：2011-03-03
申请号：US12847220
申请日：2010-07-30
申请人： Hiroaki Yamada , Barthelemy Fondeur , Jinxi Shen , Zi-Wen Dong , Domenico Di Mola , Jyoti K. Bhardwaj , Yimin Hua
发明人： Hiroaki Yamada , Barthelemy Fondeur , Jinxi Shen , Zi-Wen Dong , Domenico Di Mola , Jyoti K. Bhardwaj , Yimin Hua
IPC分类号： G02B6/28 , H04B10/24
CPC分类号： H04J14/0279 , G02B6/12026
摘要： An optical device for rearranging wavelength channels in an optical network is disclosed. The optical device has a wavelength selective coupler having one input port and a plurality of output ports coupled to a plurality of input ports of an optical grating demultiplexor such as an arrayed waveguide grating. The wavelength channels in each of the input ports are dispersed by the demultiplexor and are directed to a plurality of output ports of the optical grating demultiplexor. As a result, at least one wavelength channel at each of the input ports of the optical grating demultiplexor is coupled into a common output port. The optical device is useful in passive optical networks wherein a same demultiplexor is used for simultaneous multiplexing and demultiplexing of wavelength channels.
摘要翻译：公开了一种用于重新布置光网络中的波长信道的光学装置。该光学器件具有波长选择耦合器，该波长选择耦合器具有耦合到诸如阵列波导光栅的光栅解复用器的多个输入端口的一个输入端口和多个输出端口。每个输入端口中的波长通道被解复用器分散，并被引导到光栅解复用器的多个输出端口。结果，光栅解复用器的每个输入端口处的至少一个波长通道耦合到公共输出端口中。该光学器件在无源光网络中是有用的，其中相同的解复用器用于同时复用和解复用波长信道。

2. 发明授权

US08285144B2 Optical device for rearranging wavelength channels 有权
标题翻译：用于重新布置波长通道的光学装置
公开(公告)号：US08285144B2
公开(公告)日：2012-10-09
申请号：US12847220
申请日：2010-07-30
申请人： Hiroaki Yamada , Barthelemy Fondeur , Jinxi Shen , Zi-Wen Dong , Domenico Di Mola , Jyoti K. Bhardwaj , Yimin Hua
发明人： Hiroaki Yamada , Barthelemy Fondeur , Jinxi Shen , Zi-Wen Dong , Domenico Di Mola , Jyoti K. Bhardwaj , Yimin Hua
IPC分类号： H04J14/02
CPC分类号： H04J14/0279 , G02B6/12026
摘要： An optical device for rearranging wavelength channels in an optical network is disclosed. The optical device has a wavelength selective coupler having one input port and a plurality of output ports coupled to a plurality of input ports of an optical grating demultiplexor such as an arrayed waveguide grating. The wavelength channels in each of the input ports are dispersed by the demultiplexor and are directed to a plurality of output ports of the optical grating demultiplexor. As a result, at least one wavelength channel at each of the input ports of the optical grating demultiplexor is coupled into a common output port. The optical device is useful in passive optical networks wherein a same demultiplexor is used for simultaneous multiplexing and demultiplexing of wavelength channels.
摘要翻译：公开了一种用于重新布置光网络中的波长信道的光学装置。该光学器件具有波长选择耦合器，该波长选择耦合器具有耦合到诸如阵列波导光栅的光栅解复用器的多个输入端口的一个输入端口和多个输出端口。每个输入端口中的波长通道由解复用器分散，并被引导到光栅解复用器的多个输出端口。结果，光栅解复用器的每个输入端口处的至少一个波长通道耦合到公共输出端口中。该光学器件在无源光网络中是有用的，其中相同的解复用器用于同时复用和解复用波长信道。

3. 发明授权

US08340523B2 Tunable optical filter 有权
标题翻译：可调滤光片
公开(公告)号：US08340523B2
公开(公告)日：2012-12-25
申请号：US12390056
申请日：2009-02-20
申请人： Jinxi Shen , Jyoti K. Bhardwaj , Barthelemy Fondeur , Douglas E. Crafts , Robert J. Brainard , Boping Xie , David J. Chapman
发明人： Jinxi Shen , Jyoti K. Bhardwaj , Barthelemy Fondeur , Douglas E. Crafts , Robert J. Brainard , Boping Xie , David J. Chapman
IPC分类号： H04J14/02
CPC分类号： G02F1/225 , G02B6/12007 , G02B6/4201 , G02F2201/16 , G02F2203/055
摘要： A tunable PLC optical filter having sequentially connected thermally tunable Mach-Zehnder (MZ) interferometers is described. The MZ interferometers, having free spectral ranges matching ITU frequency grid spacing, are tuned so as to have a common passband centered on the frequency of the signal being selected, while having at least one of the stopbands centered on any other ITU frequency. Any other optical channel that may be present at any other ITU frequency is suppressed as a result. The PLC chip, including a zero-dispersion lattice-filter interleaver stage, a switchable fine-resolution stage and, or a retroreflector for double passing the filter, is packaged into a hot-pluggable XFP transceiver package. A compensation heater is used to keep constant the amount of heat applied to the PLC chip inside the XFP package, so as to lessen temperature variations upon tuning of the PLC optical filter.
摘要翻译：描述了具有顺序连接的可热调谐的马赫 - 曾德（MZ）干涉仪的可调谐PLC光学滤波器。具有与ITU频率格栅间隔相匹配的自由频谱范围的MZ干涉仪被调谐，以具有以所选信号的频率为中心的公共通带，同时具有以任何其它ITU频率为中心的至少一个阻带。因此可能会抑制任何其他ITU频率出现的任何其他光信道。包括零色散格子滤波器交错器级，可切换精细分辨率级和用于双通过滤波器的后向反射器的PLC芯片被封装成可热插拔的XFP收发器封装。使用补偿加热器来保持施加到XFP封装内的PLC芯片的热量，以便在调节PLC滤光器时降低温度变化。

4. 发明申请

US20090263142A1 TUNABLE OPTICAL FILTER 有权
标题翻译：可控光滤波器
公开(公告)号：US20090263142A1
公开(公告)日：2009-10-22
申请号：US12390056
申请日：2009-02-20
申请人： Jinxi Shen , Jyoti K. Bhardwaj , Barthelemy Fondeur , Douglas E. Crafts , Robert J. Brainard , Boping Xie , David J. Chapman
发明人： Jinxi Shen , Jyoti K. Bhardwaj , Barthelemy Fondeur , Douglas E. Crafts , Robert J. Brainard , Boping Xie , David J. Chapman
IPC分类号： H04B10/00
CPC分类号： G02F1/225 , G02B6/12007 , G02B6/4201 , G02F2201/16 , G02F2203/055
摘要： A tunable PLC optical filter having sequentially connected thermally tunable Mach-Zehnder (MZ) interferometers is described. The MZ interferometers, having free spectral ranges matching ITU frequency grid spacing, are tuned so as to have a common passband centered on the frequency of the signal being selected, while having at least one of the stopbands centered on any other ITU frequency. Any other optical channel that may be present at any other ITU frequency is suppressed as a result. The PLC chip, including a zero-dispersion lattice-filter interleaver stage, a switchable fine-resolution stage and, or a retroreflector for double passing the filter, is packaged into a hot-pluggable XFP transceiver package. A compensation heater is used to keep constant the amount of heat applied to the PLC chip inside the XFP package, so as to lessen temperature variations upon tuning of the PLC optical filter.
摘要翻译：描述了具有顺序连接的可热调谐的马赫 - 曾德（MZ）干涉仪的可调谐PLC光学滤波器。具有与ITU频率格栅间隔相匹配的自由频谱范围的MZ干涉仪被调谐，以具有以所选信号的频率为中心的公共通带，同时具有以任何其它ITU频率为中心的至少一个阻带。因此可能会抑制任何其他ITU频率出现的任何其他光信道。包括零色散格子滤波器交错器级，可切换精细分辨率级和用于双通过滤波器的后向反射器的PLC芯片被封装成可热插拔的XFP收发器封装。使用补偿加热器来保持施加到XFP封装内的PLC芯片的热量，以便在调节PLC滤光器时降低温度变化。

5. 发明授权

US07439731B2 Temporary planar electrical contact device and method using vertically-compressible nanotube contact structures 有权
标题翻译：临时平面电接触装置和使用垂直压缩的纳米管接触结构的方法
公开(公告)号：US07439731B2
公开(公告)日：2008-10-21
申请号：US11426249
申请日：2006-06-23
申请人： Douglas E. Crafts , Jyoti K. Bhardwaj
发明人： Douglas E. Crafts , Jyoti K. Bhardwaj
IPC分类号： G01R31/28 , G01R31/02
CPC分类号： G01R1/07357 , G01R1/073
摘要： A wafer-scale probe card for temporary electrical contact to a sample wafer or other device, for burn-in and test. The card includes a plurality of directly metallized single-walled or multi-walled nanotubes contacting a pre-arranged electrical contact pattern on the probe card substrate. The nanotubes are arranged into bundles for forming electrical contacts between areas of the device under test and the probe card. The bundles are compressible along their length to allow a compressive force to be used for contacting the probe card substrate to the device under test. A strengthening material may be disposed around and/or infiltrate the bundles. The nanotubes forming the bundles may be patterned to provide a pre-determined bundle profile. Tips of the bundles may be metallized with a conductive material to form a conformal coating on the bundles; or metallized with a conductive material to form a continuous, single contact surface.
摘要翻译：用于临时电接触样品晶片或其他器件的晶片级探针卡，用于老化和测试。该卡包括多个直接金属化的单壁或多壁纳米管，其接触探针卡基底上的预先布置的电接触图案。纳米管被布置成束，用于在被测试器件的区域和探针卡之间形成电触头。束沿其长度可压缩，以允许使用压缩力将探针卡基片接触到被测器件。加强材料可以围绕和/或渗透束布置。形成束的纳米管可以被图案化以提供预定的束分布。束的尖端可以用导电材料金属化以在束上形成保形涂层; 或用导电材料金属化以形成连续的单个接触表面。

6. 发明授权

US07710106B2 Temporary planar electrical contact device and method using vertically-compressible nanotube contact structures 失效
标题翻译：临时平面电接触装置和使用垂直压缩的纳米管接触结构的方法
公开(公告)号：US07710106B2
公开(公告)日：2010-05-04
申请号：US12211354
申请日：2008-09-16
申请人： Douglas E. Crafts , Jyoti K. Bhardwaj
发明人： Douglas E. Crafts , Jyoti K. Bhardwaj
IPC分类号： G01R31/02
CPC分类号： G01R1/07357 , G01R1/073
摘要： A wafer-scale probe card for temporary electrical contact to a sample wafer or other device, for burn-in and test. The card includes a plurality of directly metallized single-walled or multi-walled nanotubes contacting a pre-arranged electrical contact pattern on the probe card substrate. The nanotubes are arranged into bundles for forming electrical contacts between areas of the device under test and the probe card. The bundles are compressible along their length to allow a compressive force to be used for contacting the probe card substrate to the device under test. A strengthening material may be disposed around and/or infiltrate the bundles. The nanotubes forming the bundles may be patterned to provide a pre-determined bundle profile. Tips of the bundles may be metallized with a conductive material to form a conformal coating on the bundles; or metallized with a conductive material to form a continuous, single contact surface.
摘要翻译：用于临时电接触样品晶片或其他器件的晶片级探针卡，用于老化和测试。该卡包括多个直接金属化的单壁或多壁纳米管，其接触探针卡基底上的预先布置的电接触图案。纳米管被布置成束，用于在被测试器件的区域和探针卡之间形成电触头。束沿其长度可压缩，以允许使用压缩力将探针卡基片接触到被测器件。加强材料可以围绕和/或渗透束布置。形成束的纳米管可以被图案化以提供预定的束分布。束的尖端可以用导电材料金属化以在束上形成保形涂层; 或用导电材料金属化以形成连续的单个接触表面。

7. 发明授权

US08638113B2 Temporary planar electrical contact device and method using vertically-compressible nanotube contact structures 有权
标题翻译：临时平面电接触装置和使用垂直压缩的纳米管接触结构的方法
公开(公告)号：US08638113B2
公开(公告)日：2014-01-28
申请号：US12773117
申请日：2010-05-04
申请人： Douglas E. Crafts , Jyoti K. Bhardwaj
发明人： Douglas E. Crafts , Jyoti K. Bhardwaj
IPC分类号： G01R31/20
CPC分类号： G01R1/07357 , G01R1/073
摘要： A wafer-scale probe card for temporary electrical contact to a sample wafer or other device, for burn-in and test. The card includes a plurality of directly metallized single-walled or multi-walled nanotubes contacting a pre-arranged electrical contact pattern on the probe card substrate. The nanotubes are arranged into bundles for forming electrical contacts between areas of the device under test and the probe card. The bundles are compressible along their length to allow a compressive force to be used for contacting the probe card substrate to the device under test. A strengthening material may be disposed around and/or infiltrate the bundles. The nanotubes forming the bundles may be patterned to provide a pre-determined bundle profile. Tips of the bundles may be metallized with a conductive material to form a conformal coating on the bundles; or metallized with a conductive material to form a continuous, single contact surface.
摘要翻译：用于临时电接触样品晶片或其他器件的晶片级探针卡，用于老化和测试。该卡包括多个直接金属化的单壁或多壁纳米管，其接触探针卡基底上的预先布置的电接触图案。纳米管被布置成束，用于在被测试器件的区域和探针卡之间形成电触头。束沿其长度可压缩，以允许使用压缩力将探针卡基片接触到被测器件。加强材料可以围绕和/或渗透束布置。形成束的纳米管可以被图案化以提供预定的束分布。束的尖端可以用导电材料金属化以在束上形成保形涂层; 或用导电材料金属化以形成连续的单个接触表面。

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