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    • 2. 发明申请
    • Storage device and control method of the storage device
    • 存储设备的存储设备和控制方法
    • US20080209151A1
    • 2008-08-28
    • US12006886
    • 2008-01-07
    • Hiroaki INOUE
    • Hiroaki INOUE
    • G06F12/00
    • G06F3/0659G06F3/061G06F3/0658G06F3/068G11B19/044G11B20/1215G11B2020/10694G11B2020/10759G11B2020/10805G11B2220/2516
    • A storage device includes a storage medium, a nonvolatile memory, a head, a driving unit, and a processor. The driving unit drives the storage medium. The processor controls the storage device according to a process. The process includes receiving the data transmitted from the host, storing the data received into the nonvolatile memory, estimating a period of time from a time point of the reception of the data to a time point at which a usage rate of the nonvolatile memory becomes 100%, controlling the driving unit on the basis of comparison of the estimated period of time with a period of time before the storage medium is accessible, and writing the data stored in the nonvolatile memory to the storage medium by controlling the head in accordance with the control of the driving unit.
    • 存储装置包括存储介质,非易失性存储器,磁头,驱动单元和处理器。 驱动单元驱动存储介质。 处理器根据过程控制存储设备。 该处理包括接收从主机发送的数据,将接收的数据存储到非易失性存储器中,估计从接收数据的时间点到非易失性存储器的使用率变为100的时间点的时间段 %,基于估计时间段与存储介质可访问之前的时间段的比较来控制驱动单元,以及根据存储介质的控制将存储在非易失性存储器中的数据写入存储介质 控制驱动单元。
    • 3. 发明申请
    • MAGNETIC DISK APPARATUS AND DATA REFRESH METHOD
    • 磁盘设备和数据刷新方法
    • US20130194690A1
    • 2013-08-01
    • US13563486
    • 2012-07-31
    • Hiroaki INOUE
    • Hiroaki INOUE
    • G11B27/36
    • G11B20/1879G11B5/012G11B5/09G11B20/10009
    • According to at least one embodiment, a magnetic disk apparatus includes a disk, a random number generator, a determination module, and a refresh module. The disk includes a plurality of tracks. A random number generator generates a random number within a range of N integers in accordance with writing to a first area of a first track of the plurality of tracks. A determination module determines whether the generated random number includes a predetermined number. A refresh module refreshes a second area of a second track near the first track based on a result of determination of the determination module. The second area corresponds to the first area.
    • 根据至少一个实施例,磁盘装置包括盘,随机数发生器,确定模块和刷新模块。 盘包括多个轨道。 随机数生成器根据写入多个轨道的第一轨道的第一区域而在N个整数的范围内生成随机数。 确定模块确定所生成的随机数是否包括预定数目。 基于确定模块的确定结果,刷新模块刷新靠近第一轨道的第二轨道的第二区域。 第二区域对应于第一区域。
    • 5. 发明申请
    • MANUFACTURING METHOD OF MEMS DEVICE, AND SUBSTRATE USED THEREFOR
    • MEMS器件的制造方法及其使用的衬底
    • US20110223702A1
    • 2011-09-15
    • US13012104
    • 2011-01-24
    • Hiroaki INOUETadashi NakataniSatoshi Ueda
    • Hiroaki INOUETadashi NakataniSatoshi Ueda
    • H01L21/02B32B3/30
    • H01H59/0009Y10T428/24521Y10T428/24562
    • A method for manufacturing a MEMS device, includes: preparing a substrate provided with a first substrate in which a cavity is formed, and a second substrate that is bonded to a side of the first substrate on which the cavity is formed and includes a slit to delimit a movable portion in a position corresponding to the cavity, the second substrate, including a first surface thereof facing the first substrate, being provided with a thermally-oxidized film selectively formed on the first surface in a position corresponding to the movable portion; forming a first electrode layer on a second surface opposite to the first surface on which the thermally-oxidized film for the movable portion is formed; forming a sacrifice layer on the first electrode layer and the second substrate; forming a second electrode layer on the sacrifice layer; and removing the sacrifice layer and the thermally-oxidized film after the second electrode layer is formed.
    • 一种MEMS器件的制造方法,包括:准备具有形成有空腔的第一基板的基板和与形成有所述空腔的所述第一基板的一侧接合的第二基板,所述第二基板具有狭缝, 在与空腔相对应的位置限定可移动部分,所述第二基板包括其面向所述第一基板的第一表面,所述第二基板具有在对应于所述可动部分的位置中选择性地形成在所述第一表面上的热氧化膜; 在形成有用于可动部分的热氧化膜的第一表面相对的第二表面上形成第一电极层; 在所述第一电极层和所述第二基板上形成牺牲层; 在牺牲层上形成第二电极层; 并且在形成第二电极层之后去除牺牲层和热氧化膜。
    • 6. 发明申请
    • STORAGE DEVICE
    • 储存设备
    • US20090249168A1
    • 2009-10-01
    • US12409976
    • 2009-03-24
    • Hiroaki INOUE
    • Hiroaki INOUE
    • H03M13/05G06F11/10
    • H03M13/353G11B20/18G11B20/1816G11B20/1833G11B2020/1843
    • A storage device includes: a storage medium; an auxiliary memory; and a controller for: determining an error correcting code length corresponding to an error rate of a data write area and/or an error correcting code write area of the storage medium; generating an error correcting code on the basis of the data and the determined error correcting code length; storing the generated error correcting code in the error correcting code write area and storing the data in the data write area; and storing a part of the error correcting code in the auxiliary memory if the generated error correcting code has a greater data length than that of the error correcting code write area, so that the part of the error correcting code overflowed from the error correcting code write area is stored in the auxiliary memory.
    • 存储装置包括:存储介质; 辅助存储器 以及控制器,用于:确定与所述存储介质的数据写入区域和/或纠错码写入区域的错误率相对应的纠错码长度; 根据数据和确定的纠错码长度产生纠错码; 将所生成的纠错码存储在纠错码写入区中并将数据存储在数据写入区中; 并且如果所生成的纠错码的数据长度大于纠错码写入区域的数据长度,则将纠错码的一部分存储在辅助存储器中,从纠错码写入的部分错误校正码溢出 区域存储在辅助存储器中。
    • 7. 发明申请
    • Packaged device and method of fabricating packaged-device
    • 包装装置及其制造方法
    • US20100067208A1
    • 2010-03-18
    • US12458604
    • 2009-07-16
    • Hiroaki INOUETakashi KATSUKIFumihiko NAKAZAWA
    • Hiroaki INOUETakashi KATSUKIFumihiko NAKAZAWA
    • H05K1/14H05K3/20
    • G01P15/125B81C1/00301G01C19/5719G01P1/023G01P15/0802H01L21/76898H01L23/481H01L2924/0002Y10T29/49128H01L2924/00
    • A method includes forming grooves in first regions included in a first wafer to form wiring regions defined by the grooves; forming insulating portions in the grooves; joining a surface of the first wafer on which the wiring regions are formed to a first surface of a device wafer including device forming regions after forming the insulating portions; forming through holes in the wiring regions of the first wafer after joining the first wafer to the device wafer, the holes extending through the first wafer; filling the holes with a conductive material; joining a second wafer to a second surface of the device wafer opposite the first surface, the second wafer including second regions; exposing the wiring regions by thinning the first wafer after joining the first wafer to the device wafer; and cutting the device wafer, the first wafer, and the second wafer after thinning the first wafer.
    • 一种方法包括在包括在第一晶片中的第一区域中形成凹槽以形成由凹槽限定的布线区域; 在槽中形成绝缘部分; 在形成有所述布线区域的所述第一晶片的表面之后,在形成所述绝缘部分之后,将包括器件形成区域的器件晶片的第一表面接合; 在将所述第一晶片连接到所述器件晶片之后,在所述第一晶片的布线区域中形成通孔,所述孔延伸穿过所述第一晶片; 用导电材料填充孔; 将第二晶片连接到与所述第一表面相对的所述器件晶片的第二表面,所述第二晶片包括第二区域; 在将第一晶片连接到器件晶片之后,通过使第一晶片变薄来暴露布线区域; 以及在使所述第一晶片变薄之后切割所述器件晶片,所述第一晶片和所述第二晶片。