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    • 1. 发明授权
    • Photodiode device including window defined in passivation layer for removing electrostatic charge
    • 光电二极管器件包括在钝化层中定义的窗口,用于去除静电电荷
    • US06873025B2
    • 2005-03-29
    • US09984657
    • 2001-10-30
    • Hideo WadaIsamu OhkuboKazuhiro NatsuakiNaoki FukunagaShigeki Hayashida
    • Hideo WadaIsamu OhkuboKazuhiro NatsuakiNaoki FukunagaShigeki Hayashida
    • H01L27/14H01L29/40H01L29/88H01L31/0216H01L31/06H01L31/10
    • H01L31/02161
    • A photodiode includes a first conductivity type semiconductor substrate or a first conductivity type semiconductor layer; a second conductivity type semiconductor layer provided on the first conductivity type semiconductor substrate or the first conductivity type semiconductor layer; an anti-reflection film provided on a surface of a portion of the second conductivity type semiconductor layer which is in a light receiving area; a first conductive layer provided in an area in the vicinity of the light receiving area; and a passivation layer provided on the first conductive layer. Light incident on the photodiode is detected by a junction of the one of the first conductivity type semiconductor substrate and the first conductivity type semiconductor layer, and the second conductivity type semiconductor layer. The area in the vicinity of the light receiving area includes a window area having an opening in the passivation layer for partially exposing the first conductive layer.
    • 光电二极管包括第一导电类型半导体衬底或第一导电类型半导体层; 设置在所述第一导电型半导体基板或所述第一导电型半导体层上的第二导电型半导体层; 设置在所述第二导电型半导体层的位于光接收区域的部分的表面上的防反射膜; 设置在所述光接收区域附近的区域中的第一导电层; 以及设置在第一导电层上的钝化层。 通过第一导电类型半导体衬底和第一导电类型半导体层之一以及第二导电类型半导体层的接合来检测入射在光电二极管上的光。 光接收区域附近的区域包括在钝化层中具有用于部分地暴露第一导电层的开口的窗口区域。
    • 4. 发明授权
    • Light receiving element and light receiving device incorporating circuit and optical disk drive
    • 光接收元件和光接收装置并入电路和光盘驱动器
    • US07307326B2
    • 2007-12-11
    • US10499357
    • 2002-12-10
    • Shigeki HayashidaTatsuya MoriokaYoshihiko TaniIsamu OhkuboHideo Wada
    • Shigeki HayashidaTatsuya MoriokaYoshihiko TaniIsamu OhkuboHideo Wada
    • H01L31/00H01L31/0232
    • H01L31/103H01L31/02161
    • A light receiving device includes a silicon substrate, a first P type diffusion layer on the silicon substrate, and a P type semiconductor layer on the P type diffusion layer. On a surface part of the P type semiconductor layer, two N type diffusion layers as light receiving parts, and a second P type diffusion layer between the two N type diffusion layers are provided. On the P type semiconductor layer, an antireflection film structure composed of a first silicon oxide formed by thermal oxidation and a second silicon oxide formed by CVD is provided. A film thickness of the first silicon oxide is set at about 15 nm, thus a defect in a interface between the first silicon oxide and the P type semiconductor layer is prevented. A film thickness of the second silicon oxide is set at about 100 nm, thus a leak current between cathodes is prevented when a power supply voltage is applied for long period of time.
    • 光接收装置包括硅衬底,硅衬底上的第一P型扩散层和P型扩散层上的P型半导体层。 在P型半导体层的表面部分设置有作为光接收部的两个N型扩散层和在两个N型扩散层之间的第二P型扩散层。 在P型半导体层上,提供了由通过热氧化形成的第一氧化硅和通过CVD形成的第二氧化硅构成的抗反射膜结构。 第一氧化硅的膜厚设定为约15nm,因此防止了第一氧化硅与P型半导体层之间的界面的缺陷。 第二氧化硅的膜厚设定为约100nm,因此长时间施加电源电压时,能够防止阴极之间的漏电流。
    • 9. 发明授权
    • Circuit-integrated light-receiving device
    • 电路集成光接收装置
    • US06313484B1
    • 2001-11-06
    • US09472886
    • 1999-12-28
    • Isamu OhkuboMasaru KuboNaoki FukunagaTakahiro TakimotoMutsumi OkaToshimitsu Kasamatsu
    • Isamu OhkuboMasaru KuboNaoki FukunagaTakahiro TakimotoMutsumi OkaToshimitsu Kasamatsu
    • H01L2715
    • H01L27/1443
    • A circuit-integrated light-receiving device of the present invention includes: a semiconductor substrate of a first conductivity type; a first semiconductor crystal growth layer of the first conductivity type provided on a surface of the semiconductor substrate, wherein the first semiconductor crystal growth layer includes a first portion whose impurity concentration gradually decreases in a direction away from the surface of the semiconductor substrate and a second portion located in a first region above the first portion whose impurity concentration distribution is uniform in a depth direction; a buried diffusion layer of the first conductivity type located in a second region which is above the first portion of the first semiconductor crystal growth layer and does not overlap the first region; a second semiconductor crystal growth layer of a second conductivity type which is provided across a surface of the first semiconductor crystal growth layer and a surface of the buried diffusion layer; and a separation diffusion region having the first conductivity type for dividing the second semiconductor crystal growth layer into a light-receiving device section and a signal processing circuit section. The first region is located in the light-receiving device section. In the signal processing circuit section, the buried diffusion layer is in contact with the first portion of the first semiconductor crystal growth layer.
    • 本发明的电路集成光接收装置包括:第一导电类型的半导体衬底; 设置在所述半导体衬底的表面上的第一导电类型的第一半导体晶体生长层,其中所述第一半导体晶体生长层包括其杂质浓度在远离所述半导体衬底的表面的方向上逐渐减小的第一部分,以及第二半导体晶体生长层 位于第一部分上方的第一部分的部分,其杂质浓度分布在深度方向上是均匀的; 位于第一半导体晶体生长层的第一部分之上并且不与第一区域重叠的第二区域中的第一导电类型的掩埋扩散层; 设置在第一半导体晶体生长层的表面和掩埋扩散层的表面之间的第二导电类型的第二半导体晶体生长层; 以及具有第一导电类型的分离扩散区域,用于将第二半导体晶体生长层分割成光接收装置部分和信号处理电路部分。 第一区域位于光接收装置部分中。 在信号处理电路部中,埋入扩散层与第一半导体晶体生长层的第一部分接触。
    • 10. 发明授权
    • Light sensitive element and light sensitive element having internal circuitry
    • 具有内部电路的光敏元件和光敏元件
    • US06404029B1
    • 2002-06-11
    • US09656461
    • 2000-09-06
    • Makoto HosokawaNaoki FukunagaTakahiro TakimotoMasaru KuboToshihiko FukushimaIsamu Ohkubo
    • Makoto HosokawaNaoki FukunagaTakahiro TakimotoMasaru KuboToshihiko FukushimaIsamu Ohkubo
    • H01L2714
    • H01L27/1443H01L31/0352
    • A photosensitive device includes a semiconductor substrate and a first semiconductor layer, both of a first conductivity type, with the semiconductor layer being formed on the semiconductor substrate and having a lower impurity concentration than that of the semiconductor substrate. A second semiconductor layer, of a second conductivity type, is formed on the first semiconductor layer and at least one diffusion layer of the first conductivity type is formed from the surface of the second semiconductor layer so as to reach the surface of the first semiconductor layer. The diffusion layer subdivides the second semiconductor layer into a plurality of semiconductor regions At least one photodiode portion for converting signal light into an electrical signal is formed at a junction between at least one of the plurality of semiconductor regions and the first semiconductor layer. A depletion layer which is formed in the first semiconductor layer when a reverse bias voltage is applied to the at least one photodiode portion has a field intensity of about 0.3 V/&mgr;m or more.
    • 光敏器件包括半导体衬底和第一半导体层,它们都是第一导电型,半导体层形成在半导体衬底上,杂质浓度低于半导体衬底的半导体层。 第二导电类型的第二半导体层形成在第一半导体层上,并且从第二半导体层的表面形成至少一个第一导电类型的扩散层,以到达第一半导体层的表面 。 扩散层将第二半导体层细分为多个半导体区域在多个半导体区域和第一半导体层中的至少一个之间的接合处形成至少一个用于将信号光转换成电信号的光电二极管部分。 当向至少一个光电二极管部分施加反向偏置电压时,在第一半导体层中形成的耗尽层具有约0.3V / m 2以上的场强度。