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    • 6. 发明授权
    • Apparatus for polishing outer periphery of workpiece
    • 用于抛光工件外周的装置
    • US06250995B1
    • 2001-06-26
    • US09403585
    • 1999-12-16
    • Shunji Hakomori
    • Shunji Hakomori
    • B24B906
    • B24B9/065B24B41/061B24B49/16
    • To provide a small polishing means featuring high machining efficiency that is capable of efficiently and quickly mirror-polishing an outer periphery of a chamfered workpiece (5) by bringing the outer periphery into even contact with a plurality of polishing drums (2, 2) at the same time. In an apparatus for polishing an outer periphery by bringing an outer periphery of the workpiece (5) retained by workpiece retaining means (3a, 3b) into contact with two polishing drums (2, 2) simultaneously to perform mirror polishing, the workpiece retaining means (3a, 3b) are supported by a sliding mechanism (16) such that they may move in a direction in which the two polishing drums (2, 2) are arranged, thereby to form an aligning means. In addition, the workpiece retaining means (3a, 3b) are provided with loading means (30) for absorbing a force applied to the workpiece retaining means in an X direction, the force being generated due to contact between the rotating workpiece (5) and the polishing drums (2, 2).
    • 为了提供一种具有高加工效率的小型抛光装置,其能够通过使外周与多个研磨滚筒(2,2)均匀地接触而能够有效且快速地对斜面工件(5)的外周进行镜面抛光 同一时间。 在通过使由工件保持装置(3a,3b)保持的工件(5)的外周同时与两个抛光滚筒(2,2)同时进行抛光的外周抛光的装置中,进行镜面抛光,工件保持装置 (3a,3b)由滑动机构(16)支撑,使得它们可以沿着布置两个抛光滚筒(2,2)的方向移动,从而形成对准装置。 另外,工件保持装置(3a,3b)设置有用于吸收沿X方向施加到工件保持装置的力的装载装置(30),该力由于旋转工件(5)和 抛光滚筒(2,2)。
    • 8. 发明授权
    • Apparatus for polishing periphery of device wafer and polishing method
    • 用于抛光装置晶片周边的装置和抛光方法
    • US06773335B2
    • 2004-08-10
    • US10116327
    • 2002-04-04
    • Shunji Hakomori
    • Shunji Hakomori
    • B24B719
    • B24B37/042B24B9/065
    • When a device wafer is chucked and is rotated about an axis thereof, arc-shaped work faces of first and second inclined-face-polishing members are brought into line-contact with inclined faces disposed at front and rear faces, respectively, of the device wafer, the arc-shaped work face of a peripheral-face-polishing member is brought into line-contact with a peripheral face of the device wafer, and a disc-shaped work face of a peripheral-edge-polishing member is brought into planar contact with the front face of the device wafer at a peripheral edge thereof, whereby the inclined faces, the peripheral face, and the peripheral edge are polished simultaneously by the respective polishing members. Thus, an unnecessary part of a metallic film is removed from the periphery of the device wafer.
    • 当装置晶片被夹紧并围绕其轴线旋转时,第一和第二倾斜面抛光构件的弧形工作面分别与设置在装置的前后表面上的倾斜面线接触 圆周面抛光部件的圆弧状工作面与装置晶圆的周面线接触,将周边抛光部件的圆盘状工作面成为平面状 在其周边与设备晶片的正面接触,由此各个抛光件同时抛光倾斜面,周面和周缘。 因此,金属膜的不需要的部分从器件晶片的周边去除。