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1. 发明授权

US06812766B2 Input/output circuit of semiconductor integrated circuit 失效
公开(公告)号：US06812766B2
公开(公告)日：2004-11-02
申请号：US10151949
申请日：2002-05-22
申请人： Hideo Oishi , Tadayoshi Seike , Masanori Hirofuji
发明人： Hideo Oishi , Tadayoshi Seike , Masanori Hirofuji
IPC分类号： H03K508
CPC分类号： H03K19/00315
摘要： The input/output circuit of the present invention includes a first p-channel transistor and a charge drawing circuit. The first p-channel transistor is connected to an input/output pad of the semiconductor integrated circuit. The charge drawing circuit, driven with a control signal, draws a charge from an n-well diffusion region of the p-channel transistor during output. By the charge drawing, the potential at the n-well diffusion region of the p-channel transistor is kept at the supply voltage during output, and thus the input/output circuit is prevented from deterioration in current flow capability due to a back bias effect.

2. 发明授权

US4174749A Air conditioning display system for vehicles 失效
标题翻译：汽车空调显示系统
公开(公告)号：US4174749A
公开(公告)日：1979-11-20
申请号：US881783
申请日：1978-02-27
申请人： Hideo Oishi
发明人： Hideo Oishi
IPC分类号： B60H1/00 , H02B15/02 , F28F27/00
CPC分类号： B60H1/00985 , H02B15/02 , Y10S165/007
摘要： An air conditioning display system for a vehicle comprising a vehicle's air conditioner proper including a plurality of air intake ducts, a plurality of air discharge ducts, a plurality of dampers, and a fan unit, an air conditioner actuator actuating the dampers and the fan unit thereby introducing and discharging air into and out of the air conditioner proper, and a display device including a display panel carrying the picture of the vehicle body portions around the front seat for displaying the flowing patterns of air out of the air conditioner proper. Illuminating means is disposed behind the display panel and is selectively energized so that the occupant can readily visually confirm the flow air from the duct outlets.
摘要翻译：一种用于车辆的空调显示系统，包括：车辆空调机，其包括多个进气管道，多个排气管道，多个阻尼器和风扇单元;致动所述风门和风扇单元的空调致动器从而引入和排出空气调节器本身的显示装置，以及显示装置，该显示装置包括显示面板，该显示面板承载着前座椅周围的车体部分的图像，用于将空气流出的图案从空调器本体中显示出来。照明装置设置在显示面板的后面并且被选择性地通电，使得乘客可以容易地目视地确认来自导管出口的流动空气。

3. 发明授权

US4529336A Method of distributing and transporting powdered or granular material 失效
标题翻译：分配和运输粉状或颗粒状材料的方法
公开(公告)号：US4529336A
公开(公告)日：1985-07-16
申请号：US482638
申请日：1983-04-06
申请人： Yoshinobu Shinozaki , Motozo Yasuno , Tadaaki Iwamura , Hironari Marushima , Yoshiteru Tagawa , Ryoji Takabe , Takashi Moriyama , Shuzo Fujii , Keiichi Achiba , Hideo Oishi , Yasuo Yanagihara , Yoshiaki Masuda
发明人： Yoshinobu Shinozaki , Motozo Yasuno , Tadaaki Iwamura , Hironari Marushima , Yoshiteru Tagawa , Ryoji Takabe , Takashi Moriyama , Shuzo Fujii , Keiichi Achiba , Hideo Oishi , Yasuo Yanagihara , Yoshiaki Masuda
IPC分类号： B65G53/66 , C21B5/00
CPC分类号： B65G53/66 , C21B5/003
摘要： A method of distributing powdered or granular material to a plurality of feeding ends in a system having a pressurizing tank for pressurizing and fluidizing a powdered or granular material, a plurality of transportation pipes having one ends constituting discharge nozzles opening above a fluidized bed in the tank and the other ends connected to different feeding ends so as to introduce the material to the feeding ends, and a plurality of booster gas supply pipes for supplying respective transportation pipes with a booster gas. The internal pressure of the tank is controlled by a controller provided with a set valve in accordance with the mean value of the terminal pressures at the feeding ends, the mean value of predetermined set flow rates of the booster gas in the booster gas supplying pipes, and the mean value of predetermined set rates of transportation of material to the feeding ends.
摘要翻译：一种在具有用于加压和流化粉末或颗粒材料的加压罐的系统中将粉末状或颗粒状材料分配到多个进料端的方法，多个输送管，其一端构成在罐中的流化床上方开口的排出喷嘴另一端连接到不同的进料端，以将材料引入进料端;以及多个增压气体供应管，用于向相应的输送管提供助燃气体。通过根据进料端的端子压力的平均值，增压气体供给管中的增压气体的预定设定流量的平均值，由设置有设定阀的控制器来控制油箱的内部压力，以及将材料输送到给料端的预定设定速率的平均值。

4. 发明申请

US20070077667A1 Semiconductor wafer test system 失效
标题翻译：半导体晶圆测试系统
公开(公告)号：US20070077667A1
公开(公告)日：2007-04-05
申请号：US11607909
申请日：2006-12-04
申请人： Hideo Oishi
发明人： Hideo Oishi
IPC分类号： H01L21/66 , G01R31/26
CPC分类号： G01R31/2879 , G01R31/2831 , G01R31/30 , G01R31/303
摘要： A semiconductor wafer test system for carrying out a burn-in test on a semiconductor wafer including multiple semiconductor devices thereon. A metal interconnect is connected to the gate electrode of each of those devices. A power supply applies an ac voltage of predetermined amplitude to a conductive plate, which creates an ac electric field to be placed on the devices. The ac field should have an intensity at least equal to a minimum value required for the burn-in test and less than a critical value, below which no breakdown occurs in the gate oxide film of each device. By changing the amount of time for which the devices are exposed to the ac field, the burn-in period can be changed freely. In addition, forward and reverse fields are both placed on the gate oxide film of each device. Thus, failures can be screened out very effectively.
摘要翻译：一种用于在其上包括多个半导体器件的半导体晶片上进行老化测试的半导体晶片测试系统。金属互连连接到这些器件中的每一个的栅电极。电源对导电板施加预定幅度的交流电压，从而产生要置于器件上的交流电场。交流场应该具有至少等于老化测试所需的最小值的强度，并且小于临界值，低于每个器件的栅极氧化膜中不发生击穿。通过改变设备暴露于交流电场的时间量，可以自由地改变老化周期。此外，正向和反向场均放置在每个器件的栅极氧化膜上。因此，可以非常有效地筛选故障。

5. 发明授权

US4914411A Electro-magnetic relay 失效
标题翻译：电磁继电器
公开(公告)号：US4914411A
公开(公告)日：1990-04-03
申请号：US295704
申请日：1989-01-09
申请人： Hiroshi Hikita , Katsumi Shibata , Hideo Oishi , Hiroshi Yoshikawa
发明人： Hiroshi Hikita , Katsumi Shibata , Hideo Oishi , Hiroshi Yoshikawa
IPC分类号： H01H50/04
CPC分类号： H01H50/042
摘要： The electro-magnet relay of the present invention utilizes an iron core and an armature both formed as flat plates stacked together. Further, a stationary leaf spring and a moveable leaf spring are provided in the middle section of the iron core having two legs and being shaped as an inverted U. The armature is supported in a hole located in the insulating substrate and may swing to a degree determined by a striking piece formed on the armature. Coil terminals and contact terminals protruding from the bottom of the insulating substrate are arranged in a single line in the electro-magnetic relay of the present invention and may be installed on a high density printed circuit board.
摘要翻译：本发明的电磁继电器利用铁芯和电枢，两者均形成为平板堆叠在一起。此外，在具有两个腿的铁芯的中间部分中设置有固定的板簧和可动的板簧，并且成形为倒U形。电枢被支撑在位于绝缘衬底中的孔中，并且可以摆动到一定程度由形成在电枢上的撞击件确定。从绝缘基板的底部突出的线圈端子和接触端子以本发明的电磁继电器为单线布置，并且可以安装在高密度印刷电路板上。

6. 发明授权

US07355266B2 Semiconductor wafer test system 失效
标题翻译：半导体晶圆测试系统
公开(公告)号：US07355266B2
公开(公告)日：2008-04-08
申请号：US11607909
申请日：2006-12-04
申请人： Hideo Oishi
发明人： Hideo Oishi
IPC分类号： H01L29/06
CPC分类号： G01R31/2879 , G01R31/2831 , G01R31/30 , G01R31/303
摘要： A semiconductor wafer test system for carrying out a burn-in test on a semiconductor wafer including multiple semiconductor devices thereon. A metal interconnect is connected to the gate electrode of each of those devices. A power supply applies an ac voltage of predetermined amplitude to a conductive plate, which creates an ac electric field to be placed on the devices. The ac field should have an intensity at least equal to a minimum value required for the burn-in test and less than a critical value, below which no breakdown occurs in the gate oxide film of each device. By changing the amount of time for which the devices are exposed to the ac field, the burn-in period can be changed freely. In addition, forward and reverse fields are both placed on the gate oxide film of each device. Thus, failures can be screened out very effectively.
摘要翻译：一种用于在其上包括多个半导体器件的半导体晶片上进行老化测试的半导体晶片测试系统。金属互连连接到这些器件中的每一个的栅电极。电源对导电板施加预定幅度的交流电压，从而产生要置于设备上的交流电场。交流场应该具有至少等于老化测试所需的最小值的强度，并且小于临界值，低于每个器件的栅极氧化膜中不发生击穿。通过改变设备暴露于交流电场的时间量，可以自由地改变老化周期。此外，正向和反向场均放置在每个器件的栅极氧化膜上。因此，可以非常有效地筛选故障。

7. 发明授权

US07151003B2 Semiconductor wafer test system 失效
标题翻译：半导体晶圆测试系统
公开(公告)号：US07151003B2
公开(公告)日：2006-12-19
申请号：US10602878
申请日：2003-06-25
申请人： Hideo Oishi
发明人： Hideo Oishi
IPC分类号： H01L21/66
CPC分类号： G01R31/2879 , G01R31/2831 , G01R31/30 , G01R31/303
摘要： A semiconductor wafer test system for carrying out a burn-in test on a semiconductor wafer including multiple semiconductor devices thereon. A metal interconnect is connected to the gate electrode of each of those devices. A power supply applies an ac voltage of predetermined amplitude to a conductive plate, which creates an ac electric field to be placed on the devices. The ac field should have an intensity at least equal to a minimum value required for the burn-in test and less than a critical value, below which no break-down occurs in the gate oxide film of each device. By changing the amount of time for which the devices are exposed to the ac field, the burn-in period can be changed freely. In addition, forward and reverse fields are both placed on the gate oxide film of each device. Thus, failures can be screened out very effectively.
摘要翻译：一种用于在其上包括多个半导体器件的半导体晶片上进行老化测试的半导体晶片测试系统。金属互连件连接到这些器件中的每一个的栅电极。电源对导电板施加预定幅度的交流电压，从而产生要置于设备上的交流电场。交流场应该具有至少等于老化测试所需的最小值的强度，并且小于临界值，低于此值时，在每个器件的栅极氧化膜中不会发生分解。通过改变设备暴露于交流电场的时间量，可以自由地改变老化周期。此外，正向和反向场均放置在每个器件的栅极氧化膜上。因此，可以非常有效地筛选故障。

8. 发明授权

US06603316B2 Semiconductor wafer test system 失效
公开(公告)号：US06603316B2
公开(公告)日：2003-08-05
申请号：US09905922
申请日：2001-07-17
申请人： Hideo Oishi
发明人： Hideo Oishi
IPC分类号： H01H3112
CPC分类号： G01R31/2879 , G01R31/2831 , G01R31/30 , G01R31/303
摘要： A semiconductor wafer test system for carrying out a burn-in test on a semiconductor wafer including multiple semiconductor devices thereon. A metal interconnect is connected to the gate electrode of each of those devices. A power supply applies an ac voltage of predetermined amplitude to a conductive plate, which creates an ac electric field to be placed on the devices. The ac field should have an intensity at least equal to a minimum value required for the burn-in test and less than a critical value, below which no breakdown occurs in the gate oxide film of each device. By changing the amount of time for which the devices are exposed to the ac field, the burn-in period can be changed freely. In addition, forward and reverse fields are both placed on the gate oxide film of each device. Thus, failures can be screened out very effectively.

9. 发明申请

US20050099854A1 Semiconductor wafer test system 失效
标题翻译：半导体晶圆测试系统
公开(公告)号：US20050099854A1
公开(公告)日：2005-05-12
申请号：US10602878
申请日：2003-06-25
申请人： Hideo Oishi
发明人： Hideo Oishi
IPC分类号： G01R31/26 , G01R31/28 , G01R31/30 , H01L21/66 , G11C29/00
CPC分类号： G01R31/2879 , G01R31/2831 , G01R31/30 , G01R31/303
摘要： A semiconductor wafer test system for carrying out a burn-in test on a semiconductor wafer including multiple semiconductor devices thereon. A metal interconnect is connected to the gate electrode of each of those devices. A power supply applies an ac voltage of predetermined amplitude to a conductive plate, which creates an ac electric field to be placed on the devices. The ac field should have an intensity at least equal to a minimum value required for the burn-in test and less than a critical value, below which no break-down occurs in the gate oxide film of each device. By changing the amount of time for which the devices are exposed to the ac field, the burn-in period can be changed freely. In addition, forward and reverse fields are both placed on the gate oxide film of each device. Thus, failures can be screened out very effectively.
摘要翻译：一种用于在其上包括多个半导体器件的半导体晶片上进行老化测试的半导体晶片测试系统。金属互连连接到这些器件中的每一个的栅电极。电源对导电板施加预定幅度的交流电压，从而产生要置于器件上的交流电场。交流场应该具有至少等于老化测试所需的最小值的强度，并且小于临界值，低于此值时，在每个器件的栅极氧化膜中不会发生分解。通过改变设备暴露于交流电场的时间量，可以自由地改变老化周期。此外，正向和反向场均放置在每个器件的栅极氧化膜上。因此，可以非常有效地筛选故障。

10. 发明授权

US4214091A Antibiotic No. 2-200 and process for producing thereof 失效
标题翻译：抗生素No.2-200及其制备方法
公开(公告)号：US4214091A
公开(公告)日：1980-07-22
申请号：US944303
申请日：1978-09-21
申请人： Hideo Oishi , Takao Noto , Yoshiharu Nawata , Hiroshi Okazaki , Hiroshi Sasaki , Kunio Ando , Haruki Ogawa
发明人： Hideo Oishi , Takao Noto , Yoshiharu Nawata , Hiroshi Okazaki , Hiroshi Sasaki , Kunio Ando , Haruki Ogawa
IPC分类号： C12P17/00 , A61K31/38 , A61K31/381 , A61P31/04 , C07D333/04 , C07D333/32 , C12R1/365
CPC分类号： C07D333/32
摘要： A novel antibiotic No. 2-200 represented by the formula ##STR1## which has a broad antimicrobial spectrum and a process for producing the same by cultivating an antibiotic No. 2-200 producing microorganism of the genus Nocardia, and recovering by isolation the antibiotic No. 2-200 accumulated in the culture.
摘要翻译：一种新型抗生素No.2-200，由具有广谱抗菌谱的式“IMAGE”表示，其制备方法是通过培养产生诺卡氏菌属的No.2-200生产微生物的抗生素，并通过分离回收抗生素 2-200号文化积淀。

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