会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 1. 发明申请
    • ANALYTICAL METHOD AND ANALYTICAL SYSTEM
    • 分析方法和分析系统
    • US20110133074A1
    • 2011-06-09
    • US13057699
    • 2009-07-22
    • Hideki NakanishiKeisuke UtaniKohei Nishiguchi
    • Hideki NakanishiKeisuke UtaniKohei Nishiguchi
    • B01D59/44H01J49/10
    • G01N27/62G01N21/68G01N2001/045H01J49/0463H01J49/105
    • Analytical method and analytical system are presented, wherein properties of the carrier gas conveying fine particles and gas components generated by laser ablation can be prevented from inhibiting the optimization of analysis conditions, and plural kinds of elements can be stably measured with high sensitivity and good accuracy without losing operability, speed, and convenience when fine particles generated by laser ablation are plasma-analyzed. A sample α is converted into fine particles by a laser ablation device in the atmosphere of a first gas. The fine particles are conveyed from the laser ablation device to a gas replacement device by using the first gas as a carrier gas. The first gas of at least part of the carrier gas conveying the fine particles is replaced with a second gas by means of the gas replacement device. The fine particles are conveyed from the gas replacement device to the plasma analyzer by the carrier gas that has been subjected to the gas replacement. Constituent elements of the fine particles are analyzed by the plasma analyzer.
    • 提出了分析方法和分析系统,其中可以防止通过激光烧蚀产生的输送细颗粒和气体组分的载气的性质抑制分析条件的优化,并且可以以高灵敏度和高精度稳定地测量多种元素 而通过激光烧蚀产生的细颗粒进行等离子体分析时,不会损失可操作性,速度和便利性。 在第一气体的气氛中,通过激光烧蚀装置将样品α转化成细颗粒。 通过使用第一气体作为载气,将细颗粒从激光烧蚀装置输送到气体置换装置。 通过气体置换装置,用第二气体代替输送细颗粒的至少一部分载气的第一气体。 通过已进行气体置换的载气,将细颗粒从气体置换装置输送到等离子体分析器。 通过等离子体分析仪分析细颗粒的成分元素。
    • 2. 发明申请
    • Sample Introducing System
    • 示例介绍系统
    • US20090173171A1
    • 2009-07-09
    • US12227075
    • 2007-03-30
    • Keisuke UtaniKohei Nishiguchi
    • Keisuke UtaniKohei Nishiguchi
    • G01N1/22
    • G01N21/714G01N30/14G01N30/32G01N2030/324
    • In a sample introducing system that can be easily adapted to a variety of analytical conditions without being affected by a flow rate of gas introduced into an analytical device, can introduce an analytical sample into the analytical device without loss, and can contribute to a simple and highly accurate high-sensitivity analysis, a pretreatment device removes unnecessary components from an untreated sample gas containing the analytical sample. A treated sample gas that has been pretreated by the pretreatment device is introduced into the analytical device via a connection gas flow channel. A gas addition device that adds a carrier gas to the treated sample gas flowing toward the analytical device in the connection gas flow channel has a means for changing the addition flow rate of the carrier gas. Pressure fluctuations of the gas containing the analytical sample are restricted by a pressure adjusting device upstream of the gas addition device.
    • 在可以容易地适应于各种分析条件而不受引入分析装置的气体的流量的影响的样品引入系统中,可以将分析样品引入分析装置而没有损失,并且可以有助于简单和 高度精确的高灵敏度分析,预处理装置从含有分析样品的未处理样品气体中除去不需要的成分。 经预处理装置预处理的经处理样品气体经由连接气体流路导入分析装置。 在连接气体流路中向被分析装置流动的被处理样品气体中添加载气的气体添加装置具有改变载气的添加流量的手段。 包含分析样品的气体的压力波动受到气体添加装置上游的压力调节装置的限制。
    • 3. 发明授权
    • Sample introducing system
    • 样品介绍系统
    • US08020458B2
    • 2011-09-20
    • US12227075
    • 2007-03-30
    • Keisuke UtaniKohei Nishiguchi
    • Keisuke UtaniKohei Nishiguchi
    • G01N1/22
    • G01N21/714G01N30/14G01N30/32G01N2030/324
    • In a sample introducing system that can be easily adapted to a variety of analytical conditions without being affected by a flow rate of gas introduced into an analytical device, can introduce an analytical sample into the analytical device without loss, and can contribute to a simple and highly accurate high-sensitivity analysis, a pretreatment device removes unnecessary components from an untreated sample gas containing the analytical sample. A treated sample gas that has been pretreated by the pretreatment device is introduced into the analytical device via a connection gas flow channel. A gas addition device that adds a carrier gas to the treated sample gas flowing toward the analytical device in the connection gas flow channel has a means for changing the addition flow rate of the carrier gas. Pressure fluctuations of the gas containing the analytical sample are restricted by a pressure adjusting device upstream of the gas addition device.
    • 在可以容易地适应于各种分析条件而不受引入分析装置的气体的流量的影响的样品引入系统中,可以将分析样品引入分析装置而没有损失,并且可以有助于简单和 高度精确的高灵敏度分析,预处理装置从含有分析样品的未处理样品气体中除去不需要的成分。 经预处理装置预处理的经处理样品气体经由连接气体流路导入分析装置。 在连接气体流路中向被分析装置流动的被处理样品气体中添加载气的气体添加装置具有改变载气的添加流量的手段。 包含分析样品的气体的压力波动受到气体添加装置上游的压力调节装置的限制。