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1. 发明专利

JP2013205241A Measuring method of measuring object gas and measuring system 有权
标题翻译：测量对象气体和测量系统的测量方法
公开(公告)号：JP2013205241A
公开(公告)日：2013-10-07
申请号：JP2012074874
申请日：2012-03-28
申请人： Keisuke Utani , 啓介宇谷 , Kohei Nishiguchi , 講平西口
发明人： UTANI KEISUKE , NISHIGUCHI KOHEI
IPC分类号： G01N1/00
摘要： PROBLEM TO BE SOLVED: To provide a measuring method of a measuring object gas, with which a gas component contained in a sample gas can also be defined as a measuring object, and a measuring system.SOLUTION: A measuring method of a measuring object gas is provided for measuring a measuring object in a gaseous state contained in a sample gas and includes a step for adding a reaction gas to the sample gas to make the measuring object into a solid-state or liquid-state reactant, a step for adding a gas for aggregation to the sample gas to produce an aggregate containing the reactant, and a step for measuring the aggregate. It is preferable for the measuring method to use a gas which reacts with the reaction gas to produce particles for aggregation, as the gas for aggregation. In particular, it is preferable to use ozone as the reaction gas and to use ammonia as the gas for aggregation.
摘要翻译：要解决的问题：提供一种测量对象气体的测量方法，其中包含在样品气体中的气体成分也可以被定义为测量对象。测量系统。解决方案：测量对象气体的测量方法被提供用于测量包含在样品气体中的气态的测量对象，并且包括将样品气体添加到样品气体中以使测量对象成为固体或液体状态的反应物的步骤，用于与样品气体聚集以产生含有反应物的聚集体的气体和用于测量聚集体的步骤。测量方法优选使用与反应气体反应的气体来产生用于聚集的颗粒，作为用于聚集的气体。特别优选使用臭氧作为反应气体，并且使用氨作为聚集气体。

2. 发明授权

US08020458B2 Sample introducing system 失效
标题翻译：样品介绍系统
公开(公告)号：US08020458B2
公开(公告)日：2011-09-20
申请号：US12227075
申请日：2007-03-30
申请人： Keisuke Utani , Kohei Nishiguchi
发明人： Keisuke Utani , Kohei Nishiguchi
IPC分类号： G01N1/22
CPC分类号： G01N21/714 , G01N30/14 , G01N30/32 , G01N2030/324
摘要： In a sample introducing system that can be easily adapted to a variety of analytical conditions without being affected by a flow rate of gas introduced into an analytical device, can introduce an analytical sample into the analytical device without loss, and can contribute to a simple and highly accurate high-sensitivity analysis, a pretreatment device removes unnecessary components from an untreated sample gas containing the analytical sample. A treated sample gas that has been pretreated by the pretreatment device is introduced into the analytical device via a connection gas flow channel. A gas addition device that adds a carrier gas to the treated sample gas flowing toward the analytical device in the connection gas flow channel has a means for changing the addition flow rate of the carrier gas. Pressure fluctuations of the gas containing the analytical sample are restricted by a pressure adjusting device upstream of the gas addition device.
摘要翻译：在可以容易地适应于各种分析条件而不受引入分析装置的气体的流量的影响的样品引入系统中，可以将分析样品引入分析装置而没有损失，并且可以有助于简单和高度精确的高灵敏度分析，预处理装置从含有分析样品的未处理样品气体中除去不需要的成分。经预处理装置预处理的经处理样品气体经由连接气体流路导入分析装置。在连接气体流路中向被分析装置流动的被处理样品气体中添加载气的气体添加装置具有改变载气的添加流量的手段。包含分析样品的气体的压力波动受到气体添加装置上游的压力调节装置的限制。

3. 发明申请

US20110133074A1 ANALYTICAL METHOD AND ANALYTICAL SYSTEM 审中-公开
标题翻译：分析方法和分析系统
公开(公告)号：US20110133074A1
公开(公告)日：2011-06-09
申请号：US13057699
申请日：2009-07-22
申请人： Hideki Nakanishi , Keisuke Utani , Kohei Nishiguchi
发明人： Hideki Nakanishi , Keisuke Utani , Kohei Nishiguchi
IPC分类号： B01D59/44 , H01J49/10
CPC分类号： G01N27/62 , G01N21/68 , G01N2001/045 , H01J49/0463 , H01J49/105
摘要： Analytical method and analytical system are presented, wherein properties of the carrier gas conveying fine particles and gas components generated by laser ablation can be prevented from inhibiting the optimization of analysis conditions, and plural kinds of elements can be stably measured with high sensitivity and good accuracy without losing operability, speed, and convenience when fine particles generated by laser ablation are plasma-analyzed. A sample α is converted into fine particles by a laser ablation device in the atmosphere of a first gas. The fine particles are conveyed from the laser ablation device to a gas replacement device by using the first gas as a carrier gas. The first gas of at least part of the carrier gas conveying the fine particles is replaced with a second gas by means of the gas replacement device. The fine particles are conveyed from the gas replacement device to the plasma analyzer by the carrier gas that has been subjected to the gas replacement. Constituent elements of the fine particles are analyzed by the plasma analyzer.
摘要翻译：提出了分析方法和分析系统，其中可以防止通过激光烧蚀产生的输送细颗粒和气体组分的载气的性质抑制分析条件的优化，并且可以以高灵敏度和高精度稳定地测量多种元素而通过激光烧蚀产生的细颗粒进行等离子体分析时，不会损失可操作性，速度和便利性。在第一气体的气氛中，通过激光烧蚀装置将样品α转化成细颗粒。通过使用第一气体作为载气，将细颗粒从激光烧蚀装置输送到气体置换装置。通过气体置换装置，用第二气体代替输送细颗粒的至少一部分载气的第一气体。通过已进行气体置换的载气，将细颗粒从气体置换装置输送到等离子体分析器。通过等离子体分析仪分析细颗粒的成分元素。

4. 发明申请

US20090173171A1 Sample Introducing System 失效
标题翻译：示例介绍系统
公开(公告)号：US20090173171A1
公开(公告)日：2009-07-09
申请号：US12227075
申请日：2007-03-30
申请人： Keisuke Utani , Kohei Nishiguchi
发明人： Keisuke Utani , Kohei Nishiguchi
IPC分类号： G01N1/22
CPC分类号： G01N21/714 , G01N30/14 , G01N30/32 , G01N2030/324
摘要： In a sample introducing system that can be easily adapted to a variety of analytical conditions without being affected by a flow rate of gas introduced into an analytical device, can introduce an analytical sample into the analytical device without loss, and can contribute to a simple and highly accurate high-sensitivity analysis, a pretreatment device removes unnecessary components from an untreated sample gas containing the analytical sample. A treated sample gas that has been pretreated by the pretreatment device is introduced into the analytical device via a connection gas flow channel. A gas addition device that adds a carrier gas to the treated sample gas flowing toward the analytical device in the connection gas flow channel has a means for changing the addition flow rate of the carrier gas. Pressure fluctuations of the gas containing the analytical sample are restricted by a pressure adjusting device upstream of the gas addition device.
摘要翻译：在可以容易地适应于各种分析条件而不受引入分析装置的气体的流量的影响的样品引入系统中，可以将分析样品引入分析装置而没有损失，并且可以有助于简单和高度精确的高灵敏度分析，预处理装置从含有分析样品的未处理样品气体中除去不需要的成分。经预处理装置预处理的经处理样品气体经由连接气体流路导入分析装置。在连接气体流路中向被分析装置流动的被处理样品气体中添加载气的气体添加装置具有改变载气的添加流量的手段。包含分析样品的气体的压力波动受到气体添加装置上游的压力调节装置的限制。

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