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1. 发明授权

US07458818B2 Electric connector and electrical connecting apparatus using the same 有权
标题翻译：电连接器和使用其的电连接装置
公开(公告)号：US07458818B2
公开(公告)日：2008-12-02
申请号：US11940282
申请日：2007-11-14
申请人： Hidehiro Kiyofuji , Naoki Suto
发明人： Hidehiro Kiyofuji , Naoki Suto
IPC分类号： H01R12/00
CPC分类号： G01R1/07371 , G01R1/06722 , G01R1/07328 , H01R13/2421 , H01R2201/20
摘要： An electrical connecting device is disposed between a circuit board and a probe board opposing each other and used for connection between electrical connection terminals provided on the underside of said circuit board and electrical connection terminals provided on the probe board. In the electrical connecting device, an electrical insulating board has at least one of conductive earth patterns to be maintained at the earth potential on at least one selected from groups including the upside, underside and inside of the electrical insulating plate; a connecting pin disposed in each through hole of a first group is connected to the earth pattern, while a connecting pin disposed in each through hole of a second group is electrically separated from the earth pattern.
摘要翻译：电连接装置设置在彼此相对的电路板和探针板之间，用于连接设置在所述电路板的下侧的电连接端子和设置在探针板上的电连接端子。在电气连接装置中，电气绝缘板具有至少一种导电接地图案，其中至少一种导电接地图案在从包括电绝缘板的上侧，下侧和内侧的组中选择的至少一个中保持在接地电位; 设置在第一组的每个通孔中的连接销连接到接地图案，而设置在第二组的每个通孔中的连接销与接地图案电隔离。

2. 发明申请

US20080315905A1 Electrical Connecting Apparatus 有权
标题翻译：电气连接装置
公开(公告)号：US20080315905A1
公开(公告)日：2008-12-25
申请号：US12039027
申请日：2008-02-28
申请人： Shinji Kuniyoshi , Hidehiro Kiyofuji , Yuji Miyagi , Kiyotoshi Miura
发明人： Shinji Kuniyoshi , Hidehiro Kiyofuji , Yuji Miyagi , Kiyotoshi Miura
IPC分类号： G01R1/073
CPC分类号： G01R1/07307
摘要： The present invention provides an electrical connecting apparatus that does not cause lack of mechanical strength in a probe board. The electrical connecting apparatus comprises a probe board spaced from a support member and arranged with its one surface opposed to the support member. On one surface of the probe board is provided a fixed portion having an opened screw hole at its top portion, and on the other surface are provided probes that are connected to a tester. The electrical connecting apparatus comprises a cylindrical spacer keeping a distance from the support member to a top surface of the fixed portion and a male screw member screwed in the screw hole for the purpose of tightening the support member and the probe board at a distance in accordance with the length of the spacer. The probe board has a support plate in which a plurality of conductive paths penetrating in the plate thickness direction and connected to the tester are formed and a wiring plate in which wiring paths connected to the corresponding conductive paths are formed, whose one surface is fixed to the support plate, and on the other surface of which are provided the probes corresponding to the wiring paths. The fixed portion is constituted by a female screw member fixed to the support plate at an area where no conductive paths are formed.
摘要翻译：本发明提供一种不会在探针板中引起机械强度不足的电连接装置。电连接装置包括与支撑构件间隔开并且其一个表面与支撑构件相对布置的探针板。在探针板的一个表面设置有在其顶部具有打开的螺纹孔的固定部分，而在另一个表面上设置有连接到测试器的探针。电气连接装置包括一个圆柱形间隔件，其保持与支撑构件相对于固定部分顶表面的距离，以及螺纹连接在螺钉孔中的外螺纹构件，用于按照一定距离紧固支撑构件和探针板具有间隔件的长度。探针板具有支撑板，其中形成有沿板厚方向贯穿并连接到测试器的多个导电路径，并且布线板形成有连接到相应的导电路径的布线路径，其一个表面被固定到支撑板，并且在另一表面上设置有与布线路径相对应的探针。固定部分由在不形成导电路径的区域固定到支撑板的内螺纹构件构成。

3. 发明授权

US07667472B2 Probe assembly, method of producing it and electrical connecting apparatus 有权
标题翻译：探头组件及其制造方法及电气连接装置
公开(公告)号：US07667472B2
公开(公告)日：2010-02-23
申请号：US11912872
申请日：2005-05-23
申请人： Kiyotoshi Miura , Hidehiro Kiyofuji , Yuji Miyagi , Shinji Kuniyoshi , Hitoshi Sato
发明人： Kiyotoshi Miura , Hidehiro Kiyofuji , Yuji Miyagi , Shinji Kuniyoshi , Hitoshi Sato
IPC分类号： G01R31/02 , G01R31/26
CPC分类号： G01R31/2889 , G01R1/07314 , Y10T29/49204
摘要： A probe assembly for use in electrical measurement of a device under test. The probe assembly comprises a plate-like probe base plate with bending deformation produced in a free state without load, and a plurality of probes formed on one face of the probe base plate to project from the face. All the tips of the probes are positioned on the same plane parallel to an imaginary reference plane of the probe base plate.
摘要翻译：用于被测设备的电测量的探针组件。探针组件包括在空载状态下产生的具有弯曲变形的板状探针基板，以及形成在探针基板的一个面上的多个探针，以从面部突出。探针的所有尖端位于平行于探针基板的虚拟参考平面的同一平面上。

4. 发明授权

US07468610B2 Electrical connecting apparatus 有权
标题翻译：电气连接装置
公开(公告)号：US07468610B2
公开(公告)日：2008-12-23
申请号：US11871765
申请日：2007-10-12
申请人： Yuji Miyagi , Hidehiro Kiyofuji , Akihisa Akahira , Yoshinori Kikuchi
发明人： Yuji Miyagi , Hidehiro Kiyofuji , Akihisa Akahira , Yoshinori Kikuchi
IPC分类号： G01R31/02
CPC分类号： G01R31/2889 , G01R31/2891
摘要： An electrical connecting apparatus comprising: a circuit board on which a reinforcing plate is mounted and a plurality of first electric connections are provided; a probe board on which second electric connections corresponding to the first electric connections are provided, with a plurality of probes electrically connected to the corresponding second electric connections; an elastic connector having plural pairs of both contacts capable of contacting the first and second electric connections corresponding to each other of both boards therebetween and receiving a biasing force in directions for both contacts to separate from each other; screw members for integrally combining them; and a spacer member for holding the probe tips substantially on the same plane by tightening of the screw members. Between the reinforcing plate and the probe board, a spacer plate is inserted for adjusting a distance from the other surface of the probe board to the probe tips.
摘要翻译：一种电连接装置，包括：电路板，其上安装有加强板，并且设置有多个第一电连接; 探针板，其上设置有与第一电连接相对应的第二电连接，多个探针电连接到对应的第二电连接; 弹性连接器，其具有能够接触彼此之间的两个电极彼此之间的第一和第二电连接的两对触点，并且在两个触点彼此分离的方向上接收偏压力; 用于整体组合它们的螺钉构件; 以及用于通过拧紧螺钉构件将探针尖端基本保持在同一平面上的间隔构件。在加强板和探针板之间，插入间隔板以调节距离探针板的另一个表面到探针尖端的距离。

5. 发明授权

US07843204B2 Electrical connecting apparatus 有权
标题翻译：电气连接装置
公开(公告)号：US07843204B2
公开(公告)日：2010-11-30
申请号：US12332242
申请日：2008-12-10
申请人： Hidehiro Kiyofuji , Kiyotoshi Miura , Akihisa Akahira , Yoshinori Kikuchi
发明人： Hidehiro Kiyofuji , Kiyotoshi Miura , Akihisa Akahira , Yoshinori Kikuchi
IPC分类号： G01R31/02
CPC分类号： G01R1/07307
摘要： The object of the present invention is to prevent an operator from touching electronic elements arranged on an upper surface of a probe assembly of an electrical connecting apparatus at the time of carrying the electrical connecting apparatus and to restrict bowing of the probe assembly caused by the temperature difference between the upper surface and the lower surface of the probe assembly. An electrical connecting apparatus 10 comprises a probe assembly having a plurality of contactors 14 on a lower surface and a plurality of electronic elements 18 arranged on an upper surface, a cover 32 arranged on the upper surface of the probe assembly so as to close a space 30 in which the electronic elements are arranged, and two grippers 42 attached to the cover. Each gripper 42 has one end 42a and the other end 42a, has a region ranging from one end to the other end formed approximately in a U-shape, and is attached to a main body portion 33 of the cover at both the ends.
摘要翻译：本发明的目的是防止操作员在携带电连接装置时接触布置在电连接装置的探头组件的上表面上的电子元件，并且限制由温度引起的探头组件的弯曲探针组件的上表面和下表面之间的差异。电连接装置10包括探针组件，其具有在下表面上的多个接触器14和布置在上表面上的多个电子元件18，布置在探针组件的上表面上的盖32，以封闭空间 30，其中电子元件被布置，以及附接到盖的两个夹持器42。每个夹持器42具有一端42a，另一端42a具有从大致U形形状的一端到另一端的区域，并且在两端部附接到盖的主体部33。

6. 发明授权

US07525329B2 Electrical connecting apparatus 有权
标题翻译：电气连接装置
公开(公告)号：US07525329B2
公开(公告)日：2009-04-28
申请号：US11929005
申请日：2007-10-30
申请人： Yuji Miyagi , Kiyotoshi Miura , Hidehiro Kiyofuji , Akihisa Akahira , Tatsuo Inoue
发明人： Yuji Miyagi , Kiyotoshi Miura , Hidehiro Kiyofuji , Akihisa Akahira , Tatsuo Inoue
IPC分类号： G01R31/02
CPC分类号： G01R31/2889 , G01R1/07378
摘要： A wiring path of a circuit board has a first vertical path portion penetrating the circuit board at its outer edge in its thickness direction and connected to a connector on one surface, a second vertical path portion penetrating the circuit board in its thickness direction and connected to the electric coupler on the other surface, and a lateral path portion connecting both vertical portions, and the second vertical path portion is formed within an arrangement area (S1) of a reinforcing plate. One connecting end portion (electric coupler side) of the wiring path of the circuit board is disposed within the arrangement area (S1) of the reinforcing plate. On the other hand, the other connecting end portion (probe side) of the wiring path of the circuit board is disposed to be dispersed in an arrangement area (S2) wider than the arrangement area (S1) of the reinforcing plate.
摘要翻译：电路板的布线路径具有第一垂直路径部分，该第一垂直路径部分沿着其厚度方向在其外边缘处穿过电路板，并且连接到一个表面上的连接器，第二垂直路径部分沿厚度方向穿透电路板，并连接到在另一个表面上的电耦合器和连接两个垂直部分的横向路径部分和第二垂直路径部分形成在加强板的布置区域（S1）内。电路板的布线路径的一个连接端部（电耦合器侧）设置在加强板的布置区域（S1）内。另一方面，电路板的布线路径的另一个连接端部（探针侧）被配置为分散在比加强板的布置区域（S1）宽的布置区域（S2）中。

7. 发明授权

US08680880B2 Method and apparatus for testing integrated circuit 有权
标题翻译：集成电路测试方法和装置
公开(公告)号：US08680880B2
公开(公告)日：2014-03-25
申请号：US12637656
申请日：2009-12-14
申请人： Hidehiro Kiyofuji , Tetsuya Iwabuchi , Toshiyuki Kudo , Seiji Kanazawa
发明人： Hidehiro Kiyofuji , Tetsuya Iwabuchi , Toshiyuki Kudo , Seiji Kanazawa
IPC分类号： G01R31/20
CPC分类号： G01R31/2875
摘要： An embodiment of a method for testing an integrated circuit comprises a first step for determining at least one of a group selected from whether or not the chuck top receiving the integrated circuit exists near a probe card which transmits and receives electrical signals to and from the integrated circuit, whether or not the integrated circuit is under testing, and whether or not the probe card has a given temperature, and a second step for adjusting power for heating to be supplied to a heating element provided in the probe card according to the determination result in the first step.
摘要翻译：用于测试集成电路的方法的一个实施例包括第一步骤，用于确定选自接收集成电路的卡盘顶部是否存在于探针卡附近的组中的至少一个，所述探针卡向集成电路发送和接收电信号电路，集成电路是否在测试中，以及探针卡是否具有给定的温度，以及第二步骤，用于根据确定结果调节供应到设置在探针卡中的加热元件的加热功率在第一步。

8. 发明授权

US07586316B2 Probe board mounting apparatus 有权
标题翻译：探针板安装装置
公开(公告)号：US07586316B2
公开(公告)日：2009-09-08
申请号：US12039027
申请日：2008-02-28
申请人： Shinji Kuniyoshi , Hidehiro Kiyofuji , Yuji Miyagi , Kiyotoshi Miura
发明人： Shinji Kuniyoshi , Hidehiro Kiyofuji , Yuji Miyagi , Kiyotoshi Miura
IPC分类号： G01R31/02
CPC分类号： G01R1/07307
摘要： A mounting apparatus that does not compromise the strength of a probe board. The apparatus comprises a probe board spaced from a support member by a spacer. A fixed portion with a female screw hole is mounted on one surface of the probe board. A male screw member is threaded into the screw hole for the purpose of tightening the support member to the probe board at a fixed distance defined by the length of the spacer. The probe board has a support plate. Pluralities of conductive paths penetrate the support plate. A wiring plate wherein wiring paths are connected to corresponding conductive paths, and whose one surface is fixed to the support plate. The other surface is provided with probes corresponding to the wiring paths. The fixed portion includes a female screw member at an area where no conductive paths are formed.
摘要翻译：不影响探针板强度的安装装置。该装置包括通过间隔件与支撑构件间隔开的探针板。具有内螺纹孔的固定部分安装在探针板的一个表面上。外螺纹部件被拧入螺丝孔中，用于将支撑构件以间隔件的长度限定的固定距离紧固到探针板。探针板有一个支撑板。多个导电路径穿透支撑板。布线板，其中布线路径连接到相应的导电路径，并且其一个表面固定到支撑板。另一个表面设置有与布线路径相对应的探针。固定部分包括在不形成导电路径的区域处的阴螺纹构件。

9. 发明申请

US20090058440A1 PROBE ASSEMBLY, METHOD OF PRODUCING IT AND ELECTRICAL CONNECTING APPARATUS 有权
标题翻译：探头组件，生产电气连接装置的方法
公开(公告)号：US20090058440A1
公开(公告)日：2009-03-05
申请号：US11912872
申请日：2005-05-23
申请人： Kiyotoshi Miura , Hidehiro Kiyofuji , Yuji Miyagi , Shinji Kuniyoshi , Hitoshi Sato
发明人： Kiyotoshi Miura , Hidehiro Kiyofuji , Yuji Miyagi , Shinji Kuniyoshi , Hitoshi Sato
IPC分类号： G01R1/073 , G01R3/00
CPC分类号： G01R31/2889 , G01R1/07314 , Y10T29/49204
摘要： A probe assembly for use in electrical measurement of a device under test. The probe assembly comprises a plate-like probe base plate with bending deformation produced in a free state without load, and a plurality of probes formed on one face of the probe base plate to project from the face. All the tips of the probes are positioned on the same plane parallel to an imaginary reference plane of the probe base plate.
摘要翻译：用于被测设备的电测量的探针组件。探针组件包括在空载状态下产生的具有弯曲变形的板状探针基板，以及形成在探针基板的一个面上的多个探针，以从面部突出。探针的所有尖端位于平行于探针基板的虚拟参考平面的同一平面上。

10. 发明申请

US20070069748A1 Probe assembly 审中-公开
标题翻译：探头装配
公开(公告)号：US20070069748A1
公开(公告)日：2007-03-29
申请号：US11585416
申请日：2006-10-23
申请人： Hidehiro Kiyofuji , Yutaka Minato , Akihisa Akahira
发明人： Hidehiro Kiyofuji , Yutaka Minato , Akihisa Akahira
IPC分类号： G01R31/02
CPC分类号： G01R31/2887
摘要： A probe assembly comprises a probe base plate with a plurality of probes to be used for electrical inspection of a plurality of semiconductor chip regions continuously formed in alignment in the directions orthogonal to each other on a substantially circular semiconductor wafer, and capable of contacting the electrical connecting portions of each semiconductor chip region. The tips of a plurality of probe groups are arranged in the X and Y directions orthogonal to each other on the surface of the probe base plate in correspondence to predetermined chip region groups including the predetermined number of semiconductor chip regions. The arrangement regions of the probe groups are formed discontinuously in both of the X and Y directions. The relative feeding movement of the semiconductor wafer in either of the X and Y directions enables the electrical inspection of all the chip region groups on the semiconductor wafer.
摘要翻译：探针组件包括具有多个探针的探针基板，用于对在大致圆形的半导体晶片上彼此正交的方向上连续形成的多个半导体芯片区域进行电气检查，并且能够接触电气连接各半导体芯片区域的部分。多个探针组的尖端相对应于包括预定数量的半导体芯片区域的预定芯片区域组，在探针基板的表面上彼此正交的X和Y方向上排列。探针组的排列区域在X方向和Y方向都不连续地形成。半导体晶片在X和Y方向中的相对馈送运动使得能够对半导体晶片上的所有芯片区域组进行电检查。

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