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1. 发明授权

US4432643A Apparatus for atomizing a sample including a slidable pressure maintaining arrangement 失效
标题翻译：用于雾化样品的装置，包括可滑动的压力保持装置
公开(公告)号：US4432643A
公开(公告)日：1984-02-21
申请号：US245162
申请日：1981-03-18
申请人： Hideaki Koizumi , Yosio Taiti , Kazuo Moriya , Katsuhito Harada , Kazuo Sato
发明人： Hideaki Koizumi , Yosio Taiti , Kazuo Moriya , Katsuhito Harada , Kazuo Sato
IPC分类号： G01N21/31 , G01N21/74
CPC分类号： G01N21/74
摘要： An apparatus for atomizing a sample comprises a cuvette of heating material into which a sample is introduced, a pair of electrodes of supplying an electric current to the cuvette, thereby heating and atomizing the sample, supports of supporting the pair of the electrodes, a means for supplying light to the atomized sample and a means of slidably maintaining at least one of the pair of the electrodes against the cuvette in a predetermined range of contact pressures, where the heating temperature of the cuvette can be maintained constant with improved reproducibility of analytical values.
摘要翻译：用于对样品进行雾化的装置包括：向其中引入样品的加热材料的比色皿，向比色皿供应电流的一对电极，从而加热和雾化样品，支撑一对电极的支撑体，用于向雾化样品提供光，以及在预定接触压力范围内可滑动地将一对电极中的至少一个电极抵靠反应杯的装置，其中比色杯的加热温度可以通过分析值的再现性得到改善而保持恒定。

2. 发明授权

US4202628A Flameless atomizer 失效
标题翻译：无焰雾化器
公开(公告)号：US4202628A
公开(公告)日：1980-05-13
申请号：US781938
申请日：1977-03-28
申请人： Hideaki Koizumi , Kazuo Moriya
发明人： Hideaki Koizumi , Kazuo Moriya
IPC分类号： G01N21/31 , G01N21/74 , G01J3/30
CPC分类号： G01N21/74 , G01N2021/151
摘要： A cuvette used in a flameless atomizer is hollow and includes an opening at both ends and a hole in a radial direction substantially at its central portion. The cuvette is made of a conductive material and Joule-heated by currents flowing therethrough. The interior of the cuvette is divided substantially into three sections: a sample mount section at which a sample introduced through the hole of the cuvette is disposed; a light beam path section through which light incident from the opening at one end of the cuvette passes and goes out of the opening at the other end; and an absorption cell section at which the light beam path section intersects with atomic vapors generated from the sample disposed at the sample mount section. The electric resistance of the cuvette is made smaller at the sample mount section than at a portion near the absorption cell section. This allows the higher temperature of the portions near the absorption cell section than that of the sample mount section. Therefore, almost all of the atomic vapors in the cuvette exist at the absorption cell portion, and the application of a magnetic field to the absorption cell section allows a great improvement in analysis precision and sensitivity of the flameless atomizer for atomic absorption analysis using a Zeeman effect.
摘要翻译：在无焰雾化器中使用的比色杯是中空的，并且包括在两端的开口和在径向方向上的大致在其中心部分的孔。试管由导电材料制成，并由流过其中的电流进行焦耳加热。试管的内部基本上分为三个部分：样品安装部分，其中设置通过反应杯的孔引入的样品; 光束路径部分，通过所述光束路径部分从所述反应杯的一端处的所述开口入射的光在所述另一端通过并离开所述开口; 以及吸收单元部分，光束路径部分与从设置在样品安装部分处的样品产生的原子蒸汽相交。在样品安装部分，反应杯的电阻比吸收单元部分附近的电阻小。这允许吸收单元部分附近的部分的温度高于样品安装部分的温度。因此，比色皿中的几乎所有的原子蒸汽都存在于吸收单元部分，并且向吸收单元部分施加磁场允许使用塞曼对无焰雾化器进行原子吸收分析的分析精度和灵敏度大大提高影响。

3. 发明申请

US20080111992A1 Defective Particle Measuring Apparatus and Defective Particle Measuring Method 有权
标题翻译：有缺陷的粒子测量装置和有害粒子测量方法
公开(公告)号：US20080111992A1
公开(公告)日：2008-05-15
申请号：US11883510
申请日：2006-02-03
申请人： Kazuo Moriya
发明人： Kazuo Moriya
IPC分类号： G01N15/02
CPC分类号： G01B11/0608 , G01N15/1463 , G01N21/8806 , G01N2015/1452 , H01L22/10
摘要： A defective particle measuring apparatus that irradiates focused laser light on a sample, images scattered light from the sample, and measures defective particles in the sample based on the image result, includes a position deviation computing portion which, based on an in-plane intensity distribution of scattered light of each defective particle that is imaged, obtains a deviation from a focal point position on an image point side of the scattered light of each defective particle and calculates a position deviation amount in a depth direction of the defective particle corresponding to the deviation from the focal point position, a light intensity correcting portion for correcting the light intensity of the scattered light of the defective particle corresponding to the position deviation amount in the depth direction, and a size determining portion for determining the defective particle size based on the light intensity corrected by the light intensity correcting portion. Thus, the size of the defective particles can be determined at a high precision by a simple constitution in a short time, and density distribution of the defective particles can be obtained.
摘要翻译：一种有缺陷的粒子测量装置，其将聚焦的激光照射在样本上，对来自样品的散射光进行成像，并且基于图像结果测量样品中的有缺陷的颗粒，包括：位置偏差计算部，其基于面内强度分布对每个有缺陷粒子的散射光的散射光进行成像，得到与各缺陷粒子的散射光的像点侧的焦点位置的偏差，并计算与该偏差对应的有缺陷粒子的深度方向的位置偏差量从焦点位置，用于校正与深度方向上的位置偏差量相对应的有缺陷粒子的散射光的光强度的光强度校正部分和用于基于光线确定缺陷粒径的尺寸确定部分强度由光强度校正部分校正。因此，可以通过简单的结构在短时间内以高精度确定有缺陷的颗粒的尺寸，并且可以获得缺陷颗粒的密度分布。

4. 发明授权

US06236056B1 Defect evaluation apparatus for evaluating defects and shape information thereof in an object or on the surface of an object 有权
标题翻译：缺陷评估装置，用于评估物体中或物体表面上的缺陷和形状信息
公开(公告)号：US06236056B1
公开(公告)日：2001-05-22
申请号：US09161943
申请日：1998-09-28
申请人： Kazuo Moriya
发明人： Kazuo Moriya
IPC分类号： G01N2186
CPC分类号： G01N21/94
摘要： A defect evaluation apparatus of this invention includes a laser irradiation unit for obliquely irradiating a laser beam onto an object, and an observation unit for observing scattered light from inside the object or a surface of the object. The laser irradiation unit irradiates the laser beam onto the object from a plurality of incident directions around an observation optical axis, and the observation unit receives the scattered light from the object to obtain shape information of a defect in the object or on the surface of the object.
摘要翻译：本发明的缺陷评估装置包括：用于将激光束倾斜照射到物体上的激光照射单元和用于观察物体或物体表面内的散射光的观察单元。激光照射单元从围绕观察光轴的多个入射方向将激光照射到物体上，并且观察单元接收来自物体的散射光，以获得物体中或在该物体的表面上的缺陷的形状信息目的。

5. 发明授权

US5978082A Atomic absorptiometer and a metal specimen atomic vapor generation apparatus used in the atomic absorotiometer 失效
标题翻译：原子吸收光谱仪和原子吸收测定仪中使用的金属试样原子蒸汽发生装置
公开(公告)号：US5978082A
公开(公告)日：1999-11-02
申请号：US14069
申请日：1998-01-27
申请人： Yasushi Terui , Kazuo Moriya , Hiromi Yamashita , Hayato Tobe
发明人： Yasushi Terui , Kazuo Moriya , Hiromi Yamashita , Hayato Tobe
IPC分类号： G01N21/31 , G01J3/42 , G01N21/74
CPC分类号： G01J3/42
摘要： The object of this invention is to provide an atomic absorptiometer and a metal specimen atomic vapor generation apparatus used in the atomic absorptiometer, which enable a light absorption measurement based on the Zeeman effect highly capable of background correction and eliminate the need for the troublesome work of dismounting a magnet. For this purpose, the following configuration is employed. First, the specimen, hydrochloric acid, and sodium borohydride are delivered and mixed by the peristaltic pump 10 to produce a metallic hydride. The generated gas-liquid mixture solution is separated by the separator 12 into a specimen gas and liquids. The separated specimen gas is introduced into the heating section 30. Electricity is supplied from the power source 28 to the specimen heating section 30 where the specimen gas introduced is heated and separated into hydrogen and a specimen metal vapor to be measured. The specimen metal vapor is then introduced into the measuring section 34 arranged between magnetic poles of the magnet 32 where the metal vapor is subjected to the atomic absorptiometric analysis based on the Zeeman effect.
摘要翻译：本发明的目的是提供一种在原子吸收光谱仪中使用的原子吸收光谱仪和金属试样原子蒸汽发生装置，其能够基于能够进行背景校正的塞曼效应的光吸收测量，并且不需要麻烦的工作拆下磁铁为此，采用以下配置。首先，将试样，盐酸和硼氢化钠通过蠕动泵10输送并混合，制成金属氢化物。所产生的气液混合溶液被分离器12分离成样品气体和液体。将分离的试样气体引入加热部30.从电源28向被加热的试样气体加热并分离为氢的试样加热部30供给被测定的试样金属蒸气。然后将样品金属蒸气引入到测量部分34中，该测量部分34布置在磁体32的磁极之间，金属蒸气基于塞曼效应进行原子吸收分析。

6. 发明授权

US5424536A Substrate internal defect and external particle detecting apparatus using s-polarized and p-polarized light 失效
标题翻译：基板内部缺陷和使用s偏振和p偏振光的外部粒子检测装置
公开(公告)号：US5424536A
公开(公告)日：1995-06-13
申请号：US216190
申请日：1994-03-22
申请人： Kazuo Moriya
发明人： Kazuo Moriya
IPC分类号： G01N21/88 , G01N21/956 , H01L21/66 , G02F1/01
CPC分类号： G01N21/9505
摘要： A defect estimating apparatus includes a laser radiating unit For obliquely radiating laser light on a surface to be observed of an object to be inspected, an observing unit for observing, through the surface to be observed, scattered light produced From internal defects or particles of the object by refracted light of the laser light, and observing scattered light or reflected light produced from flaws or particles on the surface by tile laser light, and a component separating unit for allowing the observing unit to perform observation by using both light containing primarily a p-polarized light component of the laser light and light containing primarily an s-polarized light component of the laser light.
摘要翻译：缺陷估计装置包括：激光照射单元，用于在要被检测物体观察的表面上倾斜地照射激光;观察单元，用于通过观察表面观察从内部缺陷或并且通过瓦片激光观察由表面上的缺陷或颗粒产生的散射光或反射光;以及分量分离单元，用于允许观察单元通过使用主要包含p的两个光来进行观察激光的偏振光分量和主要包含激光的s偏振光分量的光。

7. 发明授权

US3952458A Grinding machine with feed rate changing apparatus 失效
标题翻译：磨床采用进给速度更换装置
公开(公告)号：US3952458A
公开(公告)日：1976-04-27
申请号：US488998
申请日：1974-07-16
申请人： Tamaki Tomita , Mineo Ishikawa , Hayashi Kodama , Kazuo Moriya
发明人： Tamaki Tomita , Mineo Ishikawa , Hayashi Kodama , Kazuo Moriya
IPC分类号： B23Q15/14 , B23Q15/22 , B24B5/04 , B24B47/20 , B24B49/00 , B24B49/08
CPC分类号： B24B47/20 , B23Q15/225
摘要： A grinding machine provided with an apparatus for changing a feed rate of a grinding wheel relative to a workpiece just before the grinding wheel comes into contact with the workpiece. An electrode device is mounted adjacent to the grinding wheel and connected to an electric power source for applying a potential to the surface of the grinding wheel. A detecting device detects a difference of potential between the grinding wheel and the workpiece to generate an output voltage. A memory device memorizes the output voltage detected when the grinding wheel is distant from the workpiece. A setting device reduces the memorized output voltage at a predetermined rate to provide a reference voltage corresponding to a predetermined gap between the grinding wheel and the workpiece. A comparator circuit compares the output voltage with the reference voltage to generate a feed rate changing signal when the output voltage attains the reference voltage. A control device controls a feed device so as to change the feed rate of a wheel slide in accordance with the feed rate changing signal.
摘要翻译：一种研磨机，其具有用于在砂轮与工件接触之前更改砂轮相对于工件的进给速度的装置。电极装置安装在砂轮附近，并连接到用于向砂轮表面施加电位的电源。检测装置检测砂轮和工件之间的电位差以产生输出电压。存储器件存储当砂轮远离工件时检测到的输出电压。设置装置以预定的速率减小存储的输出电压，以提供对应于砂轮和工件之间的预定间隙的参考电压。当输出电压达到参考电压时，比较器电路将输出电压与参考电压进行比较，以产生进给速率改变信号。控制装置控制进给装置，以便根据进给速率改变信号改变车轮滑块的进给速率。

8. 发明授权

US5801827A Analysis device using chemical combustion flame 失效
标题翻译：使用化学燃烧火焰的分析装置
公开(公告)号：US5801827A
公开(公告)日：1998-09-01
申请号：US851291
申请日：1997-05-05
申请人： Kazuo Moriya , Yasushi Terui , Hayato Tobe , Yoshisada Ebata , Hisashi Kimoto
发明人： Kazuo Moriya , Yasushi Terui , Hayato Tobe , Yoshisada Ebata , Hisashi Kimoto
IPC分类号： G01N21/31 , G01N21/72
CPC分类号： G01N21/72
摘要： In an analysis device, an auxiliary gas supplied from a compressor 1 is introduced from an auxiliary gas inlet 3 via a pipe 2 to a burner through a pressure regulator 5, a pressur meter 6, a pressure switch 7 and a connecting joint 8. On the other hand, a combustible gas supplied from a gas bomb 9 is introduced from a combustible gas inlet 11 via a pipe 10 to the burner through a first electromagnetic valve 12, a pressure regulator 13, a pressure meter 14, a needle valve 15, a second electromagnetic valve 16 and a connecting joint 17 and further via a tube. An auxiliary gas use block 4, on which auxiliary gas flow controlling elements such as the pressure regulator 5, the pressure meter 6 and the pressure switch 7 are secured, is provided independent and separated from a combustible gas use block 18, on which combustible gas flow controlling elements such as the first electromagnetic valve 12, the pressure regulator 13, the pressure meter 14, the needle valve 15 and the second electromagnetic valve 16 are secured. Whereby the analysis device using chemical combustion flame having an element safety is provided in which possible danger caused by such as the gas leakage and the gas mixing between the combustible gas passage and the auxiliary gas passage is further reduced.
摘要翻译：在分析装置中，从压缩机1供给的辅助气体通过压力调节器5，压力计6，压力开关7以及连接接头8，从辅助气体入口3经管道2引入燃烧器。另一方面，从燃气弹9供应的可燃气体经由管道10从可燃气体入口11通过第一电磁阀12，压力调节器13，压力计14，针阀15，第二电磁阀16和连接接头17，并且还经由管。辅助气体使用块4，其上固定有诸如压力调节器5，压力表6和压力开关7等辅助气体流量控制元件，与可燃气体使用块18独立地分离并且与可燃气体使用块18分离，确保了诸如第一电磁阀12，压力调节器13，压力计14，针阀15和第二电磁阀16之类的流量控制元件。由此，提供了使用具有元件安全性的化学燃烧火焰的分析装置，其中进一步降低了由可燃气体通道和辅助气体通道之间的气体泄漏和气体混合引起的可能的危险。

9. 发明授权

US5786887A Atomic absorption spectrophotometer and atomic absorption spectrochemical analysis 失效
标题翻译：原子吸收分光光度计和原子吸收光谱分析
公开(公告)号：US5786887A
公开(公告)日：1998-07-28
申请号：US708484
申请日：1996-09-05
申请人： Yoshisada Ebata , Kazuo Moriya , Hisashi Kimoto , Hayato Tobe , Yasushi Terui
发明人： Yoshisada Ebata , Kazuo Moriya , Hisashi Kimoto , Hayato Tobe , Yasushi Terui
IPC分类号： G01N21/31 , G01N21/71 , B01N21/00
CPC分类号： G01N21/71 , G01N21/3103
摘要： A light beam emitted by a hollow cathode lamp is concentrated on a central portion of an electrothermal sample atomizing apparatus by a concave mirror. The light concentrated on the central portion of the electrothermal sample atomizing apparatus is further concentrated on a central portion of a flame produced in a burner type sample atomizing apparatus by a lens. The light traveled through the burner type sample atomizing apparatus is condensed by a concave mirror, reflected by a flat mirror, and concentrated on an entrance slit of a spectroscope. Light outgoing through an exit slit of the spectroscope is detected by a photodetector.
摘要翻译：由中空阴极灯发射的光束通过凹面镜集中在电热样品雾化装置的中心部分上。集中在电热式雾化装置的中心部分的光进一步集中在通过透镜在燃烧器型样品雾化装置中产生的火焰的中心部分上。通过燃烧器型样品雾化装置行进的光由凹面镜冷凝，由平面镜反射，并集中在分光镜的入口狭缝上。通过光电检测器检测出通过光谱仪的出口狭缝的光。

10. 发明授权

US5471298A Method and apparatus for measuring size of particle or defect 失效
标题翻译：用于测量颗粒尺寸或缺陷的方法和装置
公开(公告)号：US5471298A
公开(公告)日：1995-11-28
申请号：US36986
申请日：1993-03-25
申请人： Kazuo Moriya
发明人： Kazuo Moriya
IPC分类号： G01N15/02 , G01N15/14 , G01N21/47 , G01N21/84 , G01N21/88 , G01N21/94 , G01N21/95 , G01N21/956 , H01L21/66 , G01N21/53
CPC分类号： G01N15/0205 , G01N2015/0238 , G01N2021/1772 , G01N2021/4726 , G01N2021/4792 , G01N2021/8477 , G01N21/95
摘要： A size of particle or defect in an object is measured. A laser beam is guided through an optical system into the object. A light receiving element receives scattered light from a particle or a defect in the object. A scattering image is formed by an image processor from the scattered light thus received. The size of particle or defect is obtained by integrating a scattering intensity of the scattered light. Also, a size distribution of particle or defect in an object may be acquired by detecting a maximum scattering intensity of each particle or defect. A polarization dependency of scattering may be checked as well.
摘要翻译：测量物体中的颗粒或缺陷的尺寸。将激光束通过光学系统引导到物体中。光接收元件从物体中的颗粒或缺陷接收散射光。散射图像由图像处理器从这样接收的散射光形成。颗粒或缺陷的大小通过对散射光的散射强度进行积分而获得。此外，可以通过检测每个颗粒或缺陷的最大散射强度来获得物体中的颗粒或缺陷的尺寸分布。也可以检查散射的极化依赖性。

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