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    • 5. 发明授权
    • Method of generating a photolithography patterning device, computer program, patterning device, method of determining the position of a target image on or proximate a substrate, measurement device, and lithographic apparatus
    • 产生光刻图案形成装置的方法,计算机程序,图案形成装置,确定基板上或附近的目标图像的位置的方法,测量装置和光刻装置
    • US07960074B2
    • 2011-06-14
    • US11345629
    • 2006-02-02
    • Uwe MickanHendricus Johannes Maria Meijer
    • Uwe MickanHendricus Johannes Maria Meijer
    • G03F1/00G06F17/50
    • G03F7/70433B82Y10/00B82Y40/00G03F1/24G03F7/70283G03F7/70666G03F9/7003G03F9/7076G03F9/7088
    • A method of generating a photolithography patterning device for transferring a pattern formed in the patterning device onto a substrate utilizing a lithographic projection apparatus includes defining features within the pattern formed in the device, wherein the features have dimensions and orientations chosen to create a desired image on the substrate during pattern transfer; and adjusting the dimensions of the features to compensate the desired image for displacement and dimension errors introduced by the effective shadow angle of the radiation on the features during pattern transfer or correlated to the position of the features within the exposure slit during pattern transfer. A measurement device for determining the position of a target image on or proximate a substrate in a lithographic projection apparatus, wherein the target image is formed by features on a patterning device, includes a detector configured to measure the position of the target image on or proximate the substrate, wherein the detector compensates the measured position of the target image for displacement and dimension errors introduced by the effective shadow angle of the radiation on the features of the patterning device during pattern transfer or correlated to the position of the features within the exposure slit during pattern transfer. A lithographic apparatus includes a measurement device.
    • 使用光刻投影装置产生用于将形成在图案形成装置中的图案转印到基板上的光刻图案形成装置的方法包括限定在所述装置中形成的图案内的特征,其中所述特征具有选择的尺寸和取向以在 图案转印时的基板; 并且调整特征的尺寸以补偿在图案转印期间由辐射对特征的有效阴影角度引入的位移和尺寸误差所需的图像,或者与图案转印期间的曝光缝隙内的特征位置相关。 一种测量装置,用于在光刻投影设备中确定目标图像在基板上或其附近的位置,其中所述目标图像由图案形成装置上的特征形成,所述测量装置包括检测器,所述检测器被配置为测量所述目标图像在或近似的位置 所述基板,其中所述检测器补偿所述目标图像的测量位置,并且通过所述辐射的有效阴影角度在所述图案转印期间对所述图案形成装置的特征引入的尺寸误差或与所述曝光缝隙内的所述特征的位置相关联 在图案转移期间。 光刻设备包括测量装置。