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    • 6. 发明授权
    • Method for production of semiconductor devices
    • 制造半导体器件的方法
    • US07670941B2
    • 2010-03-02
    • US11465502
    • 2006-08-18
    • Koji KawanamiKiyotaka Tabuchi
    • Koji KawanamiKiyotaka Tabuchi
    • H01L21/00
    • H01L21/76877H01L21/02074H01L21/76825H01L21/76826H01L21/76828
    • A method for production of semiconductor devices which includes the steps of forming, on an interlayer insulating film formed on a substrate, a copper-containing conductive layer in such a way that its surface is exposed, performing heat treatment with a reducing gas composed mainly of hydrogen on the surface of the conductive layer, performing plasma treatment with a reducing gas on the surface of the conductive layer, thereby permitting the surface of the conductive layer to be reduced and the hydrogen adsorbed by the heat treatment to be released, and forming an oxidation resistance film that covers the surface of the conductive layer such that the surface of the conductive layer is not exposed to an oxygen-containing atmospheric gas after the plasma treatment.
    • 一种制造半导体器件的方法,包括以下步骤:在基板上形成的层间绝缘膜上形成含铜导电层,使其表面露出,用主要由 在导电层的表面上形成氢气,在导电层的表面进行还原性气体的等离子体处理,由此可以使导电层的表面降低,通过热处理吸附的氢被释放,形成 覆盖导电层的表面的氧化电阻膜,使得导电层的表面在等离子体处理后不暴露于含氧气氛气体。
    • 9. 发明申请
    • Fabrication method of semiconductor device
    • 半导体器件的制造方法
    • US20060024979A1
    • 2006-02-02
    • US11169604
    • 2005-06-29
    • Kiyotaka Tabuchi
    • Kiyotaka Tabuchi
    • H01L21/31
    • H01L21/02126C23C16/401C23C16/515H01L21/02216H01L21/02274H01L21/0228H01L21/02362H01L21/31612H01L21/31633
    • A fabrication method of a semiconductor device is disclosed by which damage to another film or exfoliation of a film is prevented and an insulating film having a dielectric constant of 2.5 or less can be formed while a film strength is maintained without deteriorating a wiring line characteristic. According to an embodiment, an insulating film is formed on a substrate by a plasma process, which uses film-forming gas having a ring structure of Si—O bonds, such that it maintains the ring structure of the Si—O bonds. According to another embodiment, an insulating film is formed on a substrate by a plasma process, which uses film-forming gas which contains silane-containing gas and oxygen gas or film-forming gas which contains Si—O bond-containing gas, such that it has a ring structure of the Si—O bonds.
    • 公开了半导体器件的制造方法,其中可以防止对另一个膜的损伤或膜的剥离,并且可以在保持膜强度而不劣化布线特性的同时形成介电常数为2.5以下的绝缘膜。 根据一个实施方案,通过等离子体工艺在衬底上形成绝缘膜,其使用具有Si-O键环结构的成膜气体,以保持Si-O键的环结构。 根据另一个实施例,通过等离子体工艺在基板上形成绝缘膜,该等离子体处理使用含有含硅烷的气体和氧气的成膜气体或含有含Si-O键的气体的成膜气体,使得 它具有Si-O键的环结构。