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    • 4. 发明授权
    • Silicon-containing polymer and bilayer resist composition based thereon
    • 含硅聚合物和双层抗蚀剂组合物
    • US06596830B2
    • 2003-07-22
    • US10144110
    • 2002-05-10
    • Haiwon LeeSung Soo Kim
    • Haiwon LeeSung Soo Kim
    • C08F3402
    • C08F230/08G03F7/0045G03F7/0758
    • Polymeric compounds for use in a chemically amplified resist are represented by the following chemical formulas 1 and 2: wherein R1 and R2, which may be identical or different, are each selected from the group consisting of —H and —CH3; R3 and R4, which may be identical or different, are each selected from the group consisting of —H, —CH3 and —CH2CH3; and 0.1≦m≦0.9 and 0.1≦n≦0.9, with the equation of m+n=1. wherein R3, R4, and R5, which may be identical or different, are each selected from the group consisting of —H and —CH3; R6 and R7, which may be identical or different, are each selected from the group consisting of —H, —CH3 and —CH2CH3; R8 is —CH3 or —CH2CH2OH; and 0.1≦p≦0.9, 0.05≦q≦0.8, and 0.05≦r≦0.5, with the equation of p+q+r=1.
    • 用于化学放大抗蚀剂的聚合化合物由以下化学式1和2表示:其中可以相同或不同的R 1和R 2各自选自-H和-CH 3; R 3和R 4可以相同或不同,各自选自-H,-CH 3和-CH 2 CH 3; 并且0.1 <= m <= 0.9且0.1 <= n <= 0.9,其中m + n = 1的方程式,其中可以相同或不同的R 3,R 4和R 5各自选自 -H和-CH 3; R 6和R 7可以相同或不同,各自选自-H,-CH 3和-CH 2 CH 3; R8是-CH3或-CH2CH2OH; 和0.1 <= p <= 0.9,0.05 <= q <= 0.8和0.05 <= r <= 0.5,其中p + q + r = 1。
    • 6. 发明授权
    • Automatic landing method and apparatus for scanning probe microscope using the same
    • 扫描探针显微镜的自动着陆方法及装置
    • US07891016B2
    • 2011-02-15
    • US12225404
    • 2008-05-29
    • Haiwon LeeChung Choo ChungCheolsu Han
    • Haiwon LeeChung Choo ChungCheolsu Han
    • G01Q10/06G01Q20/04G01B11/08G01B9/02
    • G01Q10/065G01Q10/06G01Q20/02
    • Disclosed herein are an automatic landing method for a scanning probe microscope and an automatic landing apparatus using the same. The method comprises irradiating light to a cantilever using a light source; collecting interference fringes generated by the light being diffracted from the edge of the cantilever and then being incident to a surface of the sample; driving the tip in the sample direction until the pattern of the interference fringes reaches a predetermined pattern region (first driving); and driving the tip in the sample direction after the interference fringe pattern reached the predetermined pattern region (second driving). The method in accordance with the present invention is very effective particularly for samples having a large surface area, because it enables automatic landing of a tip according to recognition and selection of an optimal time point for individual landing steps, irrespective of adverse changes in landing conditions, such as surface irregularities of samples. Further, the present invention enables a very inexpensive and effective application of a scanning probe microscope (SPM), because it is possible to achieve rapid and reliable driving of a tip to within an approximate distance of a sample.
    • 这里公开了扫描探针显微镜和使用该自动着陆装置的自动着陆装置的自动着陆方法。 该方法包括使用光源将光照射到悬臂; 收集由悬臂的边缘衍射的光然后入射到样品的表面产生的干涉条纹; 在样品方向上驱动尖端,直到干涉条纹的图案到达预定图案区域(第一驱动); 并且在干涉条纹图案到达预定图案区域(第二驱动)之后沿样品方向驱动尖端。 根据本发明的方法对于具有大的表面积的样品是非常有效的,因为它可以根据识别和选择各个着陆步骤的最佳时间点而自动着地,而不管着陆条件的不利变化如何 ,如样品的表面不规则。 此外,本发明能够实现扫描探针显微镜(SPM)的非常便宜和有效的应用,因为可以实现将尖端快速可靠地驱动到样品的近似距离内。
    • 9. 发明申请
    • Automatic Landing Method and Apparatus for Scanning Probe Microscope Using the Same
    • 扫描探针显微镜的自动着陆方法和装置
    • US20090293160A1
    • 2009-11-26
    • US12225404
    • 2008-05-29
    • Haiwon LeeChung Choo ChungCheolsu Han
    • Haiwon LeeChung Choo ChungCheolsu Han
    • G01N13/10
    • G01Q10/065G01Q10/06G01Q20/02
    • Disclosed herein are an automatic landing method for a scanning probe microscope and an automatic landing apparatus using the same. The method comprises irradiating light to a cantilever using a light source; collecting interference fringes generated by the light being diffracted from the edge of the cantilever and then being incident to a surface of the sample; driving the tip in the sample direction until the pattern of the interference fringes reaches a predetermined pattern region (first driving); and driving the tip in the sample direction after the interference fringe pattern reached the predetermined pattern region (second driving). The method in accordance with the present invention is very effective particularly for samples having a large surface area, because it enables automatic landing of a tip according to recognition and selection of an optimal time point for individual landing steps, irrespective of adverse changes in landing conditions, such as surface irregularities of samples. Further, the present invention enables a very inexpensive and effective application of a scanning probe microscope (SPM), because it is possible to achieve rapid and reliable driving of a tip to within an approximate distance of a sample.
    • 这里公开了扫描探针显微镜和使用该自动着陆装置的自动着陆装置的自动着陆方法。 该方法包括使用光源将光照射到悬臂; 收集由悬臂的边缘衍射的光然后入射到样品的表面产生的干涉条纹; 在样品方向上驱动尖端,直到干涉条纹的图案到达预定图案区域(第一驱动); 并且在干涉条纹图案到达预定图案区域(第二驱动)之后沿样品方向驱动尖端。 根据本发明的方法对于具有大的表面积的样品是非常有效的,因为它可以根据识别和选择各个着陆步骤的最佳时间点而自动着地,而不管着陆条件的不利变化如何 ,如样品的表面不规则。 此外,本发明能够实现扫描探针显微镜(SPM)的非常便宜和有效的应用,因为可以实现将尖端快速可靠地驱动到样品的近似距离内。
    • 10. 发明授权
    • Apparatus and method for providing square wave to atomic force microscope
    • 用于向原子力显微镜提供方波的装置和方法
    • US06774692B2
    • 2004-08-10
    • US10124023
    • 2002-04-17
    • Young-hwan KimChung Choo ChungHaiwon Lee
    • Young-hwan KimChung Choo ChungHaiwon Lee
    • H03K3017
    • G01Q60/34H03K5/02H03K5/05Y10S977/85
    • An apparatus and method for providing an input signal having a desired pulse width and amplitude to atomic force miscoscopes (AFMs) for use in nano-lithography are provided. An input signal providing apparatus for a contact type AFM includes: a pulse width adjusting unit which adjusts the width of a positive pulse of an input square wave to a predetermined pulse width; and an amplitude adjusting unit which adjusts the amplitude of the positive pulse of the square wave to a predetermined voltage. An input signal providing method for the contact type AFM uses the apparatus having this structure. An input signal providing apparatus for a non-contact type AFM further includes a square pulse generating unit which generates a square pulse having a predetermined phase in synchronization with an input resonance signal, and an input signal providing method for the non-contact type AFM further involves generating the square pulse having a predetermined phase in synchronization with the input resonance signal. As a result, more precise nano-lithography can be achieved using an AFM to which the apparatus and method described above are applied.
    • 提供了一种用于提供具有期望的脉冲宽度和幅度的输入信号的装置和方法,用于在纳米光刻中使用的原子力测量仪(AFM)。 用于接触型AFM的输入信号提供装置包括:脉冲宽度调整单元,其将输入方波的正脉冲的宽度调整到预定的脉冲宽度; 以及幅度调整单元,其将所述方波的正脉冲的幅度调整到预定电压。 用于接触型AFM的输入信号提供方法使用具有这种结构的装置。 用于非接触型AFM的输入信号提供装置还包括平方脉冲产生单元,其产生与输入谐振信号同步的具有预定相位的方波脉冲,以及用于非接触型AFM的输入信号提供方法 包括与输入的谐振信号同步地产生具有预定相位的平方脉冲。 因此,可以使用应用上述装置和方法的AFM来实现更精确的纳米光刻。