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    • 3. 发明专利
    • MAGNETIC DISK MEMORY DEVICE
    • JP2000268302A
    • 2000-09-29
    • JP7129599
    • 1999-03-17
    • HITACHI LTDHITACHI COMMUNICATION SYSTEM
    • HIROSE TAKESHIMOCHIZUKI TAKEONAGAYA YUJI
    • G11B5/09G11B5/02
    • PROBLEM TO BE SOLVED: To allow the S/N ratio to be improved by providing a bias circuit with a resistance value sufficiently larger than that of an MR head, and performing switching-control for first and second resistance elements which provide a first potential to an interconnection point, a first constant current source MOSFET that supplies a bias current to these elements, and a second MOSFET that supplies another bias current corresponding to the bias current. SOLUTION: In an MR head corresponding to another magnetic recording surface in which a readout signal is amplified by a read amplifier Amp and read out via a post amplifier and an output circuit, MOSFETs Q5, Q6 are set in the OFF condition so that no readout operation is performed. Since MOSFETs Q2, Q4 constituting a constant current are provided with resistor R2, R5 at their sources, respectively, their transconductance Gm as an amplifying element is lowered due to their negative feedback function. Accordingly, inductive gate noise components to be superposed over constant currents that are to be output from drains of the MOSFETs Q2, Q4 are made small.
    • 9. 发明专利
    • SEMICONDUCTOR INTEGRATED CIRCUIT
    • JPH08160092A
    • 1996-06-21
    • JP29743994
    • 1994-11-30
    • HITACHI LTDHITACHI COMPUTER ENG
    • HIROSE TAKESHINAGAYA YUJIHASHIMOTO TAKASHIYOSHINAGA MAKIHATANAKA NORIAKISOGA YUJIMORIYA ATSUSHI
    • G01R31/26G01R31/02H01L21/66H01L21/822H01L27/04
    • PURPOSE: To surely detect head opening abhormality by counting the time during which the voltage between head terminals is lower than a prescribed slicing level and comparing the count value with a preset value. CONSTITUTION: When head opening abnormality occurs, a voltage waveform in which the time during which the flyback voltage between head terminals becomes lower than a slicing level becomes longer than that obatined when no head opening abnormality occurs is obtained. A sense circuit detects the voltage waveform and the input transistor Q51 of a buffer circuit 22 is turned on by, for example, making an electric current to flow to the transistor Q51 from an output terminal IUX, Consequently, the output of the circuit 22 becomes 'L' and the differential transistor Q62 of a timer circuit 23 is turned off, and then, a capacity is charged by means of a collector-side transistor Qp62 and the potential at a node N11 rises. When such a state becomes longer than a preset pariod of time, the potential at the node N11 becomes higher than the reference voltage VR3 of a level discriminated circuit 25 and the output of the circuit 24 is inverted to αHβ from αLβ. The output VOPN which latches 25 the output of the circuit 24 changes to αHβ and the head abnormality detecting signal of a logical gate circuit changes. Therefore, the head opening abnormality can be detected surely.