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1. 发明专利

JPS6231829B2 失效
公开(公告)号：JPS6231829B2
公开(公告)日：1987-07-10
申请号：JP12481681
申请日：1981-08-11
申请人： HITACHI LTD
发明人： MIURA MASATAMI , MASUDA KAZUYOSHI , OOTAKA HIROMI , NAKAJIMA YOICHI
IPC分类号： H01L23/48 , H01L23/28 , H01L23/495

2. 发明专利

JPS5827345A RESIN-MOLDED SEMICONDUCTOR DEVICE 失效
公开(公告)号：JPS5827345A
公开(公告)日：1983-02-18
申请号：JP12481681
申请日：1981-08-11
申请人： HITACHI LTD
发明人： MIURA MASATAMI , MASUDA KAZUYOSHI , OOTAKA HIROMI , NAKAJIMA YOUICHI
IPC分类号： H01L23/48 , H01L23/28 , H01L23/495
摘要： PURPOSE:To reduce the cost and enhance the reliability of a resin-molded semiconductor device by mutually securing a mounting tap and a pellet bonding part with molding resin by employing a unit lead frame of the shape isolated from the tab and the bonding part. CONSTITUTION:A mounting tab 1, an anode lead 3A, a cathode lead 3K and a gate lead 3G are integrally formed with a unit lead frame. A pellet 4 is bonded with solder to the end of the lead 3A, the cathode electrode, the lead 3K, the gate electrode and the lead 3G of the pellet 4 are respectively electrically connected via fine metal wires 5. Thereafter, the structure is covered with and protected with molding resin 6, and the tab 1, the lead 3A, and the pellet 4 are fixedly held in the isolated relation. Individual semiconductor devices are isolated by a cutting machine.

3. 发明专利

JPS6223167A SEMICONDUCTOR DEVICE 失效
公开(公告)号：JPS6223167A
公开(公告)日：1987-01-31
申请号：JP16189985
申请日：1985-07-24
申请人： HITACHI LTD , HITACHI HARAMACHI SEMI CONDUCT
发明人： ONO MASAFUMI , TAKATSUCHI SHIGEYASU , MASUDA KAZUYOSHI , SAKURADA SHUROKU , SAKAGAMI TADASHI
IPC分类号： H01L29/78 , H01L21/52 , H01L29/41 , H01L29/74
摘要： PURPOSE:To remove the scratch deformation of a cathode Al electrode and reduce the deformation of the cathode Al electrode, and to lengthen thermal-fatigue lifetime by forming a cathode-side electrode plate to a cuppy drawing shape forming an R extending over inner and outer peripheries and also bevelling a section corresponding to an R section in a cuppy electrode plate shaping the R extending over the inner and outer peripheries in the shape of another cathode-side electrode plate. CONSTITUTION:An R is formed extending over inner and outer peripheries in a cathode- side electrode plate 8 (a thin impingement buffer plate) and the electrode plate 8 is drawn to a cuppy shape, and another cathode-side electrode plate 7 (a thick impingement buffer plate) is incorporated under the state in which a section corresponding to an R forming section in the cathode-side electrode plate 8 for the electrode plate 7 is bevelled. Large bevelling C is executed in order to also make the deformation of a cathode Al electrode 2 smaller than the R value of the cathode-side electrode plate 8 in the size of bevelling C at that time. Accordingly, scratch deformation is removed, and the deformation of the cathode Al electrode 2 is reduced only by a section corresponding to an effect in which bevelling and the formation of the Rs are each executed to the cathode-side electrode plates 7, 8.

4. 发明专利

JPH0566730B2 失效
公开(公告)号：JPH0566730B2
公开(公告)日：1993-09-22
申请号：JP16189985
申请日：1985-07-24
申请人： HITACHI LTD , HITACHI HARAMACHI DENSHI KOGYO
发明人： ONO MASAFUMI , TAKATSUCHI SHIGEYASU , MASUDA KAZUYOSHI , SAKURADA SHUROKU , SAKAGAMI TADASHI
IPC分类号： H01L29/78 , H01L21/52 , H01L29/41 , H01L29/74 , H01L29/44

5. 发明专利

JPH03262983A SEMICONDUCTOR DEVICE 失效
公开(公告)号：JPH03262983A
公开(公告)日：1991-11-22
申请号：JP6101790
申请日：1990-03-14
申请人： HITACHI LTD
发明人： MASUDA KAZUYOSHI , YANAKA MASAYUKI , TAYA ATSUSHI
IPC分类号： G01R31/26 , G01R31/28 , H01L21/66
摘要： PURPOSE:To judge the adequacy of a signal level in real time by providing a means for comparing, evaluating, and judging a semiconductor device external signal level and an internal signal and an external reporting means at an input, an output, and an input/output terminal. CONSTITUTION:A semiconductor LSI 1 is connected to a host system 2 which controls the part which is higher in order than the LSI 1 and an external bus 3. The LSI 1 consists of an internal bus 5 which receives an input from the bus 3, passes the signal to the inside of the LSI 1, and sends and receives signals in the LSI 1 to and from an input interface part 4, a control part 6 which controls the LSI 1, an arithmetic part 7, and an output interface 8 which outputs the arithmetic result. When the adequacy of the output terminal of the LSI 1 is evaluated, the host system 2 sends a command to the LSI 1 through the external bus 3. The LSI 1 receives the command by the control part 6 through the interface part 4 and internal bus 5. The control part 6 interprets the command to wait for a chance for evaluation, and switches the signal level 11 when the chance comes to perform sampling, thereby sending the sampled data to a decision part 14.

6. 发明专利

JPH08161287A DATA ANALYSIS SUPPORT SYSTEM 失效
公开(公告)号：JPH08161287A
公开(公告)日：1996-06-21
申请号：JP30585294
申请日：1994-12-09
申请人： HITACHI LTD
发明人： KAWASHIMA KAZUHIRO , TANIGUCHI YOJI , MASUDA KAZUYOSHI , HAMAGUCHI TSUYOSHI , ISHIBASHI AKINORI
IPC分类号： G06F19/00 , G06F17/00 , G06F17/30 , G06Q40/00 , G06Q40/02 , G06Q50/00
摘要： PURPOSE: To shorten the working time for a data analysis by squeezing down many items of a data base on an analysis item, selecting a rule for analysis to be used for an analysis and outputting the rule. CONSTITUTION: An analysis item convergence part 112 calculates the dispersion and correlation coefficient of inputted object data and displays them through the screen of an analysis item selection part 131. A rule generation part 113 combines conditions in the range of a maximum condition number and performs a calculation by defining the rate of 'reactive' data contained in the data compatible to a rule as density. A rule evaluation part 114 performs the calculation by defining the rate of 'reactive' data compatible to the rules in a rule output order as a cumulative covering ratio and displays the transition graphs of the cumulative convering ratio and the density on the screen of a rule selection part 133. When the display range of the rule is inputted, the discrimination ratio of each condition of the rules, the predictive values of the density by the integrated value of the discrimination ratio of each condition are comapred, the rule in which the integrated value is large is emphatically displayed and the conditions are displayed in the higher discrimination ratio order of each condition.

7. 发明专利

JPS62191907A SEMICONDUCTOR CIRCUIT 失效
公开(公告)号：JPS62191907A
公开(公告)日：1987-08-22
申请号：JP3299486
申请日：1986-02-19
申请人： HITACHI LTD , HITACHI ENG CO LTD
发明人： OKUTSU MITSUHIKO , SHIMURA TATSUO , KARIYA TADAAKI , MASUDA KAZUYOSHI
IPC分类号： G05F3/30
摘要： PURPOSE:To obtain a stable reference voltage circuit reducing the fluctuation of an output voltage by providing a resistance between the collector of an output stabilizing NPN transistor and an output terminal and further providing a PNP transistor. CONSTITUTION:One end of the resistance 8 is connected to the collector of the NPN transistor 3 and the base of the PNP transistor 9, and the emitter and collector of the PNP transistor 9 are connected to an output V0 and a GND, respectively. The PNP transistor 9 mainly absorbs the fluctuation of a circuit current due to the fluctuations of a power source and load, and the base current of the PNP transistor 9 and a current from the resistance 8 flow in the NPN transistor 3. If the resistance 8 is set so that greater current than the base current of the PNP transistor 9 can flow in it, the fluctuation of the base current of the PNP transistor 9 hardly affect the collector current of the NPN transistor 3 and the base current.

8. 发明专利

JPS6215474A QUALITY EVALUATING DEVICE FOR THYRISTOR 失效
公开(公告)号：JPS6215474A
公开(公告)日：1987-01-23
申请号：JP15402585
申请日：1985-07-15
申请人： HITACHI LTD
发明人： YONEYAMA TAKAO , SATO KAZUYA , MASUDA KAZUYOSHI , AOKI SHIGERU , MISAWA MICHIHIRO
IPC分类号： G01R31/26 , G01N29/04 , G01N29/14
摘要： PURPOSE:To execute the quality evaluation of a thyristor by varying a gate trigger current required for igniting the thyristor by at least two stages or more, and checking the rate of change of the maximum crest value or the energy value of each acoustic signal which is generated at that time. CONSTITUTION:An acoustic sensor 8 for receiving and detecting an acoustic signal (AE signal) which is generated at the time of ignition of a thyristor 1 is installed to the cooling fin 2 of the thyristor 1. The output of this acoustic sensor 8 is amplified by an amplifier 9, and thereafter, inputted to a crest value change rate detector 10 together with the synchronizing signal CK of a gate trigger current generation source 5 and the output of a gate trigger current measuring circuit 7. The rate of change of the maximum crest value of the acoustic signal corresponding to the value of a gate trigger current I0 which is inputted at the same time is measured, and when the value of its rate of change exceeds a set value, it is decided that the thyristor 1 is faulty and a signal for operating an alarm 11 is outputted.

9. 发明专利

JPH07200772A MAP EDITING METHOD AND SYSTEM 失效
公开(公告)号：JPH07200772A
公开(公告)日：1995-08-04
申请号：JP33462993
申请日：1993-12-28
申请人： HITACHI LTD
发明人： KUMOMURA AKIRA , MASUDA KAZUYOSHI
IPC分类号： G06T11/60 , G06T1/00
摘要： PURPOSE:To provide a map editing method and system which is capable of making the most of a map and easily recognizing the distribution status of sample values. CONSTITUTION:In a map editing method and system where inputted sample values are classified and summed up and a visible map is displayed on a display device, the sample values are summed up by a designated unit area and the sample values for every summed up unit area are displayed on a display device by making the values corresponding to the map. Next, the sample values included in the plural areas in the map for which a division and an integration are designated by an operator are resummed up, and the map and a statistic value is redisplayed based on the resummed up value.

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