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    • 1. 发明申请
    • Bandwidth Management
    • 带宽管理
    • US20140086070A1
    • 2014-03-27
    • US13625416
    • 2012-09-24
    • Gurjeet S. SaundJames B. KellerManu GulatiSukalpa Biswas
    • Gurjeet S. SaundJames B. KellerManu GulatiSukalpa Biswas
    • H04L12/26
    • G06F13/1605Y02D10/14
    • In some embodiments, a system includes a shared, high bandwidth resource (e.g. a memory system), multiple agents configured to communicate with the shared resource, and a communication fabric coupling the multiple agents to the shared resource. The communication fabric may be equipped with limiters configured to limit bandwidth from the various agents based on one or more performance metrics measured with respect to the shared, high bandwidth resource. For example, the performance metrics may include one or more of latency, number of outstanding transactions, resource utilization, etc. The limiters may dynamically modify their limit configurations based on the performance metrics. In an embodiment, the system may include multiple thresholds for the performance metrics, and exceeding a given threshold may include modifying the limiters in the communication fabric. There may be hysteresis implemented in the system as well in some embodiments, to reduce the frequency of transitions between configurations.
    • 在一些实施例中,系统包括共享的高带宽资源(例如,存储器系统),被配置为与共享资源通信的多个代理以及将多个代理耦合到共享资源的通信结构。 通信结构可以配备有限制器,其被配置为基于针对共享的高带宽资源测量的一个或多个性能度量来限制来自各种代理的带宽。 例如,性能度量可以包括延迟,未决事务数量,资源利用等中的一个或多个。限制器可以基于性能度量动态修改其限制配置。 在一个实施例中,系统可以包括用于性能度量的多个阈值,并且超过给定阈值可以包括修改通信结构中的限制器。 在一些实施例中,也可能在系统中实现滞后,以减少配置之间的转换频率。
    • 2. 发明授权
    • Bandwidth management
    • 带宽管理
    • US08848577B2
    • 2014-09-30
    • US13625416
    • 2012-09-24
    • Gurjeet S. SaundJames B. KellerManu GulatiSukalpa Biswas
    • Gurjeet S. SaundJames B. KellerManu GulatiSukalpa Biswas
    • H04L12/28
    • G06F13/1605Y02D10/14
    • In some embodiments, a system includes a shared, high bandwidth resource (e.g. a memory system), multiple agents configured to communicate with the shared resource, and a communication fabric coupling the multiple agents to the shared resource. The communication fabric may be equipped with limiters configured to limit bandwidth from the various agents based on one or more performance metrics measured with respect to the shared, high bandwidth resource. For example, the performance metrics may include one or more of latency, number of outstanding transactions, resource utilization, etc. The limiters may dynamically modify their limit configurations based on the performance metrics. In an embodiment, the system may include multiple thresholds for the performance metrics, and exceeding a given threshold may include modifying the limiters in the communication fabric. There may be hysteresis implemented in the system as well in some embodiments, to reduce the frequency of transitions between configurations.
    • 在一些实施例中,系统包括共享的高带宽资源(例如,存储器系统),被配置为与共享资源通信的多个代理以及将多个代理耦合到共享资源的通信结构。 通信结构可以配备有限制器,其被配置为基于针对共享的高带宽资源测量的一个或多个性能度量来限制来自各种代理的带宽。 例如,性能度量可以包括延迟,未决事务数量,资源利用等中的一个或多个。限制器可以基于性能度量动态修改其限制配置。 在一个实施例中,系统可以包括用于性能度量的多个阈值,并且超过给定阈值可以包括修改通信结构中的限制器。 在一些实施例中,也可能在系统中实现滞后,以减少配置之间的转换频率。
    • 5. 发明授权
    • Memory controller with loopback test interface
    • 带环回测试接口的内存控制器
    • US08301941B2
    • 2012-10-30
    • US13305202
    • 2011-11-28
    • Luka BodrozicSukalpa BiswasHao ChenSridhar P. SubramanianJames B. Keller
    • Luka BodrozicSukalpa BiswasHao ChenSridhar P. SubramanianJames B. Keller
    • G01R31/28G11C29/00G06F11/00
    • G01R31/31716
    • An apparatus may include an interconnect; at least one processor coupled to the interconnect; and at least one memory controller coupled to the interconnect. The memory controller may be programmable by the processor into a loopback test mode of operation and, in the loopback test mode, the memory controller may be configured to receive a first write operation from the processor over the interconnect. The memory controller may be configured to route write data from the first write operation through a plurality of drivers and receivers connected to a plurality of data pins that are capable of connection to one or more memory modules. The memory controller may be further configured to return the write data as read data on the interconnect for a first read operation received from the processor on the interconnect.
    • 设备可以包括互连; 耦合到所述互连的至少一个处理器; 以及耦合到所述互连的至少一个存储器控制器。 存储器控制器可以由处理器编程成环回测试操作模式,并且在回送测试模式中,存储器控制器可以被配置为通过互连从处理器接收第一写入操作。 存储器控制器可以被配置为将来自第一写入操作的写入数据路由到连接到能够连接到一个或多个存储器模块的多个数据引脚的多个驱动器和接收器。 存储器控制器还可以被配置为在互连上将读数据作为读数据返回,用于从互连上的处理器接收到的第一读操作。
    • 6. 发明申请
    • Memory Controller with Loopback Test Interface
    • 带环回测试接口的内存控制器
    • US20120072787A1
    • 2012-03-22
    • US13305202
    • 2011-11-28
    • Luka BodrozicSukalpa BiswasHao ChenSridhar P. SubramanianJames B. Keller
    • Luka BodrozicSukalpa BiswasHao ChenSridhar P. SubramanianJames B. Keller
    • G01R31/28G06F11/26
    • G01R31/31716
    • In one embodiment, an apparatus comprises an interconnect; at least one processor coupled to the interconnect; and at least one memory controller coupled to the interconnect. The memory controller is programmable by the processor into a loopback test mode of operation and, in the loopback test mode, the memory controller is configured to receive a first write operation from the processor over the interconnect. The memory controller is configured to route write data from the first write operation through a plurality of drivers and receivers connected to a plurality of data pins that are capable of connection to one or more memory modules. The memory controller is further configured to return the write data as read data on the interconnect for a first read operation received from the processor on the interconnect.
    • 在一个实施例中,一种装置包括互连; 耦合到所述互连的至少一个处理器; 以及耦合到所述互连的至少一个存储器控制器。 存储器控制器可由处理器编程为环回测试操作模式,并且在环回测试模式中,存储器控制器被配置为通过互连从处理器接收第一写入操作。 存储器控制器被配置为将来自第一写入操作的写入数据路由到连接到能够连接到一个或多个存储器模块的多个数据引脚的多个驱动器和接收器。 所述存储器控制器还被配置为将所述写入数据作为所述互连上的读取数据返回,用于从所述互连处从所述处理器接收的第一读取操作。
    • 7. 发明授权
    • Memory controller with loopback test interface
    • 带环回测试接口的内存控制器
    • US07836372B2
    • 2010-11-16
    • US11760566
    • 2007-06-08
    • Luka BodrozicSukalpa BiswasHao ChenSridhar P. SubramanianJames B. Keller
    • Luka BodrozicSukalpa BiswasHao ChenSridhar P. SubramanianJames B. Keller
    • G01R31/28G11C29/00
    • G01R31/31716
    • In one embodiment, an apparatus comprises an interconnect; at least one processor coupled to the interconnect; and at least one memory controller coupled to the interconnect. The memory controller is programmable by the processor into a loopback test mode of operation and, in the loopback test mode, the memory controller is configured to receive a first write operation from the processor over the interconnect. The memory controller is configured to route write data from the first write operation through a plurality of drivers and receivers connected to a plurality of data pins that are capable of connection to one or more memory modules. The memory controller is further configured to return the write data as read data on the interconnect for a first read operation received from the processor on the interconnect.
    • 在一个实施例中,一种装置包括互连; 耦合到所述互连的至少一个处理器; 以及耦合到所述互连的至少一个存储器控制器。 存储器控制器可由处理器编程为环回测试操作模式,并且在环回测试模式中,存储器控制器被配置为通过互连从处理器接收第一写入操作。 存储器控制器被配置为将来自第一写入操作的写入数据路由到连接到能够连接到一个或多个存储器模块的多个数据引脚的多个驱动器和接收器。 所述存储器控制器还被配置为将所述写入数据作为所述互连上的读取数据返回,用于从所述互连处从所述处理器接收的第一读取操作。
    • 8. 发明申请
    • Memory Controller with Loopback Test Interface
    • 带环回测试接口的内存控制器
    • US20080307276A1
    • 2008-12-11
    • US11760566
    • 2007-06-08
    • Luka BodrozicSukalpa BiswasHao ChenSridhar P. SubramanianJames B. Keller
    • Luka BodrozicSukalpa BiswasHao ChenSridhar P. SubramanianJames B. Keller
    • G11C29/04G06F12/00
    • G01R31/31716
    • In one embodiment, an apparatus comprises an interconnect; at least one processor coupled to the interconnect; and at least one memory controller coupled to the interconnect. The memory controller is programmable by the processor into a loopback test mode of operation and, in the loopback test mode, the memory controller is configured to receive a first write operation from the processor over the interconnect. The memory controller is configured to route write data from the first write operation through a plurality of drivers and receivers connected to a plurality of data pins that are capable of connection to one or more memory modules. The memory controller is further configured to return the write data as read data on the interconnect for a first read operation received from the processor on the interconnect.
    • 在一个实施例中,一种装置包括互连; 耦合到所述互连的至少一个处理器; 以及耦合到所述互连的至少一个存储器控制器。 存储器控制器可由处理器编程为环回测试操作模式,并且在环回测试模式中,存储器控制器被配置为通过互连从处理器接收第一写入操作。 存储器控制器被配置为将来自第一写入操作的写入数据路由到连接到能够连接到一个或多个存储器模块的多个数据引脚的多个驱动器和接收器。 所述存储器控制器还被配置为将所述写入数据作为所述互连上的读取数据返回,用于从所述互连处从所述处理器接收的第一读取操作。
    • 9. 发明授权
    • Memory controller with loopback test interface
    • 带环回测试接口的内存控制器
    • US08086915B2
    • 2011-12-27
    • US12909073
    • 2010-10-21
    • Luka BodrozicSukalpa BiswasHao ChenSridhar P. SubramanianJames B. Keller
    • Luka BodrozicSukalpa BiswasHao ChenSridhar P. SubramanianJames B. Keller
    • G01R31/28G11C29/00G06F11/00
    • G01R31/31716
    • In one embodiment, an apparatus comprises an interconnect; at least one processor coupled to the interconnect; and at least one memory controller coupled to the interconnect. The memory controller is programmable by the processor into a loopback test mode of operation and, in the loopback test mode, the memory controller is configured to receive a first write operation from the processor over the interconnect. The memory controller is configured to route write data from the first write operation through a plurality of drivers and receivers connected to a plurality of data pins that are capable of connection to one or more memory modules. The memory controller is further configured to return the write data as read data on the interconnect for a first read operation received from the processor on the interconnect.
    • 在一个实施例中,一种装置包括互连; 耦合到所述互连的至少一个处理器; 以及耦合到所述互连的至少一个存储器控制器。 存储器控制器可由处理器编程为环回测试操作模式,并且在环回测试模式中,存储器控制器被配置为通过互连从处理器接收第一写入操作。 存储器控制器被配置为将来自第一写入操作的写入数据路由到连接到能够连接到一个或多个存储器模块的多个数据引脚的多个驱动器和接收器。 所述存储器控制器还被配置为将所述写入数据作为所述互连上的读取数据返回,用于从所述互连处从所述处理器接收的第一读取操作。
    • 10. 发明申请
    • Memory Controller with Loopback Test Interface
    • 带环回测试接口的内存控制器
    • US20110035560A1
    • 2011-02-10
    • US12909073
    • 2010-10-21
    • Luka BodrozicSukalpa BiswasHao ChenSridhar P. SubramanianJames B. Keller
    • Luka BodrozicSukalpa BiswasHao ChenSridhar P. SubramanianJames B. Keller
    • G06F12/00G06F3/00
    • G01R31/31716
    • In one embodiment, an apparatus comprises an interconnect; at least one processor coupled to the interconnect; and at least one memory controller coupled to the interconnect. The memory controller is programmable by the processor into a loopback test mode of operation and, in the loopback test mode, the memory controller is configured to receive a first write operation from the processor over the interconnect. The memory controller is configured to route write data from the first write operation through a plurality of drivers and receivers connected to a plurality of data pins that are capable of connection to one or more memory modules. The memory controller is further configured to return the write data as read data on the interconnect for a first read operation received from the processor on the interconnect.
    • 在一个实施例中,一种装置包括互连; 耦合到所述互连的至少一个处理器; 以及耦合到所述互连的至少一个存储器控制器。 存储器控制器可由处理器编程为环回测试操作模式,并且在环回测试模式中,存储器控制器被配置为通过互连从处理器接收第一写入操作。 存储器控制器被配置为将来自第一写入操作的写入数据路由到连接到能够连接到一个或多个存储器模块的多个数据引脚的多个驱动器和接收器。 所述存储器控制器还被配置为将所述写入数据作为所述互连上的读取数据返回,用于从所述互连处从所述处理器接收的第一读取操作。