专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明授权

US07733111B1 Segmented optical and electrical testing for photovoltaic devices 失效
标题翻译：光电器件分段光电测试
公开(公告)号：US07733111B1
公开(公告)日：2010-06-08
申请号：US12045734
申请日：2008-03-11
申请人： Guoheng Zhao , Bin-Ming B. Tsai , Mehdi Vaez-Iravani , Ady Levy , George H. Zapalac, Jr. , Samuel S. H. Ngai
发明人： Guoheng Zhao , Bin-Ming B. Tsai , Mehdi Vaez-Iravani , Ady Levy , George H. Zapalac, Jr. , Samuel S. H. Ngai
IPC分类号： G01R31/26
CPC分类号： H02S50/10 , F21S8/006 , F21Y2115/10
摘要： An apparatus for inducing a current in a solar cell substrate. A substrate receiving surface receives the substrate, and an array of a plurality of individually addressable light sources illuminates the substrate in a sequenced manner. A sequencer controls the sequenced manner of illumination of the substrate by the array. A front side electrical contact makes electrical contact to a front side of the substrate, and a back side electrical contact makes electrical contact to a back side of the substrate. A meter is electrically connected to the front side electrical contact and the back side electrical contact, and senses the current induced in the substrate during the sequenced illumination of the substrate.
摘要翻译：一种用于在太阳能电池基板中感应电流的装置。衬底接收表面接收衬底，并且多个可单独寻址的光源的阵列以顺序的方式照射衬底。定序器通过阵列控制衬底的照明顺序。前侧电触点与基板的前侧电接触，并且背面电触点与基板的背面进行电接触。仪表电连接到前侧电触头和后侧电触点，并感测在衬底的顺序照明期间在衬底中感应的电流。

2. 发明授权

US07989729B1 Detecting and repairing defects of photovoltaic devices 有权
标题翻译：检测和修复光伏器件的缺陷
公开(公告)号：US07989729B1
公开(公告)日：2011-08-02
申请号：US12045724
申请日：2008-03-11
申请人： Guoheng Zhao , George H. Zapalac, Jr. , Samuel S. H. Ngai , Ady Levy , Mehdi Vaez-Iravani
发明人： Guoheng Zhao , George H. Zapalac, Jr. , Samuel S. H. Ngai , Ady Levy , Mehdi Vaez-Iravani
IPC分类号： G01J5/00 , G06K9/00
CPC分类号： G01J1/08 , G01J1/0466 , G01J2005/0077 , H01L31/186 , Y02E10/50 , Y02P70/521 , Y10S136/29
摘要： An apparatus for both detecting and repairing a shunt defect in a solar cell substrate. A shunt detection module detects the shunt defect in the substrate, using at least one of lock-in thermography and current-voltage testing. A process diagnostic module determines whether the substrate should be passed without further processing by the apparatus, rejected without further processing by the apparatus, or repaired by the apparatus. A shunt repair module electrically isolates the shunt defect in the substrate. In this manner, a single apparatus can quickly check for shunts and make a determination as to whether the substrate is worth repairing. If it is worth repairing, then the apparatus can make the repairs to the substrate.
摘要翻译：一种用于检测和修复太阳能电池基板中的分流缺陷的装置。分流检测模块使用锁定热成像和电流 - 电压测试中的至少一种来检测衬底中的分流缺陷。过程诊断模块确定衬底是否应该被通过而不被设备进一步处理，不经设备的进一步处理就被拒绝或被设备修复。分流修复模块电隔离衬底中的分流缺陷。以这种方式，单个装置可以快速检查分流并且确定基板是否值得修复。如果值得修理，那么设备可以对基材进行维修。

3. 发明授权

US08436554B2 LED solar illuminator 失效
标题翻译： LED太阳能照明灯
公开(公告)号：US08436554B2
公开(公告)日：2013-05-07
申请号：US13081734
申请日：2011-04-07
申请人： Guoheng Zhao , Ady Levy , Alex Salnik , Mehdi Vaez-Iravani , Lena Nicolaides , Samuel S. H. Ngai
发明人： Guoheng Zhao , Ady Levy , Alex Salnik , Mehdi Vaez-Iravani , Lena Nicolaides , Samuel S. H. Ngai
IPC分类号： G05F1/00 , H05B37/02 , H05B39/04 , H05B41/36
CPC分类号： H05B33/0803
摘要： An apparatus for illuminating a target surface, the apparatus having a plurality of LED arrays, where each of the arrays has a plurality of individually addressable LEDs, and where at least one of the arrays is disposed at an angle of between about forty-five degrees and about ninety degrees relative to the target surface, where all of the arrays supply light into a light pipe, the light pipe having interior walls made of a reflective material, where light exiting the light pipe illuminates the target surface, and a controller for adjusting an intensity of the individually addressable light sources.
摘要翻译：一种用于照射目标表面的装置，该装置具有多个LED阵列，其中每个阵列具有多个独立可寻址的LED，并且其中至少一个阵列以大约四十五度之间的角度设置并且相对于目标表面大约九十度，其中所有的阵列将光提供到光管中，光管具有由反射材料制成的内壁，其中离开光管的光照射目标表面，以及用于调节的控制器独立寻址光源的强度。

4. 发明申请

US20120256559A1 LED Solar Illuminator 失效
标题翻译： LED太阳能照明器
公开(公告)号：US20120256559A1
公开(公告)日：2012-10-11
申请号：US13081734
申请日：2011-04-07
申请人： Guoheng Zhao , Ady Levy , Alex Salnik , Mehdi Vaez-Iravani , Lena Nicolaides , Samuel S.H. Ngai
发明人： Guoheng Zhao , Ady Levy , Alex Salnik , Mehdi Vaez-Iravani , Lena Nicolaides , Samuel S.H. Ngai
IPC分类号： H05B37/02
CPC分类号： H05B33/0803
摘要： An apparatus for illuminating a target surface, the apparatus having a plurality of LED arrays, where each of the arrays has a plurality of individually addressable LEDs, and where at least one of the arrays is disposed at an angle of between about forty-five degrees and about ninety degrees relative to the target surface, where all of the arrays supply light into a light pipe, the light pipe having interior walls made of a reflective material, where light exiting the light pipe illuminates the target surface, and a controller for adjusting an intensity of the individually addressable light sources.
摘要翻译：一种用于照射目标表面的装置，该装置具有多个LED阵列，其中每个阵列具有多个独立可寻址的LED，并且其中至少一个阵列以大约四十五度之间的角度设置并且相对于目标表面大约九十度，其中所有的阵列将光提供到光管中，光管具有由反射材料制成的内壁，其中离开光管的光照射目标表面，以及用于调节的控制器独立寻址光源的强度。

5. 发明授权

US07709794B2 Defect detection using time delay lock-in thermography (LIT) and dark field LIT 失效
标题翻译：使用时间延迟锁定热成像（LIT）和暗场LIT进行缺陷检测
公开(公告)号：US07709794B2
公开(公告)日：2010-05-04
申请号：US12026539
申请日：2008-02-05
申请人： Guoheng Zhao , Geordie Zapalac , Samuel Ngai , Mehdi Vaez-Iravani , Ady Levy , Vineet Dharmadhikari
发明人： Guoheng Zhao , Geordie Zapalac , Samuel Ngai , Mehdi Vaez-Iravani , Ady Levy , Vineet Dharmadhikari
IPC分类号： G01J5/00
CPC分类号： G01N25/72 , G01R31/308
摘要： To increase inspection throughput, the field of view (FOV) of an IR camera can be moved over the sample at a constant velocity. Throughout this moving, a modulation (e.g. optical or electrical) can be provided to the sample and IR images can be captured using the IR camera. Moving the FOV, providing the modulation, and capturing the IR images can be synchronized. The IR images can be filtered to generate the time delay LIT, thereby providing defect identification. In one embodiment, this filtering accounts for the number of pixels of the IR camera in a scanning direction. For the case of optical modulation, a dark field region can be provided for the FOV throughout the moving, thereby providing an improved signal-to-noise ratio (SNR) during filtering.
摘要翻译：为了提高检测吞吐量，IR摄像机的视野（FOV）可以以恒定速度移动到样品上。在整个移动过程中，可以向样本提供调制（例如光学或电气），并且可以使用IR照相机捕获IR图像。移动FOV，提供调制和捕获IR图像可以同步。可以对IR图像进行滤波以产生时间延迟LIT，从而提供缺陷识别。在一个实施例中，该过滤计算了IR照相机在扫描方向上的像素数量。对于光调制的情况，可以在整个移动期间为FOV提供暗场区域，从而在滤波期间提供改善的信噪比（SNR）。

6. 发明申请

US20100073665A1 DEFECT DETECTION USING TIME DELAY LOCK-IN THERMOGRAPHY (LIT) AND DARK FIELD LIT 失效
标题翻译：使用时间延迟锁定热像仪（LIT）和暗场灯的缺陷检测
公开(公告)号：US20100073665A1
公开(公告)日：2010-03-25
申请号：US12026539
申请日：2008-02-05
申请人： Guoheng Zhao , Geordie Zapalac , Samuel Ngai , Mehdi Vaez-Iravani , Ady Levy , Vineet Dharmadhikari
发明人： Guoheng Zhao , Geordie Zapalac , Samuel Ngai , Mehdi Vaez-Iravani , Ady Levy , Vineet Dharmadhikari
IPC分类号： G01N1/00
CPC分类号： G01N25/72 , G01R31/308
摘要： To increase inspection throughput, the field of view (FOV) of an IR camera can be moved over the sample at a constant velocity. Throughout this moving, a modulation (e.g. optical or electrical) can be provided to the sample and IR images can be captured using the IR camera. Moving the FOV, providing the modulation, and capturing the IR images can be synchronized. The IR images can be filtered to generate the time delay LIT, thereby providing defect identification. In one embodiment, this filtering accounts for the number of pixels of the IR camera in a scanning direction. For the case of optical modulation, a dark field region can be provided for the FOV throughout the moving, thereby providing an improved signal-to-noise ratio (SNR) during filtering.
摘要翻译：为了提高检测吞吐量，IR摄像机的视野（FOV）可以以恒定速度移动到样品上。在整个移动过程中，可以向样本提供调制（例如光学或电气），并且可以使用IR照相机捕获IR图像。移动FOV，提供调制和捕获IR图像可以同步。可以对IR图像进行滤波以产生时间延迟LIT，从而提供缺陷识别。在一个实施例中，该过滤计算了IR照相机在扫描方向上的像素数量。对于光调制的情况，可以在整个移动期间为FOV提供暗场区域，从而在滤波期间提供改善的信噪比（SNR）。

7. 发明申请

US20100074515A1 Defect Detection and Response 审中-公开
标题翻译：缺陷检测和响应
公开(公告)号：US20100074515A1
公开(公告)日：2010-03-25
申请号：US12336704
申请日：2008-12-17
申请人： Guoheng Zhao , George H. Zapalac, JR. , Samuel S.H. Ngai , Medhi Vaez-Iravani , Ady Levy , Vineet Dharmadhikari
发明人： Guoheng Zhao , George H. Zapalac, JR. , Samuel S.H. Ngai , Medhi Vaez-Iravani , Ady Levy , Vineet Dharmadhikari
IPC分类号： G06K9/00 , G02F1/01
CPC分类号： G06T7/001 , G01N25/72 , G02F1/1309 , G06T2207/10048 , G06T2207/30148
摘要： To increase inspection throughput, the field of view of an infrared camera can be moved over the sample at a constant velocity. Throughout this moving, a modulation (such as optical or electrical) can be provided to the sample and infrared images can be captured using the infrared camera. Moving the field of view, providing the modulation, and capturing the infrared images can be synchronized. The infrared images can be filtered to generate the time delay lock-in thermography, thereby providing defect identification. In one embodiment, this filtering accounts for the number of pixels of the infrared camera in a scanning direction. For the case of optical modulation, a dark field region can be provided for the field of view throughout the moving, thereby providing an improved signal-to-noise ratio during filtering. Localized defects can be repaired by a laser integrated into the detection system or marked by ink for later repair in the production line.
摘要翻译：为了提高检查吞吐量，红外摄像机的视野可以以恒定的速度移动到样品上。在整个移动过程中，可以向样品提供调制（如光学或电气），并可使用红外摄像机捕获红外图像。移动视野，提供调制和捕获红外图像可以同步。可以对红外图像进行滤波以产生延时锁定热成像，从而提供缺陷识别。在一个实施例中，该过滤考虑了红外摄像机在扫描方向上的像素数量。对于光调制的情况，可以在整个移动期间为视场提供暗场区域，从而在滤波期间提供改善的信噪比。局部缺陷可以通过集成到检测系统中的激光器或由墨水标记来修复，以便在生产线中进行后续修复。

8. 发明授权

US08415961B1 Measuring sheet resistance and other properties of a semiconductor 有权
标题翻译：测量薄膜电阻等半导体性能
公开(公告)号：US08415961B1
公开(公告)日：2013-04-09
申请号：US12961932
申请日：2010-12-07
申请人： Guoheng Zhao , Alex Salnik , Lena Nicolaides , Ady Levy
发明人： Guoheng Zhao , Alex Salnik , Lena Nicolaides , Ady Levy
IPC分类号： G01R27/08 , G01R31/308
CPC分类号： G01R31/2656 , G01R31/2648
摘要： A method may include illuminating a first area of a semiconductor utilizing a light source. The method may also include measuring at least one characteristic of electrical energy transmission utilizing a probe for placing at least one of at or near the illuminated first area of the semiconductor. The method may further include varying the measured at least one characteristic of the electrical energy transmission generated by the light from the light source incident upon the semiconductor while maintaining an intensity of the light source. Further, the method may include determining a sheet resistance for the junction of the semiconductor utilizing the varied at least one characteristic of the electrical energy transmission.
摘要翻译：一种方法可以包括利用光源照射半导体的第一区域。该方法还可以包括利用探针来测量电能传输的至少一个特征，所述探针用于放置半导体照明的第一区域中或其附近的至少一个。该方法还可以包括改变由入射到半导体上的来自光源的光产生的电能传输的测量的至少一个特性，同时保持光源的强度。此外，该方法可以包括利用电能传输的变化的至少一个特性来确定半导体的结的薄层电阻。

9. 发明授权

US08604447B2 Solar metrology methods and apparatus 失效
标题翻译：太阳能计量方法和装置
公开(公告)号：US08604447B2
公开(公告)日：2013-12-10
申请号：US13557047
申请日：2012-07-24
申请人： Scott Young , Guoheng Zhao , Ady Levy , Marco Guevremont , Neeraj Khanna
发明人： Scott Young , Guoheng Zhao , Ady Levy , Marco Guevremont , Neeraj Khanna
IPC分类号： G01N21/64
CPC分类号： G01N21/6489 , G01N21/9501 , H02S50/10
摘要： Methods and apparatus are presented to measure the photoluminescence of incoming wafers and extract parameters such as minority carrier life time, diffusion length, and defect density that may be used to predict final solar cell efficiency. In some examples, illumination light is supplied to a side of an as-cut silicon wafer and the induced luminescence measured from the same side and the opposite side of the wafer is used to determine an indication of the minority carrier lifetime. In another example, the luminescence induced by two instances of illumination light of different wavelength is used to determine an indication of the minority carrier lifetime. In another example, the spatial distribution of luminescence intensity over an area surrounding a focused illumination spot is used to determine an indication of the minority carrier lifetime. Other apparatus useful to passivate the surface of a wafer for inspection are also presented.
摘要翻译：提出了测量进入晶片的光致发光的方法和装置，并提取可用于预测最终太阳能电池效率的参数，例如少数载流子寿命，扩散长度和缺陷密度。在一些示例中，将照明光提供给切割硅晶片的一侧，并且使用从晶片的相同侧和相对侧测量的感应发光来确定少数载流子寿命的指示。在另一示例中，由两个不同波长的照明光实例引起的发光用于确定少数载流子寿命的指示。在另一示例中，使用聚焦照明点周围的区域上的发光强度的空间分布来确定少数载流子寿命的指示。还提出了可用于钝化晶片表面以进行检查的其它装置。

10. 发明申请

US20130048873A1 Solar Metrology Methods And Apparatus 失效
标题翻译：太阳能计量方法与装置
公开(公告)号：US20130048873A1
公开(公告)日：2013-02-28
申请号：US13557047
申请日：2012-07-24
申请人： Scott Young , Guoheng Zhao , Ady Levy , Marco Guevremont , Neeraj Khanna
发明人： Scott Young , Guoheng Zhao , Ady Levy , Marco Guevremont , Neeraj Khanna
IPC分类号： G01N21/64
CPC分类号： G01N21/6489 , G01N21/9501 , H02S50/10
摘要： Methods and apparatus are presented to measure the photoluminescence of incoming wafers and extract parameters such as minority carrier life time, diffusion length, and defect density that may be used to predict final solar cell efficiency. In some examples, illumination light is supplied to a side of an as-cut silicon wafer and the induced luminescence measured from the same side and the opposite side of the wafer is used to determine an indication of the minority carrier lifetime. In another example, the luminescence induced by two instances of illumination light of different wavelength is used to determine an indication of the minority carrier lifetime. In another example, the spatial distribution of luminescence intensity over an area surrounding a focused illumination spot is used to determine an indication of the minority carrier lifetime. Other apparatus useful to passivate the surface of a wafer for inspection are also presented.
摘要翻译：提出了测量进入晶片的光致发光的方法和装置，并提取可用于预测最终太阳能电池效率的参数，例如少数载流子寿命，扩散长度和缺陷密度。在一些示例中，将照明光提供给切割硅晶片的一侧，并且使用从晶片的相同侧和相对侧测量的感应发光来确定少数载流子寿命的指示。在另一示例中，由两个不同波长的照明光实例引起的发光用于确定少数载流子寿命的指示。在另一示例中，使用聚焦照明点周围的区域上的发光强度的空间分布来确定少数载流子寿命的指示。还提出了可用于钝化晶片表面以进行检查的其它装置。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式