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    • 2. 发明授权
    • Double implanted laterally diffused MOS device and method thereof
    • 双向植入横向扩散MOS器件及其方法
    • US5371394A
    • 1994-12-06
    • US153503
    • 1993-11-15
    • Gordon C. MaHassan PirastehfarSteven J. Adler
    • Gordon C. MaHassan PirastehfarSteven J. Adler
    • H01L21/336H01L29/10H01L29/78H01L29/68H01L21/04
    • H01L29/66659H01L29/1045H01L29/1083H01L29/7835
    • An NMOS transistor has a source and a drain composed of n+ type of semiconductor material. A substrate region composed of a p type of semiconductor material is disposed between the source and the drain. A gate region is disposed above the substrate region and between the source region and the drain region. A first implant region is disposed adjacent to the source region and the gate region. The first implant region is composed of p type of semiconductor material with a first doping concentration. A second implant region is disposed between the first implant region and the substrate. The second implant region is composed of p type of semiconductor material with a second doping concentration. The channel doping profile first and second implant regions is tailored to obtain the optimum internal electric field to maximize device transconductance, while simultaneously controlling the device threshold voltage and punch through characteristics.
    • NMOS晶体管具有由n +型半导体材料构成的源极和漏极。 由p型半导体材料构成的衬底区域设置在源极和漏极之间。 栅极区域设置在衬底区域之上并且在源极区域和漏极区域之间。 第一注入区域邻近源极区域和栅极区域设置。 第一注入区域由具有第一掺杂浓度的p型半导体材料组成。 第二植入区域设置在第一植入区域和基底之间。 第二注入区由具有第二掺杂浓度的p型半导体材料组成。 沟道掺杂分布第一和第二注入区域被定制以获得最佳内部电场以最大化器件跨导,同时控制器件阈值电压和穿透特性。
    • 4. 发明授权
    • Method of manufacturing a semiconductor component
    • 制造半导体部件的方法
    • US06271106B1
    • 2001-08-07
    • US09430725
    • 1999-10-29
    • Gordon M. GrivnaRichard A. KeatingGordon C. Ma
    • Gordon M. GrivnaRichard A. KeatingGordon C. Ma
    • H01L2144
    • H01L21/76802H01L29/66545
    • A method of manufacturing a semiconductor component includes sequentially disposing a first electrically conductive layer (130), a dielectric layer (140), and a sacrificial layer (150) over a substrate (110). An etch mask is used to defined a gate stack (210) comprised of the sacrificial layer (150), the dielectric layer, and the first electrically conductive layer. Another dielectric layer (310) is deposited over the substrate (110) and the gate stack (210). This second dielectric layer (310) is planarized to expose the sacrificial layer (150). The sacrificial layer (150) of the gate stack (210) and the dielectric layer (140) of the gate stack (210) are sequentially removed, and another electrically conductive layer (740) is deposited over the first electrically conductive layer of the gate stack to form a gate electrode made of, among other features, two electrically conductive layers.
    • 制造半导体部件的方法包括在衬底(110)上顺序地设置第一导电层(130),电介质层(140)和牺牲层(150)。 蚀刻掩模用于限定由牺牲层(150),电介质层和第一导电层组成的栅极堆叠(210)。 在衬底(110)和栅极叠层(210)上方沉积另一介质层(310)。 该第二介电层(310)被平坦化以暴露牺牲层(150)。 栅堆叠(210)的牺牲层(150)和栅堆叠(210)的电介质层(140)被顺序地去除,另一导电层(740)沉积在栅极的第一导电层上 堆叠以形成除了其它特征之外由两个导电层制成的栅电极。