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    • 1. 发明授权
    • Radio frequency power transistor avalanche breakdown detection circuit and method therefor
    • 射频功率晶体管雪崩击穿检测电路及其方法
    • US06825727B1
    • 2004-11-30
    • US10608602
    • 2003-06-27
    • Darrell Hill
    • Darrell Hill
    • H03F304
    • H03F1/52H03F3/211H03F2200/366
    • An apparatus for detecting the onset of avalanche breakdown in a radio frequency bipolar power transistor is provided. The radio frequency bipolar power transistor includes a first transistor cell and a second transistor cells. The first and second transistor cells are functioning cells of the radio frequency bipolar transistor. The first transistor has a base ballast resistor. The second transistor cell has an emitter ballast resistor. The operation of the first and second transistor cells are monitored and compared against one another. A first difference voltage is generated from the first and second transistor cells under normal operating conditions. A second difference voltage is generated from the first and second transistor cells at the onset of avalanche breakdown.
    • 提供一种用于检测射频双极功率晶体管中的雪崩击穿开始的装置。 射频双极型功率晶体管包括第一晶体管单元和第二晶体管单元。 第一和第二晶体管单元是射频双极晶体管的功能单元。 第一晶体管具有基极镇流电阻。 第二晶体管单元具有发射极镇流电阻。 对第一和​​第二晶体管单元的操作进行监测并相互比较。 在正常工作条件下,从第一和第二晶体管单元产生第一差分电压。 在雪崩击穿开始时,从第一和第二晶体管单元产生第二差分电压。
    • 3. 发明授权
    • Transconductor tuning circuit
    • 跨导调谐电路
    • US06806776B2
    • 2004-10-19
    • US10373837
    • 2003-02-27
    • Jeong-won LeeGea-ok ChoJung-eun Lee
    • Jeong-won LeeGea-ok ChoJung-eun Lee
    • H03F304
    • H03F3/343H03F3/191H03F3/45179H03F2203/45394H03F2203/45622H03F2203/45682
    • A transconductor tuning circuit for controlling transconductance of a transconductor. The tuning circuit includes a first MOS (Metal-Oxide Semiconductor) transistor. A source terminal of the first MOS transistor is connected to a power source. A gate terminal and a drain terminal of the first MOS transistor being connected to each other. A gate terminal and a drain terminal of a second MOS transistor being connected. A first input terminal of a first error amplifier is connected to the gate terminal of the first MOS transistor. A second input terminal of the first error amplifier is connected to the gate terminal of the second MOS transistor. The first error amplifier outputs an output signal in form of a bias signal for controlling tuning of the transconductor.
    • 用于控制跨导体的跨导的跨导体调谐电路。 调谐电路包括第一MOS(金属氧化物半导体)晶体管。 第一MOS晶体管的源极端子连接到电源。 第一MOS晶体管的栅极端子和漏极端子彼此连接。 连接第二MOS晶体管的栅极端子和漏极端子。 第一误差放大器的第一输入端子连接到第一MOS晶体管的栅极端子。 第一误差放大器的第二输入端子连接到第二MOS晶体管的栅极端子。 第一误差放大器以偏置信号的形式输出输出信号,以控制跨导体的调谐。
    • 7. 发明授权
    • High-frequency power amplifier
    • 高频功率放大器
    • US06724263B2
    • 2004-04-20
    • US10281206
    • 2002-10-28
    • Masayuki Sugiura
    • Masayuki Sugiura
    • H03F304
    • H03F1/565H03F3/191
    • A high-frequency power amplifier includes a transistor which is inputted with a high-frequency signal, amplifies the high-frequency signal and outputs the same; a fundamental-signal matching circuit, one end of which is connected to an output of said transistor and which matches at least the impedance of fundamental signal in the amplified high-frequency signal and outputs the same from the other end; a power supply which supplies electric power to said transistor from a node located in an interval from the output of said transistor to said fundamental-signal matching circuit; a first inductor, one end of which is connected to said power supply; a second inductor connected in series between the other end of said first inductor and said node; and a first capacitor, one end of which is connected between said first inductor and said second inductor while the other end thereof is connected to a reference potential, said first capacitor forming a first series-resonant circuit with said second inductor and a parallel-resonant circuit with said first inductor.
    • 高频功率放大器包括输入高频信号的晶体管,放大高频信号并输出​​高频信号; 基本信号匹配电路,其一端连接到所述晶体管的输出,并且至少匹配放大的高频信号中的基波信号的阻抗并从另一端输出; 从位于从所述晶体管的输出到所述基本信号匹配电路的间隔的节点向所述晶体管供给电力的电源; 第一电感器,其一端连接到所述电源; 第二电感器,串联连接在所述第一电感器的另一端和所述节点之间; 以及第一电容器,其一端连接在所述第一电感器和所述第二电感器之间,而另一端连接到参考电位,所述第一电容器与所述第二电感器形成第一串联谐振电路,并且并联谐振 电路与所述第一电感器。
    • 9. 发明授权
    • Active current bias network for compensating hot-carrier injection induced bias drift
    • 用于补偿热载流子注入的有源电流偏压网络引起的偏置漂移
    • US06714081B1
    • 2004-03-30
    • US10241081
    • 2002-09-11
    • Jie Xu
    • Jie Xu
    • H03F304
    • H03F1/301H03F2200/453
    • An active current bias network that compensates for Hot-Carrier Injection (HCI) induced bias drift, a common phenomenon existing in Metal-Oxide Semiconductor (MOS) transistors and especially in Laterally Diffused MOS (LDMOS) transistors. The active bias network of the present invention first senses the bias current flowing in the targeted transistor and then compares the bias current in the targeted transistor with a stable reference current. The difference between the bias current in the targeted transistor and the reference current is then utilized to adjust the bias of the targeted transistor via a current mirror feedback circuit. The bias current of the targeted transistor then is stable independent of any HCI induced bias changes and changes due to other adverse causes. The sensing MOS transistor used for monitoring bias current is operated in the triode region and has minimum effect on the performance of the targeted transistor.
    • 补偿热载流子注入(HCI)引起的偏置漂移的有源电流偏置网络,这是金属氧化物半导体(MOS)晶体管,特别是在侧向扩散MOS(LDMOS)晶体管中存在的常见现象。 本发明的有源偏置网络首先感测在目标晶体管中流动的偏置电流,然后将目标晶体管中的偏置电流与稳定的参考电流进行比较。 然后利用目标晶体管中的偏置电流与参考电流之间的差异来经由电流镜反馈电路调整目标晶体管的偏置。 目标晶体管的偏置电流稳定,独立于任何HCl引起的偏置变化和由于其他不利原因引起的变化。 用于监控偏置电流的感测MOS晶体管在三极管区域工作,对目标晶体管的性能影响最小。