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    • 1. 发明申请
    • Optical detector and method of producing an arrangement of multiple semiconductor layers
    • 光学检测器和制造多个半导体层的布置的方法
    • US20060091491A1
    • 2006-05-04
    • US11273427
    • 2005-11-14
    • Gerd MuehlnikelKlaus HircheMartin Warth
    • Gerd MuehlnikelKlaus HircheMartin Warth
    • H01L31/105H01L21/00
    • H01L31/18H01L31/02162H01L31/1035
    • An optical detector with an arrangement of several semiconductor layers has at least one zone absorbing in a predetermined wavelength region, at least one zone which is at least partially light-permeable in the predetermined wavelength region, one semiconductor layer which is absorbing in the predetermined wavelength region, a semiconductor layer which is located under the first mentioned semiconductor layer and is at least partially light-permeable in the predetermined wavelength region, the at least one light-permeable zone is formed as an interruption in the absorbing semiconductor layer, and a throughgoing doping provided on an upper surface of the absorbing semiconductor layer which surrounds the interruption and at least a part of an upper surface of the at least partially light-permeable semiconductor layer, wherein, the optical detector is produced by a new method and used for various applications.
    • 具有多个半导体层的布置的光学检测器具有在预定波长区域中吸收的至少一个区域,在预定波长区域中至少部分透光的至少一个区域,以预定波长吸收的一个半导体层 区域,位于第一提到的半导体层下方并且在预定波长区域中至少部分透光的半导体层,所述至少一个透光区形成为吸收半导体层中的中断,并且通过 提供在吸收半导体层的围绕中断的上表面上的掺杂和至少部分透光的半导体层的上表面的至少一部分,其中,光学检测器通过新的方法制造并用于各种 应用程序。