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    • 3. 发明授权
    • Systems and methods for storage channel testing
    • 存储通道测试的系统和方法
    • US07990642B2
    • 2011-08-02
    • US12425757
    • 2009-04-17
    • Yuan Xing LeeGeorge MathewShaohua YangHongwei SongWeijun TanHao Zhong
    • Yuan Xing LeeGeorge MathewShaohua YangHongwei SongWeijun TanHao Zhong
    • G11B27/36
    • G11B20/182G11B2220/2516
    • Various embodiments of the present invention provide systems and methods for validating elements of storage devices. A an example, various embodiments of the present invention provide semiconductor devices that include a write path circuit, a read path circuit and a validation circuit. The write path circuit is operable to receive a data input and to convert the data input into write data suitable for storage to a storage medium. The read path circuit is operable to receive read data and to convert the read data into a data output. The validation circuit is operable to: receive the write data, augment the write data with a first noise sequence to yield a first augmented data series; and augment a derivative of the first augmented data series with a second noise sequence to yield the read data.
    • 本发明的各种实施例提供用于验证存储设备的元件的系统和方法。 作为示例,本发明的各种实施例提供包括写入路径电路,读取路径电路和验证电路的半导体器件。 写入路径电路可操作用于接收数据输入并将数据输入转换成适合于存储的写数据到存储介质。 读路径电路可操作以接收读数据并将读数据转换为数据输出。 验证电路可操作以:接收写入数据,用第一噪声序列增加写入数据以产生第一增强数据序列; 并且用第二噪声序列来增加第一增强数据序列的导数以产生读取的数据。