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    • 1. 发明申请
    • METHOD OF MANUFACTURING HEAD GIMBAL ASSEMBLIES, ACTUATORS AND DISK DRIVES BY REMOVING THERMAL POLE-TIP PROTRUSION AT THE SPIN STAND LEVEL
    • 通过在旋转水平上移除热点提取来制造头部组件,执行器和磁盘驱动器的方法
    • US20070006446A1
    • 2007-01-11
    • US11464488
    • 2006-08-14
    • Geng WangHae LeeKeung ChoSang Lee
    • Geng WangHae LeeKeung ChoSang Lee
    • H04R31/00
    • G11B5/3136G11B5/012G11B5/455G11B5/4806G11B5/4833G11B5/484Y10T29/49025Y10T29/49027Y10T29/49028Y10T29/49032Y10T29/49036
    • Thermal pole tip protrusion is caused by the materials in and around the head slider expanding during write operations till part of those materials protrude, leading to contact with the rotating disk surface, altering the flying height and often wearing down part of the disk surface. While it is well known that read-write heads expand during writing, the inventors are unaware of anyone else who recognized this situation's significance, particularly as the flying height decreases and the data rates increase, both of which are required for high areal density disk drives. The inventors realized that they could detect the problem at the spin stand level by testing head gimbal assemblies to reliably, and inexpensively, predict the tendency for thermal pole tip protrusion. This leads to selection of head gimbal assemblies, which do not have the thermal pole tip protrusion tendency. The selected head gimbal assemblies have better reliability, as do actuators and disk drives made with the selected head gimbal assemblies.
    • 热极尖突起是由写入操作期间头部滑块内和周围的材料引起的,直到这些材料的一部分突出,导致与旋转盘表面接触,改变飞行高度并经常磨损磁盘表面的一部分。 虽然众所周知,读写头在写入期间扩展,但是发明人不知道任何认识到这种情况的人的意义,特别是当飞行高度降低并且数据速率增加时,两者都是高密度磁盘驱动器所需要的 。 本发明人意识到,它们可以通过测试头万向架组件可靠且廉价地预测热极尖端突起的趋势来检测旋转台水平的问题。 这导致了不具有热极尖突起倾向的头万向节组件的选择。 所选择的头万向架组件具有更好的可靠性,与使用所选择的头万向架组件制造的致动器和磁盘驱动器一样。
    • 2. 发明授权
    • Detection of a defective disk of a hard disk drive
    • 检测硬盘驱动器的故障磁盘
    • US07212000B2
    • 2007-05-01
    • US10698866
    • 2003-10-30
    • Geng WangSang Lee
    • Geng WangSang Lee
    • G01B7/00
    • G11B27/36G11B20/1816G11B2220/2516
    • A method and apparatus for detecting a defective disk for a hard disk drive. The method includes placing a disk into a tester so that a first side of the disk is adjacent to a first head of the tester and a second side of the disk is adjacent to a second head. First data is read from the first side of the disk, and second data is read from the second side of the disk. The disk is then flipped so that the second side is adjacent to the first head and the first side is adjacent to the second head. Third data is read from the first side. Fourth data is read from the second side. A first area between a curve generated from the first data and a curve generated from the third data is calculated. Likewise, a second area is calculated between a curve generated from the second data and a curve generated from the fourth data. An average of the first and second areas is then calculated and used to detect a defective disk.
    • 一种用于检测用于硬盘驱动器的有缺陷的盘的方法和装置。 该方法包括将盘放入测试器中,使得盘的第一侧与测试器的第一头相邻,并且盘的第二侧与第二头相邻。 从盘的第一侧读取第一数据,从盘的第二侧读取第二数据。 然后将盘翻转,使得第二侧与第一头相邻,并且第一侧与第二头相邻。 从第一侧读取第三数据。 从第二侧读取第四数据。 计算从第一数据生成的曲线与从第三数据生成的曲线之间的第一区域。 类似地,在从第二数据产生的曲线和从第四数据生成的曲线之间计算第二区域。 然后计算第一和第二区域的平均值,并用于检测有缺陷的盘。
    • 3. 发明授权
    • Method of estimating a thermal pole tip protrusion for a head gimbal assembly
    • 估计头部万向节组件的热极尖突起的方法
    • US07089649B2
    • 2006-08-15
    • US10256553
    • 2002-09-26
    • Geng WangHae Jung LeeKeung Youn ChoSang Lee
    • Geng WangHae Jung LeeKeung Youn ChoSang Lee
    • G11B5/127H04R31/00
    • G11B5/3136G11B5/012G11B5/455G11B5/4806G11B5/4833G11B5/484Y10T29/49025Y10T29/49027Y10T29/49028Y10T29/49032Y10T29/49036
    • Thermal pole tip protrusion is caused by materials in and around head slider expanding during write operations till they protrude, leading to contact with the rotating disk surface, altering the flying height and often wearing down part of the disk surface. While well known that read-write heads expand during writing, the inventors who recognized this situation's significance, particularly as flying height decreases and data rates increase, both required for high areal density disk drives. The inventors realized that they could detect the problem at the spin stand level by testing head gimbal assemblies to reliably, and inexpensively, predict the tendency for thermal pole tip protrusion. This leads to selection of head gimbal assemblies, which do not have the thermal pole tip protrusion tendency. The selected head gimbal assemblies have better reliability, as do actuators and disk drives made with the selected head gimbal assemblies.
    • 热敏头尖突起由写入操作期间头部滑块内和周围的材料引起,直到它们突出,导致与旋转盘表面接触,改变飞行高度并经常磨损盘表面的一部分。 虽然众所周知,读写头在写入期间扩展,但是认识到这种情况的重要性的发明人,特别是当高密度磁盘驱动器都需要飞行高度降低和数据速率增加时。 本发明人意识到,它们可以通过测试头万向架组件可靠且廉价地预测热极尖端突起的趋势来检测旋转台水平的问题。 这导致了不具有热极尖突起倾向的头万向节组件的选择。 所选择的头万向架组件具有更好的可靠性,与使用所选择的头万向架组件制造的致动器和磁盘驱动器一样。
    • 6. 发明申请
    • Detection of a defective disk of a hard disk drive
    • 检测硬盘驱动器的故障磁盘
    • US20050117241A1
    • 2005-06-02
    • US10698866
    • 2003-10-30
    • Geng WangSang Lee
    • Geng WangSang Lee
    • G11B5/09G11B20/18G11B27/36
    • G11B27/36G11B20/1816G11B2220/2516
    • A method and apparatus for detecting a defective disk for a hard disk drive. The method includes placing a disk into a tester so that a first side of the disk is adjacent to a first head of the tester and a second side of the disk is adjacent to a second head. First data is read from the first side of the disk, and second data is read from the second side of the disk. The disk is then flipped so that the second side is adjacent to the first head and the first side is adjacent to the second head. Third data is read from the first side. Fourth data is read from the second side. A first area between a curve generated from the first data and a curve generated from the third data is calculated. Likewise, a second area is calculated between a curve generated from the second data and a curve generated from the fourth data. An average of the first and second areas is then calculated and used to detect a defective disk.
    • 一种用于检测用于硬盘驱动器的有缺陷的盘的方法和装置。 该方法包括将盘放入测试器中,使得盘的第一侧与测试器的第一头相邻,并且盘的第二侧与第二头相邻。 从盘的第一侧读取第一数据,从盘的第二侧读取第二数据。 然后将盘翻转,使得第二侧与第一头相邻,并且第一侧与第二头相邻。 从第一侧读取第三数据。 从第二侧读取第四数据。 计算从第一数据生成的曲线与从第三数据生成的曲线之间的第一区域。 类似地,在从第二数据产生的曲线和从第四数据生成的曲线之间计算第二区域。 然后计算第一和第二区域的平均值,并用于检测有缺陷的盘。
    • 7. 发明申请
    • Method for dynamically measuring suspension in-plane and out-plane thermal drift hard disk drives
    • 动态测量悬架平面内和热平面散热硬盘驱动器的方法
    • US20050052766A1
    • 2005-03-10
    • US10658565
    • 2003-09-08
    • Geng WangSang Lee
    • Geng WangSang Lee
    • G11B21/21G11B5/02G11B5/596G11B21/02G11B27/36
    • G11B27/36G11B5/596G11B2220/2516
    • A method for dynamic in-situ characterization of in-plane and out-plane thermal drift of a hard disk drive head suspension is provided. A first data track is written. Amplitude and amplitude modulation of the write data signal are measured and track center is determined. Data tracks are then written for a selected time period. Amplitude and amplitude modulation of the write data signal is measured and a new track center of a last data track is determined. Any difference between the track center of the first data track and the track center of the last data track represents in-plane drift. The amplitude and amplitude modulation of the two write data signals is compared and any difference between the measured values is proportional to out-plane drift.
    • 提供了一种用于硬盘驱动器头悬架的面内和外平面热漂移的动态原位表征的方法。 写入第一条数据轨道。 测量写数据信号的幅度和幅度调制,并确定轨道中心。 然后在选定的时间段内写入数据轨道。 测量写入数据信号的幅度和幅度调制,并确定最后数据轨道的新的轨道中心。 第一数据轨道的轨道中心与最后数据轨道的轨道中心之间的任何差异表示平面内漂移。 比较两个写入数据信号的幅度和幅度调制,并且测量值之间的任何差异与外部平面漂移成比例。
    • 9. 发明授权
    • Multilayer MIM capacitor
    • 多层MIM电容
    • US08962423B2
    • 2015-02-24
    • US13352655
    • 2012-01-18
    • Kangguo ChengJoseph ErvinChengwen PeiRavi M. TodiGeng Wang
    • Kangguo ChengJoseph ErvinChengwen PeiRavi M. TodiGeng Wang
    • H01L21/8242
    • H01L28/40H01L21/32134H01L28/86H01L28/90H01L28/91
    • An improved semiconductor capacitor and method of fabrication is disclosed. A MIM stack, comprising alternating first-type and second-type metal layers (each separated by dielectric) is formed in a deep cavity. The entire stack can be planarized, and then patterned to expose a first area, and selectively etched to recess all first metal layers within the first area. A second selective etch is performed to recess all second metal layers within a second area. The etched recesses can be backfilled with dielectric. Separate electrodes can be formed; a first electrode formed in said first area and contacting all of said second-type metal layers and none of said first-type metal layers, and a second electrode formed in said second area and contacting all of said first-type metal layers and none of said second-type metal layers.
    • 公开了一种改进的半导体电容器和制造方法。 在深空腔中形成MIM叠层,其包括交替的第一和第二类型的金属层(各自被电介质隔开)。 整个堆叠可以被平坦化,然后被图案化以暴露第一区域,并且被选择性地蚀刻以在第一区域内凹陷所有第一金属层。 执行第二选择性蚀刻以在第二区域内凹陷所有第二金属层。 蚀刻的凹槽可以用电介质回填。 可以形成单独的电极; 第一电极,形成在所述第一区域中,并且与所有所述第二类型金属层和所述第一类型金属层接触,并且形成在所述第二区域中并与所有第一类金属层接触的第二电极, 所述第二类金属层。