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    • 6. 发明专利
    • Actinic ray-sensitive or radiation-sensitive resin composition, resist film and pattern-forming method using the same
    • 化学敏感性或辐射敏感性树脂组合物,耐蚀膜和使用其的图案形成方法
    • JP2010256856A
    • 2010-11-11
    • JP2010013681
    • 2010-01-25
    • Fujifilm Corp富士フイルム株式会社
    • ITO TAKAYUKITAKAHASHI HIDETOMOTSUCHIMURA TOMOTAKAKATAOKA SHOHEIINAZAKI TAKESHI
    • G03F7/039C08F212/14C08F220/26G03F7/004H01L21/027
    • G03F7/0002B82Y10/00B82Y40/00G03F7/0045G03F7/0048G03F7/0392G03F7/0397
    • PROBLEM TO BE SOLVED: To provide an actinic ray-sensitive or radiation-sensitive resin composition satisfying high sensitivity, high resolution, good pattern form, good line edge roughness and reduction of outgassing at the same time in a superfine region, in particular, in electron beam, X-ray or EUV ray lithography, and to provide a resist film and a pattern forming method using the resist film. SOLUTION: The actinic ray-sensitive or radiation-sensitive resin composition contains a resin (P) having the following repeating units (A)-(C) and a solvent having a boiling temperature of 150°C or lower. A resist film of the composition and a pattern-forming method using the composition are provided. The repeating units are: (A) a repeating unit containing a group for decomposing and forming an acid upon irradiation with ah actinic ray or radiation; (B) a repeating unit containing a group for decomposing and forming a carboxylic acid by the action of an acid; and (C) a repeating unit containing a carbon-carbon unsaturated bond. COPYRIGHT: (C)2011,JPO&INPIT
    • 要解决的问题:为了提供在超细区域中同时满足高灵敏度,高分辨率,良好图案形式,良好的线边缘粗糙度和减少除气的光化射线敏感或辐射敏感性树脂组合物, 特别地,在电子束,X射线或EUV射线光刻中,并提供使用该抗蚀剂膜的抗蚀剂膜和图案形成方法。 光敏性或辐射敏感性树脂组合物含有具有以下重复单元(A) - (C)的树脂(P)和沸点为150℃以下的溶剂。 提供了组合物的抗蚀剂膜和使用该组合物的图案形成方法。 重复单元是:(A)包含用于在用光化学射线或辐射照射时分解和形成酸的基团的重复单元; (B)含有通过酸的分解和形成羧酸的基团的重复单元; 和(C)含有碳 - 碳不饱和键的重复单元。 版权所有(C)2011,JPO&INPIT