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    • 2. 发明授权
    • Testing a bus coupled between two electronic devices
    • 测试一个耦合在两个电子设备之间的总线
    • US06574758B1
    • 2003-06-03
    • US09522629
    • 2000-03-10
    • Christopher M. Eccles
    • Christopher M. Eccles
    • G06F1100
    • G06F11/273G06F11/263
    • A bus coupled between two circuits (which may be, for example, each implemented as a single chip) is tested by transmitting from a first circuit a predetermined signal on the bus, and recognizing in the second circuit receipt of the predetermined signal. The predetermined signal indicates the beginning of a sequence of test signals that are transmitted therebetween. When any test signal in the sequence is not received correctly, an error signal is generated to specifically identify the test signal that failed, thereby to identify a faulty line in the bus. In one implementation, test signals in the sequence differ each from the other in just the location of a predetermined pattern of bits. For example, a bit pattern 1010 may be located in the beginning, middle or end of three signals of such a sequence. Therefore, in one embodiment, logic in each circuit simply shifts the bits of the predetermined pattern through different positions to obtain the first and second test signals, and such a sequence is called a “walking pattern.”
    • 耦合在两个电路之间的总线(其可以例如被实现为单个芯片)通过从第一电路在总线上发送预定信号并且在第二电路中识别预定信号来进行测试。 预定信号表示在它们之间传输的测试信号序列的开始。 当序列中的任何测试信号未正确接收时,产生错误信号以专门识别失败的测试信号,从而识别总线中的故障线路。 在一个实现中,序列中的测试信号在预定的比特模式的位置中彼此不同。 例如,位模式1010可以位于这种序列的三个信号的开始,中间或结束处。 因此,在一个实施例中,每个电路中的逻辑简单地将预定模式的位移动到不同的位置以获得第一和第二测试信号,并且这样的序列被称为“行走模式”。