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    • 4. 发明申请
    • Semiconductor memory component
    • 半导体存储器组件
    • US20060267082A1
    • 2006-11-30
    • US11438883
    • 2006-05-23
    • Franz HofmannRichard LuykenWolfgang RoesnerMichael SpechtMartin Staedele
    • Franz HofmannRichard LuykenWolfgang RoesnerMichael SpechtMartin Staedele
    • H01L29/76
    • H01L27/108H01L27/10802H01L27/1203
    • A semiconductor memory component comprises at least one memory cell. The memory cell comprises a semiconductor body comprised of a body region, a drain region and a source region, a gate dielectric, and a gate electrode. The body region comprises a first conductivity type and a depression between the source and drain regions, and the source and drain regions comprise a second conductivity type. The gate electrode is arranged at least partly in the depression and is insulated from the body, source, and drain regions by the gate dielectric. The body region further comprises a first continuous region with a first dopant concentration and a second continuous region with a second dopant concentration greater than the first dopant concentration. The first continuous region adjoins the drain region, the depression and the source region, and the second region is arranged below the first region and adjoins the first region.
    • 半导体存储器组件包括至少一个存储单元。 存储单元包括由体区,漏区和源区组成的半导体本体,栅电介质和栅电极。 主体区域包括第一导电类型和源极和漏极区域之间的凹陷,并且源极和漏极区域包括第二导电类型。 栅电极至少部分地布置在凹陷中,并且通过栅极电介质与主体,源极和漏极区绝缘。 体区还包括具有第一掺杂剂浓度的第一连续区域和具有大于第一掺杂剂浓度的第二掺杂剂浓度的第二连续区域。 第一连续区域邻接漏极区域,凹陷部分和源极区域,并且第二区域布置在第一区域下方并与第一区域相邻。