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    • 1. 发明申请
    • METHOD FOR PRODUCING A DEEP TRENCH IN A MICROELECTRONIC COMPONENT SUBSTRATE
    • 在微电子元件基板中生产深层电感的方法
    • US20130052829A1
    • 2013-02-28
    • US13599961
    • 2012-08-30
    • Francois LeverdLaurent FavennecArnaud Tournier
    • Francois LeverdLaurent FavennecArnaud Tournier
    • H01L21/3065
    • H01L21/30655H01L21/76224
    • A method for producing a deep trench in a substrate includes a series of elementary etch cycles each etching a portion of the trench. Each elementary cycle includes deposition of a passivation layer on the sidewalls and the bottom of the trench portion etched during previous cycles; followed by pulsed plasma anisotropic ion etching of the trench portion etched during previous cycles, the etching; being implemented in an atmosphere comprising a passivating species; and including a first etch sequence followed by a second etch sequence of less power than the power of the first etch sequence. The first etch sequence etches the passivation layer deposited in the bottom of the portion so as to access the substrate and etches the free substrate at the bottom of the portion while leaving a passivation layer on sidewalls of the portion.
    • 用于在衬底中制造深沟槽的方法包括一系列基本蚀刻循环,每个蚀刻循环蚀刻沟槽的一部分。 每个基本循环包括在先前循环中蚀刻的沟槽部分的侧壁和底部上沉积钝化层; 随后是在先前循环中蚀刻的沟槽部分的脉冲等离子体各向异性离子蚀刻,蚀刻; 在包括钝化物种的气氛中实施; 并且包括第一蚀刻序列,随后是比第一蚀刻序列的功率小的功率的第二蚀刻序列。 第一蚀刻序列蚀刻沉积在该部分的底部中的钝化层,以便访问该衬底并在该部分的底部蚀刻自由衬底,同时在该部分的侧壁上留下钝化层。
    • 2. 发明授权
    • Method for producing a deep trench in a microelectronic component substrate
    • 微电子元件衬底中深沟槽的制造方法
    • US08796148B2
    • 2014-08-05
    • US13599961
    • 2012-08-30
    • François LeverdLaurent FavennecArnaud Tournier
    • François LeverdLaurent FavennecArnaud Tournier
    • H01L21/311
    • H01L21/30655H01L21/76224
    • A method for producing a deep trench in a substrate includes a series of elementary etch cycles each etching a portion of the trench. Each elementary cycle includes deposition of a passivation layer on the sidewalls and the bottom of the trench portion etched during previous cycles; followed by pulsed plasma anisotropic ion etching of the trench portion etched during previous cycles, the etching; being implemented in an atmosphere comprising a passivating species; and including a first etch sequence followed by a second etch sequence of less power than the power of the first etch sequence. The first etch sequence etches the passivation layer deposited in the bottom of the portion so as to access the substrate and etches the free substrate at the bottom of the portion while leaving a passivation layer on sidewalls of the portion.
    • 用于在衬底中制造深沟槽的方法包括一系列基本蚀刻循环,每个蚀刻循环蚀刻沟槽的一部分。 每个基本循环包括在先前循环中蚀刻的沟槽部分的侧壁和底部上沉积钝化层; 随后是在先前循环中蚀刻的沟槽部分的脉冲等离子体各向异性离子蚀刻,蚀刻; 在包括钝化物种的气氛中实施; 并且包括第一蚀刻序列,随后是比第一蚀刻序列的功率小的功率的第二蚀刻序列。 第一蚀刻序列蚀刻沉积在该部分的底部中的钝化层,以便访问该衬底并在该部分的底部蚀刻自由衬底,同时在该部分的侧壁上留下钝化层。
    • 4. 发明申请
    • Method for fabricating an integrated circuit comprising a photodiode and corresponding integrated circuit
    • 一种用于制造包括光电二极管和相应的集成电路的集成电路的方法
    • US20060244090A1
    • 2006-11-02
    • US11400728
    • 2006-04-07
    • Francois RoyArnaud TournierYann Marcellier
    • Francois RoyArnaud TournierYann Marcellier
    • H01L31/06
    • H01L21/26586H01L27/14609H01L27/14643H01L31/0352
    • An integrated circuit includes a photodiode produced from the formation of a stack of three semiconductor layers. An overdoped storage zone is formed in a second (middle) layer of the stack. A read transistor connected to the photodiode includes a gate formed above the stack and source/drain regions formed in a third (upper) layer of the stack. A first (bottom) layer of the stack forms a floating substrate. During integrated circuit fabrication, an implantation mask is placed above the gate and the stack having an opening which exposes a part of the gate and a part of the upper surface of the stack lying beside the exposed part of the gate. An oblique implantation of dopants is then made through the opening in the mask to form the storage zone such that it is at least partially located underneath the gate area of the read transistor.
    • 集成电路包括由三层半导体层的堆叠形成的光电二极管。 在堆叠的第二(中间)层中形成过量的储存区。 连接到光电二极管的读取晶体管包括形成在堆叠上方的栅极和形成在堆叠的第三(上))层中的源极/漏极区域。 堆叠的第一(底部)层形成浮动衬底。 在集成电路制造期间,将注入掩模放置在栅极上方,并且堆叠具有露出栅极的一部分并且堆叠的上表面的一部分位于栅极的暴露部分旁边的开口。 然后通过掩模中的开口进行掺杂剂的倾斜注入以形成存储区,使得其至少部分地位于读取晶体管的栅极区域的下方。
    • 10. 发明授权
    • Integrated photodiode of the floating substrate type
    • 浮动基板类型的集成光电二极管
    • US07777289B2
    • 2010-08-17
    • US11432678
    • 2006-05-10
    • François RoyArnaud Tournier
    • François RoyArnaud Tournier
    • H01L27/146
    • H01L27/14609H01L27/1443
    • An integrated circuit includes at least one photodiode of the floating substrate type which is associated with a read transistor. The photodiode is formed from a buried layer lying beneath the floating substrate and an upper layer lying on the floating substrate. The upper layer incorporates the source and drain regions of the read transistor. The source and drain regions are produced on either side of the gate of the read transistor. An isolating trench is located alongside the source region and extends from the upper surface of the upper layer down to below the buried layer, so as to isolate the source region from said buried layer.
    • 集成电路包括与读取晶体管相关联的浮置衬底类型的至少一个光电二极管。 光电二极管由位于浮置衬底之下的掩埋层和位于浮动衬底上的上层形成。 上层结合读取晶体管的源极和漏极区域。 源极和漏极区域在读取晶体管的栅极的任一侧上产生。 隔离沟槽位于源极区旁边,并从上层的上表面向下延伸到掩埋层的下方,从而将源极区域与掩埋层隔离。