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    • 1. 发明授权
    • Low leakage asymmetric SRAM cell devices
    • 低泄漏非对称SRAM单元器件
    • US07307905B2
    • 2007-12-11
    • US10524319
    • 2003-08-08
    • Farid N. NajmNavid AziziAndreas Moshovos
    • Farid N. NajmNavid AziziAndreas Moshovos
    • G11C7/00G11C11/00
    • G11C7/067G11C7/062G11C11/412
    • Asymmetric SRAM cell designs exploiting data storage patterns found in ordinary software programs wherein most of the bits stored are zeroes for data and instruction streams. The asymmetric SRAM cell designs offer lower leakage power with little impact on latency. In asymmetric SRAM cells, selected transistors are “weakened” to reduce leakage current when the cell is storing a zero. Transistor weakening may be achieved by using higher voltage threshold transistors, by varying transistor geometries, or other means. In addition, a novel sense amplifier design is provided that leverages the asymmetric nature of the asymmetric SRAM cells to offer cell read times that are comparable with conventional symmetric SRAM cells. Lastly, cache memory designs are provided that are based on asymmetric SRAM cells offering leakage power reduction while maintaining high performance, comparable noise margins, and stability with respect to conventional cache memories.
    • 非对称SRAM单元设计利用在普通软件程序中发现的数据存储模式,其中存储的大部分位为零,用于数据和指令流。 非对称SRAM单元设计提供较低的漏电功率,对延迟影响不大。 在非对称SRAM单元中,当单元存储零时,所选择的晶体管被​​“削弱”以减少泄漏电流。 可以通过使用较高电压阈值晶体管,通过改变晶体管几何形状或其他方式来实现晶体管弱化。 此外,提供了一种新颖的读出放大器设计,其利用非对称SRAM单元的非对称特性来提供与常规对称SRAM单元相当的单元读取时间。 最后,提供基于非对称SRAM单元的缓存存储器设计,其提供泄漏功率降低,同时保持高性能,可比较的噪声容限和相对于常规高速缓冲存储器的稳定性。