专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明专利

AU2003237195A8 High performance probe system for testing semiconductor wafers 未知
公开(公告)号：AU2003237195A8
公开(公告)日：2003-12-12
申请号：AU2003237195
申请日：2003-05-07
申请人： FORMFACTOR INC
发明人： MILLER CHARLES A , CHRAFT MATTHEW E , TSENG CHIH-CHIANG , HENSON ROY J
IPC分类号： G01R31/26 , G01R1/073 , G01R3/00 , H01L21/66 , G01R31/316
摘要： A probe system for providing signal paths between an integrated circuit (IC) tester and input/output, power and ground pads on the surfaces of ICs to be tested includes a probe board assembly, a flex cable and a set of probes arranged to contact the IC's I/O pads. The probe board assembly includes one or more rigid substrate layers with traces and vias formed on or within the substrate layers providing relatively low bandwidth signal paths linking the tester to probes accessing some of the IC's pads. The flex cable provides relatively high bandwidth signal paths linking the tester to probes accessing others of the IC's pads. A flex strip may alternatively be disposed behind a substrate with probes.

2. 发明专利

AU2003237195A1 HIGH PERFORMACE PROBE SYSTEM 未知
公开(公告)号：AU2003237195A1
公开(公告)日：2003-12-12
申请号：AU2003237195
申请日：2003-05-07
申请人： FORMFACTOR INC
发明人： CHRAFT MATTHEW E , HENSON ROY J , MILLER CHARLES A , TSENG CHIH-CHIANG
IPC分类号： G01R31/26 , G01R1/073 , G01R3/00 , H01L21/66 , G01R31/316
摘要： A probe system for providing signal paths between an integrated circuit (IC) tester and input/output, power and ground pads on the surfaces of ICs to be tested includes a probe board assembly, a flex cable and a set of probes arranged to contact the IC's I/O pads. The probe board assembly includes one or more rigid substrate layers with traces and vias formed on or within the substrate layers providing relatively low bandwidth signal paths linking the tester to probes accessing some of the IC's pads. The flex cable provides relatively high bandwidth signal paths linking the tester to probes accessing others of the IC's pads. A flex strip may alternatively be disposed behind a substrate with probes.

3. 发明申请

WO2008070466A3 SHARING RESOURCES IN A SYSTEM FOR TESTING SEMICONDUCTOR DEVICES 审中-公开
标题翻译：在测试半导体器件的系统中共享资源
公开(公告)号：WO2008070466A3
公开(公告)日：2008-11-06
申请号：PCT/US2007085483
申请日：2007-11-25
申请人： FORMFACTOR INC , CHRAFT MATTHEW E , ELDRIDGE BENJAMIN N , HENSON ROY J , SPORCK A NICHOLAS
发明人： CHRAFT MATTHEW E , ELDRIDGE BENJAMIN N , HENSON ROY J , SPORCK A NICHOLAS
IPC分类号： G01R31/02
CPC分类号： G01R31/31926 , G01R31/318511
摘要： Probes in a plurality of DUT probe groups can be connected in parallel to a single tester channel. In one aspect, digital potentiometers can be used to effectively switch the tester channel from a probe in one DUT probe group to a probe in another DUT probe group. In another aspect, switches in parallel with a resistor can accomplish such switching. In yet another aspect, a chip select terminal on each DUT can be used to effectively connect and disconnect internal DUT circuitry to the tester channel. Multiple DUT probe groups so connected can be used to create different patterns of DUT probe groups for testing different patterns of DUTs and thus facilitate sharing tester channels.
摘要翻译：多个DUT探针组中的探针可以并行连接到单个测试器通道。在一个方面，可以使用数字电位计来有效地将测试器通道从一个DUT探针组中的探针切换到另一个DUT探针组中的探针。另一方面，与电阻器并联的开关可以完成这种切换。在又一方面，每个DUT上的芯片选择端子可以用于有效连接和断开内部DUT电路与测试器通道的连接。如此连接的多个DUT探针组可用于创建不同模式的DUT探针组，以测试不同DUT的模式，从而便于共享测试器通道。

4. 发明申请

WO2007146583A3 METHOD OF DESIGNING AN APPLICATION SPECIFIC PROBE CARD TEST SYSTEM 审中-公开
标题翻译：设计应用特定探头卡测试系统的方法
公开(公告)号：WO2007146583A3
公开(公告)日：2009-02-26
申请号：PCT/US2007069810
申请日：2007-05-25
申请人： FORMFACTOR INC , MILLER CHARLES A , CHRAFT MATTHEW E , HENSON ROY J
发明人： MILLER CHARLES A , CHRAFT MATTHEW E , HENSON ROY J
IPC分类号： G01R31/02 , G01R1/073 , G01R1/36 , G01R31/28 , G01R31/319 , G01R35/00
CPC分类号： G01R31/31905 , G01R31/2889 , G01R31/31926 , G01R35/00
摘要： A method is provided for design and programming of a probe card with an on-board programmable controller in a wafer test system. Consideration of introduction of the programmable controller is included in a CAD wafer layout and probe card design process. The CAD design is further loaded into the programmable controller, such as an FPGA to program it: (1) to control direction of signals to particular ICs , even during the test process (2) to generate test vector signals to provide to the ICs , and (3) to receive test signals and process test results from the received signals. In some embodiments, burn-in only testing is provided to limit test system circuitry needed so that with a programmable controller on the probe card, text equipment external to the probe card can be eliminated or significantly reduced from conventional test equipment.
摘要翻译：提供了一种用于在晶片测试系统中设计和编程具有板上可编程控制器的探针卡的方法。引入可编程控制器的考虑因素包括在CAD晶圆布局和探针卡设计过程中。 CAD设计进一步加载到可编程控制器（例如FPGA）中以对其进行编程：（1）甚至在测试过程（2）期间控制信号到特定IC的方向，以产生测试向量信号以提供给IC，和（3）从接收信号接收测试信号和处理测试结果。在一些实施例中，仅提供老化测试以限制所需的测试系统电路，使得利用探针卡上的可编程控制器，可以从常规测试设备消除或显着减少探针卡外部的文本设备。

5. 发明申请

WO2005103740A3 INTELLIGENT PROBE CARD ARCHITECTURE 审中-公开
标题翻译：智能探针卡建筑
公开(公告)号：WO2005103740A3
公开(公告)日：2006-06-29
申请号：PCT/US2005013850
申请日：2005-04-21
申请人： FORMFACTOR INC , MILLER CHARLES A , CHRAFT MATTHEW E , HENSON ROY J
发明人： MILLER CHARLES A , CHRAFT MATTHEW E , HENSON ROY J
IPC分类号： G01R31/02 , G01R1/073 , G01R1/36 , G01R29/00 , G01R31/26 , G01R31/28 , G01R31/319 , G01R35/00 , H01L21/66 , H01R11/18 , H01R13/00 , H01R13/24
CPC分类号： G01R31/31905 , G01R1/07385 , G01R1/36 , G01R31/2889 , G01R35/00
摘要： A probe card for a wafer test system is provided with a number of on board features enabling fan out of a test system controller channel to test multiple DUTs on a wafer, while limiting undesirable effects of fan out on test results. On board features of the probe card include one or more of the following: (a) DUT signal isolation provided by placing resistors in series with each DUT input to isolate failed DUTs; (b) DUT power isolation provided by switches, current limiters, or regulators in series with each DUT power pin to isolate the power supply from failed DUTs; (c) self test provided using an on board micro-controller or FPGA; (d) stacked daughter cards provided as part of the probe card to accommodate the additional on board test circuitry; and (e) use of a interface bus between a base PCB and daughter cards of the probe card, or the test system controller to minimize the number of interface wires between the base PCB and daughter cards or between the base PCB and the test system controller.
摘要翻译：用于晶片测试系统的探针卡具有多个板上特征，使扇出测试系统控制器通道以测试晶片上的多个DUT，同时限制扇出对测试结果的不期望的影响。探头卡的板载功能包括以下一个或多个功能：（a）通过将电阻器与每个DUT输入串联放置来隔离故障DUT提供的DUT信号隔离; （b）与每个DUT电源引脚串联的开关，限流器或稳压器提供的DUT电源隔离，以将电源与失效的DUT隔离; （c）使用板上微控制器或FPGA提供的自检; （d）作为探针卡的一部分提供的堆叠子卡，以适应额外的板上测试电路; 和（e）在基板PCB和探针卡的子卡之间使用接口总线或测试系统控制器以最小化基板PCB和子卡之间或基板和测试系统控制器之间的接口线的数量。

6. 发明公开

EP2092355A4 SHARING RESOURCES IN A SYSTEM FOR TESTING SEMICONDUCTOR DEVICES 审中-公开
标题翻译：公共资源的系统中使用用于测试半导体组件
公开(公告)号：EP2092355A4
公开(公告)日：2012-06-06
申请号：EP07864757
申请日：2007-11-25
申请人： FORMFACTOR INC
发明人： CHRAFT MATTHEW E , ELDRIDGE BENJAMIN N , HENSON ROY J , SPORCK A NICHOLAS
IPC分类号： G01R31/319 , G01R31/3185
CPC分类号： G01R31/31926 , G01R31/318511

7. 发明公开

EP1743182A4 INTELLIGENT PROBE CARD ARCHITECTURE 审中-公开
标题翻译： SMART CARD针架构
公开(公告)号：EP1743182A4
公开(公告)日：2010-03-10
申请号：EP05749910
申请日：2005-04-21
申请人： FORMFACTOR INC
发明人： MILLER CHARLES A , CHRAFT MATTHEW E , HENSON ROY J
IPC分类号： G01R31/02 , G01R1/073 , G01R1/36 , G01R31/28 , G01R31/319 , G01R35/00
CPC分类号： G01R31/31905 , G01R1/07385 , G01R1/36 , G01R31/2889 , G01R35/00

8. 发明公开

EP2032998A4 METHOD OF DESIGNING AN APPLICATION SPECIFIC PROBE CARD TEST SYSTEM 审中-公开
标题翻译： VERFAHRENFÜRDEN ENTWURF EINES ANWENDUNGSSPEZIFISCHEN NADELKARTENTESTSYSTEMS
公开(公告)号：EP2032998A4
公开(公告)日：2013-09-11
申请号：EP07797802
申请日：2007-05-25
申请人： FORMFACTOR INC
发明人： MILLER CHARLES A , CHRAFT MATTHEW E , HENSON ROY J
IPC分类号： G01R31/02 , G01R1/073 , G01R1/36 , G01R31/28 , G01R31/319 , G01R35/00
CPC分类号： G01R31/31905 , G01R31/2889 , G01R31/31926 , G01R35/00

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式