会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 3. 发明专利
    • TESTING HEAD FOR MICROSTRUCTURE WITH INTERFACE
    • JPH11248745A
    • 1999-09-17
    • JP31451998
    • 1998-11-05
    • FEINMETALL GMBH
    • SCHMITT REINERGIRINGER KLAUSGAUSS ULRICHDEUSCH HEINZ
    • G01R1/06G01R1/073H01L21/66
    • PROBLEM TO BE SOLVED: To arrange a plurality of spring elastic elongated electric contact elements tightly and to permit easy replacement by bringing their one ends into contact with test points and their other ends into contact with contacts and laterally shifting each contact element of the contact elements so as to support each contact element in a frictionally fixed state. SOLUTION: Contact elements 25 come into contact with both of the test points 3 of a testing component 5 and the contact points 31 of a printed circuit board 11 at the operating location of a contact maker 7. As a result of the relative movement between the contact maker 7 and the testing component 5, the contact elements 25 are displaced in the opening 23 of guide panels 19 and 21. As the opening 23 of the guide panel 21 is arranged at a displaced location, the contact elements 25 are further deformed and displaced with respect to the pin-shaped contact elements 25. The restoring force of the contact elements 25 due to their elasticity in a predetermined state presses the contact elements 25 against the test points 3 of the testing component 5 and the contact points 31 of the circuit board 11 via contact tip parts 25, and low electric contact resistance is consequently obtained. Therefore, it is possible to test the mutual continuity and insulation performance of the test points 3 and to test the functions of the testing component 5.