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    • 10. 发明授权
    • Close proximity material interface detection for a microwave level transmitter
    • 用于微波级发射器的近距离材料接口检测
    • US06445192B1
    • 2002-09-03
    • US09542677
    • 2000-04-04
    • Eric R. LovegrenDavid L. Pederson
    • Eric R. LovegrenDavid L. Pederson
    • G01R2704
    • G01S7/292G01F23/284
    • A method for detecting the presence of a twin peak pulse in a waveform, generated by a microwave level transmitter, that is used to detect levels of first and second material interfaces relating to materials contained in a tank. The waveform develops a twin peak pulse when the first and second material interfaces are in close proximity to one another. The twin peak pulse contains overlapping first and second received wave pulses reflected from the first and second material interfaces, respectively. The method determines that the waveform contains a twin peak pulse when both a first peak point relating to the first received wave pulse and a valley are detected. A microwave level transmitter having an interface detection module that is configured to use the method of the present invention to detect the existence of a twin peak pulse in a waveform.
    • 一种用于检测由微波级发射器产生的波形中双峰脉冲的存在的方法,其用于检测与容纳在容器中的材料相关的第一和第二材料界面的水平。 当第一和第二材料界面彼此靠近时,波形产生双峰脉冲。 双峰脉冲分别包含从第一和第二材料界面反射的重叠的第一和第二接收波脉冲。 当检测到与第一接收波脉冲相关的第一峰值点和谷值时,该方法确定波形包含双峰脉冲。 一种具有接口检测模块的微波级发射机,其配置为使用本发明的方法来检测波形中双峰脉冲的存在。