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1. 发明申请

US20080088010A1 ELECTRONIC DEVICE WITH INTEGRATED MICROMECHANICAL CONTACTS AND COOLING SYSTEM 失效
标题翻译：具有集成微机械接触和冷却系统的电子设备
公开(公告)号：US20080088010A1
公开(公告)日：2008-04-17
申请号：US11548668
申请日：2006-10-11
申请人： Eric D. Hobbs , Gaetan Mathieu
发明人： Eric D. Hobbs , Gaetan Mathieu
IPC分类号： H01L23/34
CPC分类号： H01L23/34 , B81B7/0006 , B81B7/0093 , H01L23/473 , H01L2924/0002 , H01L2924/14 , H01L2924/19041 , H01L2924/00
摘要： An electronic device can comprise a semiconductor die on which can be formed a micromechanical system. The micromechanical system can comprise a plurality of electrically conductive elongate, contact structures, which can be disposed on input and/or output terminals of the semiconductor die. The micromechanical system can also comprise a cooling structure disposed on the semiconductor die.
摘要翻译：电子设备可以包括其上可以形成微机械系统的半导体管芯。微机械系统可以包括多个导电细长的接触结构，其可以设置在半导体管芯的输入和/或输出端子上。微机械系统还可以包括设置在半导体管芯上的冷却结构。

2. 发明授权

US09702904B2 Non-linear vertical leaf spring 有权
公开(公告)号：US09702904B2
公开(公告)日：2017-07-11
申请号：US13288925
申请日：2011-11-03
申请人： Keith J. Breinlinger , Benjamin N. Eldridge , Eric D. Hobbs , Michael J. Armstrong , John K. Gritters
发明人： Keith J. Breinlinger , Benjamin N. Eldridge , Eric D. Hobbs , Michael J. Armstrong , John K. Gritters
IPC分类号： G01R1/067 , H01R13/24 , G01R1/073 , H01R43/16
CPC分类号： G01R1/06716 , G01R1/06733 , G01R1/07357 , H01R13/2407 , H01R43/16 , Y10T29/49204
摘要： An electrically conductive contact element can include a first base and a second base with elongate, spaced apart leaves between the bases. A first end of each leaf can be coupled to the first base and an opposite second end of the leaf can be coupled to the second base. A body of the leaf between the first end and the second end can be sufficiently elongate to respond to a force through said contact element substantially parallel with the first axis and the second axis by first compressing axially while said force is less than a buckling force and then bending while said force is greater than the buckling force.

3. 发明申请

US20120146679A1 PROBE CARD STIFFENER WITH DECOUPLING 有权
标题翻译：探头卡头加强器
公开(公告)号：US20120146679A1
公开(公告)日：2012-06-14
申请号：US12967302
申请日：2010-12-14
申请人： Kevin S. Chang , Eric D. Hobbs
发明人： Kevin S. Chang , Eric D. Hobbs
IPC分类号： G01R31/00
CPC分类号： G01R1/07378 , G01R31/2891
摘要： A stiffener for a probe card assembly can include decoupling mechanisms disposed within radial arms of the stiffener. The decoupling mechanisms can be compliant in a direction along a radial direction of said radial arm and rigid in a direction perpendicular to said radial arm. The decoupling mechanisms can decouple the stiffener from thermally induced differential radial contraction and expansion of the stiffener relative to the cardholder to which the stiffener is mounted. This can reduce thermally-induced vertical translation of the probe card assembly.
摘要翻译：用于探针卡组件的加强件可以包括设置在加强件的径向臂内的去耦机构。去耦机构可以沿着所述径向臂的径向的方向并且在垂直于所述径向臂的方向上是刚性的。解耦机构可以将加强件与加热元件相对于加强件安装到的卡座上的热引起的差分径向收缩和膨胀相分离。这可以减少探针卡组件的热诱导垂直平移。

4. 发明申请

US20110128029A1 STIFFENER ASSEMBLY FOR USE WITH TESTING DEVICES 有权
标题翻译：强化装置与测试装置一起使用
公开(公告)号：US20110128029A1
公开(公告)日：2011-06-02
申请号：US13022443
申请日：2011-02-07
申请人： Eric D. Hobbs , Andrew W. McFarland
发明人： Eric D. Hobbs , Andrew W. McFarland
IPC分类号： G01R31/00
CPC分类号： G01R1/07378
摘要： A stiffener assembly for use with testing devices is provided herein. In some embodiments, a stiffener assembly for use with testing devices can be part of a probe card assembly that can include a stiffener assembly comprising an upper stiffener coupled to a plurality of lower stiffeners; and a substrate constrained between the upper stiffener and the plurality of lower stiffeners, the stiffener assembly restricting non-planar flex of the substrate while facilitating radial movement of the substrate with respect to the stiffener assembly.
摘要翻译：本文提供了一种与测试装置一起使用的加强装置。在一些实施例中，用于与测试装置一起使用的加强件组件可以是探针卡组件的一部分，其可以包括加强件组件，该加强件组件包括联接到多个下加强件的上加强件; 以及限制在所述上加强件和所述多个下加强件之间的衬底，所述加强件组件限制所述衬底的非平面弯曲，同时促进所述衬底相对于所述加强件组件的径向移动。

5. 发明授权

US07884627B2 Stiffener assembly for use with testing devices 有权
标题翻译：用于测试装置的加强装置
公开(公告)号：US07884627B2
公开(公告)日：2011-02-08
申请号：US11860406
申请日：2007-09-24
申请人： Eric D. Hobbs , Andrew W. McFarland
发明人： Eric D. Hobbs , Andrew W. McFarland
IPC分类号： G01R31/02
CPC分类号： G01R1/07378
摘要： A stiffener assembly for use with testing devices is provided herein. In some embodiments, a stiffener assembly for use with testing devices can be part of a probe card assembly that can include a stiffener assembly comprising an upper stiffener coupled to a plurality of lower stiffeners; and a substrate constrained between the upper stiffener and the plurality of lower stiffeners, the stiffener assembly restricting non-planar flex of the substrate while facilitating radial movement of the substrate with respect to the stiffener assembly.
摘要翻译：本文提供了一种与测试装置一起使用的加强装置。在一些实施例中，用于与测试装置一起使用的加强件组件可以是探针卡组件的一部分，其可以包括加强件组件，该加强件组件包括联接到多个下加强件的上加强件; 以及限制在所述上加强件和所述多个下加强件之间的衬底，所述加强件组件限制所述衬底的非平面弯曲，同时促进所述衬底相对于所述加强件组件的径向移动。

6. 发明授权

US07845072B2 Method and apparatus for adjusting a multi-substrate probe structure 失效
标题翻译：用于调整多基板探针结构的方法和装置
公开(公告)号：US07845072B2
公开(公告)日：2010-12-07
申请号：US12343260
申请日：2008-12-23
申请人： Eric D. Hobbs , Benjamin N. Eldridge , Lunyu Ma , Gaetan L. Mathieu , Steven T. Murphy , Makarand S. Shinde , Alexander H. Slocum
发明人： Eric D. Hobbs , Benjamin N. Eldridge , Lunyu Ma , Gaetan L. Mathieu , Steven T. Murphy , Makarand S. Shinde , Alexander H. Slocum
IPC分类号： H05K3/30
CPC分类号： G01R31/2886 , G01R1/073 , G01R31/31905 , Y10T29/49128 , Y10T29/4913 , Y10T29/49133 , Y10T29/49147 , Y10T29/49208 , Y10T29/49222
摘要： A probe card assembly comprises multiple probe substrates attached to a mounting assembly. Each probe substrate includes a set of probes, and together, the sets of probes on each probe substrate compose an array of probes for contacting a device to be tested. Adjustment mechanisms are configured to impart forces to each probe substrate to move individually each substrate with respect to the mounting assembly. The adjustment mechanisms may translate each probe substrate in an “x,” “y,” and/or “z” direction and may further rotate each probe substrate about any one or more of the forgoing directions. The adjustment mechanisms may further change a shape of one or more of the probe substrates. The probes can thus be aligned and/or planarized with respect to contacts on the device to be tested.
摘要翻译：探针卡组件包括附接到安装组件的多个探针基板。每个探针衬底包括一组探针，并且每个探针衬底上的探针组合在一起组成一组探针，用于接触待测试的器件。调整机构构造成赋予每个探针基板以相对于安装组件分别移动每个基板的力。调节机构可以将每个探针基板转换成“x”，“y”和/或“z”方向，并且可以进一步围绕前述方向上的任何一个或多个旋转每个探针基板。调节机构可以进一步改变一个或多个探针基板的形状。因此，探针可以相对于要测试的装置上的触点对准和/或平坦化。

7. 发明申请

US20100264949A1 FLEXURE BAND AND USE THEREOF IN A PROBE CARD ASSEMBLY 审中-公开
标题翻译：柔性带及其在探针卡组件中的应用
公开(公告)号：US20100264949A1
公开(公告)日：2010-10-21
申请号：US12423927
申请日：2009-04-15
申请人： Eric D. Hobbs
发明人： Eric D. Hobbs
IPC分类号： G01R31/02 , G01R1/073
CPC分类号： G01R31/2889 , G01R31/2891
摘要： A flexure band can comprise structures configured to have elastic properties. Such a band can be stretched but will return generally to its original shape after forces that stretched the band are removed. The flexure band can hold one or more temperature control devices against a peripheral edge of a stiffening frame in a probe card assembly, or the flexure band can itself be a temperature control device. The band can be made of a metal that can be selected to impart one or more of the following properties: low thermal conductivity, high specific heat, generates little to no appreciable contamination, and/or usable over a wide range of temperatures. A material can be added to the band as a full or partial coating that enhances or adds one or more of the above-mentioned possible properties of the metal band.
摘要翻译：弯曲带可以包括构造成具有弹性特性的结构。这样的带可以被拉伸，但是在拉伸带的力被去除之后通常将返回到其原始形状。挠曲带可以将一个或多个温度控制装置保持在探针卡组件中的加强框架的周边边缘上，或者挠曲带本身可以是温度控制装置。带可以由可以选择以赋予以下特性中的一种或多种的金属制成：低导热性，高比热，几乎不产生明显的污染，和/或可在宽的温度范围内使用。可以将材料作为增强或增加金属带的上述可能性质中的一种或多种的全部或部分涂层添加到带中。

8. 发明授权

US07732975B1 Biased gap-closing actuator 有权
标题翻译：偏置间隙关闭致动器
公开(公告)号：US07732975B1
公开(公告)日：2010-06-08
申请号：US12345292
申请日：2008-12-29
申请人： Eric D. Hobbs , Gaetan L. Mathieu
发明人： Eric D. Hobbs , Gaetan L. Mathieu
IPC分类号： H02N1/00
CPC分类号： H02N1/006
摘要： A gap-closing actuator includes a stator having one or more first electrodes, a mover having one or more second electrodes interposed among the first electrodes, and a biasing mechanism for applying a non-capacitive bias to the mover for urging the mover to move in a desired direction with respect to the stator. The non-capacitive bias is different from a capacitive force generated between the first and second electrodes when the gap-closing actuator is in operation.
摘要翻译：间隙关闭致动器包括具有一个或多个第一电极的定子，具有插入在第一电极中的一个或多个第二电极的移动器，以及用于向移动器施加非电容性偏压以推动移动器移动的偏置机构相对于定子的期望方向。当间隙关闭致动器运行时，非电容性偏压不同于在第一和第二电极之间产生的电容性力。

9. 发明授权

US07671614B2 Apparatus and method for adjusting an orientation of probes 失效
标题翻译：用于调整探针取向的装置和方法
公开(公告)号：US07671614B2
公开(公告)日：2010-03-02
申请号：US11164737
申请日：2005-12-02
申请人： Benjamin N. Eldridge , Eric D. Hobbs , Gaetan L. Mathieu , Makarand S. Shinde , Alexander H. Slocum
发明人： Benjamin N. Eldridge , Eric D. Hobbs , Gaetan L. Mathieu , Makarand S. Shinde , Alexander H. Slocum
IPC分类号： G01R31/02
CPC分类号： G01R31/2891 , G01R31/31905
摘要： Probes of a probe card assembly can be adjusted with respect to an element of the probe card assembly, which can be an element of the probe card assembly that facilitates mounting of the probe card assembly to a test apparatus. The probe card assembly can then be mounted in a test apparatus, and an orientation of the probe card assembly can be adjusted with respect to the test apparatus, such as a structural part of the test apparatus or a structural element attached to the test apparatus.
摘要翻译：可以相对于探针卡组件的元件调整探针卡组件的探针，探针卡组件可以是探针卡组件的元件，其有助于将探针卡组件安装到测试装置。然后可以将探针卡组件安装在测试装置中，并且可以相对于测试装置（例如测试装置的结构部分或连接到测试装置的结构元件）来调整探针卡组件的取向。

10. 发明申请

US20080231258A1 STIFFENING CONNECTOR AND PROBE CARD ASSEMBLY INCORPORATING SAME 审中-公开
标题翻译：加固连接器和探头卡组合
公开(公告)号：US20080231258A1
公开(公告)日：2008-09-25
申请号：US11690139
申请日：2007-03-23
申请人： Eric D. Hobbs , Gaetan L. Mathieu
发明人： Eric D. Hobbs , Gaetan L. Mathieu
IPC分类号： G01R1/06
CPC分类号： G01R31/2889 , G01R1/07342
摘要： A stiffening connector assembly and methods of use are provided herein. In some embodiments a stiffening connector assembly includes a connector configured to be coupled to a substrate; and a mechanism coupled to the connector and configured to restrict rotational movement of the connector with respect to the substrate when coupled thereto. The mechanism may further provide a lateral degree of freedom of movement in a direction substantially parallel to the substrate.
摘要翻译：本文提供了加强连接器组件和使用方法。在一些实施例中，加强连接器组件包括被配置为联接到基板的连接器; 以及耦合到所述连接器并且被配置为当连接到所述连接器时相对于所述基板限制所述连接器的旋转运动的机构。该机构还可以在基本上平行于基底的方向上提供横向移动自由度。

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