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1. 发明申请

WO2016038080A1 METHOD AND SYSTEM FOR TESTING AN ELECTRONIC UNIT 审中-公开
标题翻译：用于测试电子单元的方法和系统
公开(公告)号：WO2016038080A1
公开(公告)日：2016-03-17
申请号：PCT/EP2015/070591
申请日：2015-09-09
申请人： ENICS AG
发明人： FEDERLEY, Kristian , MATTILA, Jukka
IPC分类号： G01R31/28
CPC分类号： G01R31/2834 , G01R31/2839 , G01R31/31703
摘要： The method and system of the invention are intended for testing an electronic unit (3b) by feeding one or more predefined signal shapes created by a signal generator (1 ) of the system as input signals to a known functioning unit (3a) and to a unit to be tested (3b) at corresponding test points (10a, 10b). The resulting signal shapes are measured with a measuring instrument (4) of the system from both units (3a, 3b) at corresponding measurement points (8d, 8e, 8f and 8g, 8h, 8i) simultaneously or separately. At least one resulting signal shape from the good unit (3a) is then compared with the corresponding resulting signal shape from the unit to be tested (3b). A fault in the unit to be tested (3b) is detected on the basis of an existing signal shape distortion in time axis of the resulting signal shape received from the unit to be tested. The electronic unit under test (3b)is comprised in the system simultaneously or interchangeably with the electronic functioning unit (3a). The resulting signal shape is presented by transforming it into discrete values that describe the signal shape. The computer program product of the invention executes the method steps when run in computer readable media in the system. The method of the invention is used for electronics production testing, fault identification in electronics repair, component testing in manufacturing and repair, or counterfeit component identification.
摘要翻译：本发明的方法和系统旨在通过将由系统的信号发生器（1）创建的一个或多个预定义的信号形状作为输入信号馈送到已知的功能单元（3a）来测试电子单元（3b），并且在相应的测试点（10a，10b）处要测试的单元（3b）。所产生的信号形状用系统的测量仪器（4）从相应的测量点（8d，8e，8f和8g，8h，8i）同时或分开地从两个单元（3a，3b）测量。然后将来自良好单元（3a）的至少一个所得到的信号形状与来自待测试单元（3b）的相应的结果信号形状进行比较。基于从被测单元接收到的结果信号形状的时间轴上的现有信号形状失真，检测待测单元（3b）中的故障。被测电子单元（3b）与电子功能单元（3a）同时或互换地包含在系统中。通过将其变换成描述信号形状的离散值来呈现所得到的信号形状。本发明的计算机程序产品在系统中的计算机可读介质中运行时执行方法步骤。本发明的方法用于电子生产测试，电子维修中的故障识别，制造和维修中的部件测试或假冒部件识别。

2. 发明公开

EP3191856A1 METHOD AND SYSTEM FOR TESTING AN ELECTRONIC UNIT 有权转让
标题翻译：用于测试电子单元的方法和系统
公开(公告)号：EP3191856A1
公开(公告)日：2017-07-19
申请号：EP15760196.4
申请日：2015-09-09
申请人： Enics AG
发明人： FEDERLEY, Kristian , MATTILA, Jukka
IPC分类号： G01R31/28
CPC分类号： G01R31/2834 , G01R31/2839 , G01R31/31703
摘要： A method of testing an electronic unit by comparing resulting signal shapes from the unit to be tested and a known functioning unit. The method includes powering off the units for testing and feeding one or more predefined signal shapes of two or more different frequencies as input signals to the known functioning unit and to the unit to be tested at corresponding test points. The method further includes measuring the resulting signal shapes from both units at corresponding measurement points and comparing at least one resulting signal shape from the known functioning unit with the corresponding resulting signal shape from the unit to be tested. The method also includes detecting a fault in the unit to be tested on the basis of an existing signal shape distortion in time axis of the resulting signal shape received from the unit to be tested.
摘要翻译：本发明的方法和系统旨在通过将由系统的信号发生器（1）创建的一个或多个预定义的信号形状作为输入信号馈送到已知的功能单元（3a）和用于测试电子单元待测试单元（3b）在相应的测试点（10a，10b）。在相应的测量点（8d，8e，8f和8g，8h，8i）同时或分开地用系统的测量仪器（4）从两个单元（3a，3b）测量得到的信号形状。然后将来自良品单元（3a）的至少一个结果信号形状与来自待测试单元（3b）的相应结果信号形状进行比较。基于从待测试单元接收的所得信号形状在时间轴上的现有信号形状失真来检测待测试单元（3b）中的故障。被测电子单元（3b）与电子功能单元（3a）同时或可互换地包含在系统中。所得到的信号形状通过将其转换为描述信号形状的离散值来呈现。当在系统中的计算机可读介质中运行时，本发明的计算机程序产品执行方法步骤。本发明的方法用于电子产品生产测试，电子维修中的故障识别，制造和维修中的部件测试或者伪造部件识别。

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