专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明授权

US10310008B2 Method and system for testing an electronic unit 有权
公开(公告)号：US10310008B2
公开(公告)日：2019-06-04
申请号：US15510371
申请日：2015-09-09
申请人： ENICS AG
发明人： Kristian Federley , Jukka Mattila
IPC分类号： G01R31/28 , G01R31/317
摘要： A method of testing an electronic unit by comparing resulting signal shapes from the unit to be tested and a known functioning unit. The method includes powering off the units for testing and feeding one or more predefined signal shapes of two or more different frequencies as input signals to the known functioning unit and to the unit to be tested at corresponding test points. The method further includes measuring the resulting signal shapes from both units at corresponding measurement points and comparing at least one resulting signal shape from the known functioning unit with the corresponding resulting signal shape from the unit to be tested. The method also includes detecting a fault in the unit to be tested on the basis of an existing signal shape distortion in time axis of the resulting signal shape received from the unit to be tested.

2. 发明申请

US20210215750A1 METHOD AND SYSTEM FOR FAULT DETECTION 有权
公开(公告)号：US20210215750A1
公开(公告)日：2021-07-15
申请号：US17054848
申请日：2019-05-10
申请人： ENICS AG
发明人： Kristian FEDERLEY
IPC分类号： G01R31/00 , G01R29/08 , G01R31/315
摘要： A method wherein faults are detected by measuring electromagnetic emission from a device under test which is placed into different operating states. Electromagnetic emission signals are measured from the device for each operating state by obtaining a time-domain result. The measured signals are processed by digitizing and converting the signal from time-domain into frequency domain. The result is compared with a result of a non-fault device. A fault is detected if there is a sufficient difference between the compared results. The system includes one or more inductive sensors and one or more amplifiers. A digital processing unit in the system includes an analog-to-digital converter for digitizing measured signals, an analyzer for transforming the digital signals into frequency components, a comparator for comparing the frequency components to those of a non-fault device, and a memory for storing the measurement results.

3. 发明申请

US20170261545A1 METHOD AND SYSTEM FOR TESTING AN ELECTRONIC UNIT 审中-公开
公开(公告)号：US20170261545A1
公开(公告)日：2017-09-14
申请号：US15510371
申请日：2015-09-09
申请人： ENICS AG
发明人： Kristian FEDERLEY , Jukka MATTILA
IPC分类号： G01R31/28
CPC分类号： G01R31/2834 , G01R31/2839 , G01R31/31703
摘要： A method of testing an electronic unit by comparing resulting signal shapes from the unit to be tested and a known functioning unit. The method includes powering off the units for testing and feeding one or more predefined signal shapes of two or more different frequencies as input signals to the known functioning unit and to the unit to be tested at corresponding test points. The method further includes measuring the resulting signal shapes from both units at corresponding measurement points and comparing at least one resulting signal shape from the known functioning unit with the corresponding resulting signal shape from the unit to be tested. The method also includes detecting a fault in the unit to be tested on the basis of an existing signal shape distortion in time axis of the resulting signal shape received from the unit to be tested.

4. 发明申请

WO2016038080A1 METHOD AND SYSTEM FOR TESTING AN ELECTRONIC UNIT 审中-公开
标题翻译：用于测试电子单元的方法和系统
公开(公告)号：WO2016038080A1
公开(公告)日：2016-03-17
申请号：PCT/EP2015/070591
申请日：2015-09-09
申请人： ENICS AG
发明人： FEDERLEY, Kristian , MATTILA, Jukka
IPC分类号： G01R31/28
CPC分类号： G01R31/2834 , G01R31/2839 , G01R31/31703
摘要： The method and system of the invention are intended for testing an electronic unit (3b) by feeding one or more predefined signal shapes created by a signal generator (1 ) of the system as input signals to a known functioning unit (3a) and to a unit to be tested (3b) at corresponding test points (10a, 10b). The resulting signal shapes are measured with a measuring instrument (4) of the system from both units (3a, 3b) at corresponding measurement points (8d, 8e, 8f and 8g, 8h, 8i) simultaneously or separately. At least one resulting signal shape from the good unit (3a) is then compared with the corresponding resulting signal shape from the unit to be tested (3b). A fault in the unit to be tested (3b) is detected on the basis of an existing signal shape distortion in time axis of the resulting signal shape received from the unit to be tested. The electronic unit under test (3b)is comprised in the system simultaneously or interchangeably with the electronic functioning unit (3a). The resulting signal shape is presented by transforming it into discrete values that describe the signal shape. The computer program product of the invention executes the method steps when run in computer readable media in the system. The method of the invention is used for electronics production testing, fault identification in electronics repair, component testing in manufacturing and repair, or counterfeit component identification.
摘要翻译：本发明的方法和系统旨在通过将由系统的信号发生器（1）创建的一个或多个预定义的信号形状作为输入信号馈送到已知的功能单元（3a）来测试电子单元（3b），并且在相应的测试点（10a，10b）处要测试的单元（3b）。所产生的信号形状用系统的测量仪器（4）从相应的测量点（8d，8e，8f和8g，8h，8i）同时或分开地从两个单元（3a，3b）测量。然后将来自良好单元（3a）的至少一个所得到的信号形状与来自待测试单元（3b）的相应的结果信号形状进行比较。基于从被测单元接收到的结果信号形状的时间轴上的现有信号形状失真，检测待测单元（3b）中的故障。被测电子单元（3b）与电子功能单元（3a）同时或互换地包含在系统中。通过将其变换成描述信号形状的离散值来呈现所得到的信号形状。本发明的计算机程序产品在系统中的计算机可读介质中运行时执行方法步骤。本发明的方法用于电子生产测试，电子维修中的故障识别，制造和维修中的部件测试或假冒部件识别。

5. 发明申请

WO2019219528A1 METHOD AND SYSTEM FOR FAULT DETECTION 审中-公开
公开(公告)号：WO2019219528A1
公开(公告)日：2019-11-21
申请号：PCT/EP2019/062037
申请日：2019-05-10
申请人： ENICS AG
发明人： FEDERLEY, Kristian
IPC分类号： G01R31/00
摘要： The invention is concerned with a method, with which faults are detected by measuring electromagnetic emission from a device under test to be monitored. The device is placed into one or more of its operating states. Electromagnetic emission signals are measured from the device at each operating states of the device by obtaining a result in time- domain. The measured signals are processed into a result for the device to be monitored by digitizing and converting the resulting signal in time-domain into frequency domain. The result of the device to be monitored are compared with a result of a non-fault device. A fault is detected in the device to be monitored if there is a sufficient difference between the compared results. The system of the invention comprises one or more inductive sensors (1) and one or more amplifiers (2). A digital processing unit (6) in the system comprises an analog-to-digital converter (3) for converting measured signals to digital form, an analyzer (4) for transforming the digital signals into frequency components, a comparator (5) for comparing the frequency components from said device to those obtained in a corresponding way from a non-fault device, and a memory (7) for storing the measurement results of the measured signals processed in the foregoing steps.

6. 发明专利

FI20176127A1 METHOD AND APPARATUS FOR FAULT DETECTION 未知
公开(公告)号：FI20176127A1
公开(公告)日：2019-06-16
申请号：FI20176127
申请日：2017-12-15
申请人： ENICS AG
发明人： FEDERLEY KRISTIAN
IPC分类号： G01M13/04 , F16C19/52 , G01H1/00 , G01M13/02
摘要： The invention is concerned with a method of the invention for detecting faults by analyzing sound signals from a device. The sound signal from one or more no-fault devices and from a device to be monitored is measured and recorded over a time period until a steady measurement result is achieved. Background noise is also measured and recorded and cancelled from the recorded signals from the one or more no-fault devices and from the device to be monitored. The resulted signals are then processed into a first analysis result for the one or more no-fault devices and a second analysis result for the device to be monitored. The second analysis result of the device to be monitored is compared with the first analysis result of one or more non-fault devices. If there is a sufficient difference between the compared analysis results a fault is detected in the device to be monitored. The apparatus of the invention for detecting faults comprises a sensor microphone (1) and a noise measuring microphone (2). Further, the apparatus comprises an analog processing unit (3), which consists of an amplifier (5) and a filter (6) for subtracting the signal received from the noise measuring microphone from the signal received from the sensor microphone. Still further, the apparatus comprises a digital processing unit (4), which consists of an Analog-to-Digital (A/D) converter and a microprocessor (8). The microprocessor (8) comprises an analyzer (10) to perform an analysis from the measured sound signals processed by the analog processing unit and for giving analysis results from said devices. The microprocessor (8) also comprises a comparator (11) to compare the analysis results from the device to be monitored with the analysis result from a nonfault device, and to detect a fault in the device to be monitored if there is a sufficient difference between the compared analysis results. The microprocessor (8) comprises a memory (9) for storing measurements of sound signals processed by the analog processing unit. The apparatus might have a display for showing and comparing the analysis results.

7. 发明专利

FI20145798A Menetelmä ja järjestelmä elektronisen yksikön testaamiseksi 未知
公开(公告)号：FI20145798A
公开(公告)日：2016-03-13
申请号：FI20145798
申请日：2014-09-12
申请人： ENICS AG
发明人： FEDERLAY KRISTIAN , MATTILA JUKKA
IPC分类号： G01R31/3193 , G01R31/3163 , G06F11/00

8. 发明专利

FI20185463A1 METHOD AND SYSTEM FOR FAULT DETECTION 未知
公开(公告)号：FI20185463A1
公开(公告)日：2019-11-19
申请号：FI20185463
申请日：2018-05-18
申请人： ENICS AG
发明人： FEDERLEY KRISTIAN
IPC分类号： G01R31/315 , G01R29/08 , G01R31/00
摘要： The invention is concerned with a method, with which faults are detected by measuring electromagnetic emission from a device under test to be monitored. The device is placed into one or more of its operating states. Electromagnetic emission signals are measured from the device at each operating states of the device by obtaining a result in timedomain. The measured signals are processed into a result for the device to be monitored by digitizing and converting the resulting signal in time-domain into frequency domain. The result of the device to be monitored are compared with a result of a non-fault device. A fault is detected in the device to be monitored if there is a sufficient difference between the compared results. The system of the invention comprises one or more inductive sensors (1) and one or more amplifiers (2). A digital processing unit (6) in the system comprises an analog-to-digital converter (3) for converting measured signals to digital form, an analyzer (4) for transforming the digital signals into frequency components, a comparator (5) for comparing the frequency components from said device to those obtained in a corresponding way from a non-fault device, and a memory (7) for storing the measurement results of the measured signals processed in the foregoing steps.

9. 发明专利

FI126901B Menetelmä ja järjestelmä elektronisen yksikön testaamiseksi 未知
公开(公告)号：FI126901B
公开(公告)日：2017-07-31
申请号：FI20145798
申请日：2014-09-12
申请人： ENICS AG
发明人： FEDERLAY KRISTIAN , MATTILA JUKKA
IPC分类号： G01R31/3193 , G01R31/28 , G01R31/3163 , G01R31/317 , G06F11/00

10. 发明公开

EP3794360A1 METHOD AND SYSTEM FOR FAULT DETECTION 审中-公开
公开(公告)号：EP3794360A1
公开(公告)日：2021-03-24
申请号：EP19724768.7
申请日：2019-05-10
申请人： Enics AG
发明人： FEDERLEY, Kristian
IPC分类号： G01R31/00

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式