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    • 2. 发明申请
    • LIQUID CRYSTAL DISPLAY DEVICE AND METHOD OF MANUFACTURING THE SAME
    • 液晶显示装置及其制造方法
    • US20130021553A1
    • 2013-01-24
    • US13562042
    • 2012-07-30
    • Eiichi SATOH
    • Eiichi SATOH
    • G02F1/136H01L33/08
    • G02F1/136227G02F1/134363G02F2001/136218
    • A liquid crystal display device includes a pair of transparent substrates facing each other through a liquid crystal layer disposed therebetween; a gate insulating film formed so as to cover a gate electrode formed in the pixel regions, disposed closer to the liquid crystal layer, of one of the transparent substrates; a semiconductor film provided on the gate insulating film, for forming a thin-film transistor; a first electrode provided on the semiconductor film through the first insulating film and the second insulating film; a second electrode provided on the first electrode through a third insulating film; and a contact hole formed collectively in the first insulating film, the second insulating film, and the third insulating film on the first electrode, where a second electrode is formed on the contact hole. A floating electrode is formed in the peripheral region of the contact hole.
    • 一种液晶显示装置,包括通过设置在其间的液晶层彼此面对的一对透明基板; 形成为覆盖形成在所述透明基板中的一个的液晶层附近的像素区域中的栅电极的栅极绝缘膜; 设置在所述栅极绝缘膜上的用于形成薄膜晶体管的半导体膜; 通过所述第一绝缘膜和所述第二绝缘膜设置在所述半导体膜上的第一电极; 通过第三绝缘膜设置在第一电极上的第二电极; 以及在第一电极上的第一绝缘膜,第二绝缘膜和第三绝缘膜中共同形成的接触孔,其中第二电极形成在接触孔上。 浮动电极形成在接触孔的周边区域中。
    • 3. 发明申请
    • METHOD OF MANUFACTURING THIN-FILM TRANSISTOR SUBSTRATE
    • 制造薄膜晶体管基板的方法
    • US20120094403A1
    • 2012-04-19
    • US13337601
    • 2011-12-27
    • Hisao NAGAIEiichi SATOHToshiyuki AOYAMA
    • Hisao NAGAIEiichi SATOHToshiyuki AOYAMA
    • H01L21/336H01L21/66
    • H01L29/78696H01L29/66765H01L29/78669H01L29/78678
    • Provided is a method of manufacturing a TFT substrate for preventing characteristics of a native oxide layer in a boundary between a microcrystal semiconductor layer and an amorphous semiconductor layer from being degraded. The method includes forming a gate electrode, forming a gate insulating film, modifying the formed first amorphous silicon thin film into a first crystalline silicon thin film, removing a silicon oxide layer on the surface of the first crystalline silicon thin film, forming the second amorphous silicon thin film, and dry etching the first crystalline silicon thin film and the second amorphous silicon thin film, and it is determined whether or not the in-process TFT substrate after the dry etching is returned to the processes after the dry etching by measuring the emission intensity of radicals in plasma during the dry etching and detecting the presence or absence of the silicon oxide layer in the boundary.
    • 提供一种制造用于防止微晶半导体层和非晶半导体层之间的边界中的自然氧化物层的特性降低的TFT基板的方法。 该方法包括形成栅电极,形成栅极绝缘膜,将形成的第一非晶硅薄膜修饰为第一晶体硅薄膜,去除第一晶体硅薄膜表面上的氧化硅层,形成第二非晶硅 硅薄膜,并且干蚀刻第一晶体硅薄膜和第二非晶硅薄膜,并且确定在干蚀刻之后的工艺中的TFT基板是否在干法蚀刻之后通过测量 干蚀刻期间等离子体中自由基的发射强度,并检测边界中是否存在氧化硅层。