会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 1. 发明授权
    • Method for reading a non-volatile memory cell adjacent to an inactive region of a non-volatile memory cell array
    • 用于读取与非易失性存储单元阵列的非活动区域相邻的非易失性存储单元的方法
    • US06771545B1
    • 2004-08-03
    • US10353558
    • 2003-01-29
    • Edward HsiaEric AjimineDarlene G. HamiltonPauling ChenMing-Huei ShiehMark W. RandolphEdward RunnionYi He
    • Edward HsiaEric AjimineDarlene G. HamiltonPauling ChenMing-Huei ShiehMark W. RandolphEdward RunnionYi He
    • G11C1604
    • G11C29/82G11C16/0491G11C16/3404
    • An array of non-volatile memory cells includes active columns of cells wherein a data pattern may be stored adjacent to damaged or inactive columns wherein data is not stored. A method of storing a data pattern and reproducing the data pattern within such an array comprises storing a charge within a selected plurality of the memory cells within the active column. The selected plurality of memory cells represents a portion of the data pattern. An inactive memory cell programming pattern is identified. The inactive memory cell programming pattern identifies all, or a selected plurality, of the memory cells in the inactive column in which a charge is to be stored for the purpose of periodically storing a charge in the memory cells first inactive column to prevent over erasure, during bulk erase, and leakage from the inactive cells to adjacent active cells. A charge is stored on the selected plurality of the memory cells in the first inactive column. The data pattern is reproduced reading each memory cell within the first active column.
    • 非易失性存储器单元的阵列包括有效的单元格列,其中数据模式可以存储在与不存储数据的损坏或非活动列相邻的位置。 存储数据模式并在其中再现数据模式的方法包括将电荷存储在活动列内的所选择的多个存储单元内。 所选择的多个存储单元表示数据模式的一部分。 识别非活动存储器单元编程模式。 非活动存储器单元编程模式识别要在其中存储电荷的所述非活动列中的所有或选定的多个存储单元,以便在存储单元的第一非活动列中周期性地存储电荷以防止过度擦除, 在批量擦除期间以及从非活性电池泄漏到相邻的活性电池。 在第一非活动列中的所选择的多个存储器单元上存储电荷。 读取在第一活动列内的每个存储单元的数据模式。
    • 4. 发明授权
    • Multi-dimensional memory cell using resonant tunneling diodes
    • 使用谐振隧道二极管的多维存储单元
    • US5280445A
    • 1994-01-18
    • US940226
    • 1992-09-03
    • Ming-Huei ShiehHung C. Lin
    • Ming-Huei ShiehHung C. Lin
    • G11C11/56G11C5/06
    • B82Y10/00G11C11/56G11C2211/5614
    • A number of resonant tunneling diodes are connected in series with a resistor, a current source or a load device. A bit line is connected to every joint between any two devices through a switch. When properly biased, there can be (N+1).sup.m number of stable quantized operating points which are represented by a combination of m variables (of either voltage or current, where N is the number of peaks of the folding I-V characteristic and m is the number of bit lines. The m bit lines can write in (N+1).sup.m different combinations of inputs. During reading, the quantized voltage (or current) at each bit line is sensed. The number of stable states can be doubled by changing the polarity of the power supply.
    • 多个谐振隧道二极管与电阻器,电流源或负载装置串联连接。 通过开关将位线连接到任何两个设备之间的每个接头。 当适当偏置时,可以有(N + 1)m个稳定的量化工作点,它们由m个变量(电压或电流的组合)表示,其中N是折叠IV特性的峰值数,m是 位线数,m位线可以写入(N + 1)m个不同的输入组合,在读取期间,检测每个位线处的量化电压(或电流),稳定状态的数量可以加倍 改变电源的极性。
    • 5. 发明授权
    • Reference cell circuit and method of producing a reference current
    • 参考电路和产生参考电流的方法
    • US08665651B1
    • 2014-03-04
    • US13610448
    • 2012-09-11
    • Chi-Shun LinSeow-Fong LimMing-Huei Shieh
    • Chi-Shun LinSeow-Fong LimMing-Huei Shieh
    • G11C11/34G11C16/06G11C7/00G11C7/02
    • G11C7/14G11C5/147G11C16/28
    • The present invention discloses a reference cell circuit which is applied to a non-volatile memory. The reference cell circuit includes a reference cell array, a first current mirror circuit, and a second current mirror circuit. The reference cell array includes at least one row of floating gate transistors. The first current mirror circuit is arranged to generate a mirror current according to a reference current generated by the reference cell array. The second current mirror circuit is arranged to receive the mirror current and generate an adjusted reference current according to the mirror current and a selected one of a plurality of enable signals, wherein the plurality of enable signals correspond to a plurality operations of the non-volatile memory and the adjusted reference current is arranged to determine logical state of a plurality of memory cells of the non-volatile memory.
    • 本发明公开了一种应用于非易失性存储器的参考单元电路。 参考单元电路包括参考单元阵列,第一电流镜电路和第二电流镜电路。 参考单元阵列包括至少一行浮置栅极晶体管。 第一电流镜电路被布置成根据由参考单元阵列产生的参考电流产生镜电流。 第二电流镜电路被布置成接收反射镜电流并且根据镜电流和多个使能信号中的选定一个产生调整的参考电流,其中多个使能信号对应于非易失性的多个操作 存储器和经调整的参考电流被布置成确定非易失性存储器的多个存储单元的逻辑状态。
    • 7. 发明授权
    • Source bias compensation for page mode read operation in a flash memory
device
    • 闪存设备中页面模式读取操作的源偏置补偿
    • US06118702A
    • 2000-09-12
    • US421151
    • 1999-10-19
    • Ming-Huei ShiehBhimachar Venkatesh
    • Ming-Huei ShiehBhimachar Venkatesh
    • G11C5/14G11C16/28G11C16/06
    • G11C16/28G11C5/14
    • A page mode memory senses a large number of bits simultaneously. The associated read current creates a source bias in the core cells which alters the sense margin at the sense amplifier. To address this problem, a memory integrated circuit (100) includes an array (102) of core cells, each core cell having a ground node (220, 222, 224). A ground line (230) couples the ground node of each core cell to a ground potential (Vss) and establishes a variable parasitic potential between the ground node and Vss. For sensing the data state of the core cells, a reference core cell (252) matches the array core cells and has a reference ground node (262). A circuit element (256) is coupled between the reference ground node and Vss to establish a variable reference potential to match the variable parasitic potential.
    • 页面模式存储器同时感测大量的位。 关联的读取电流在核心单元中产生源偏置,其改变感测放大器处的感测边缘。 为了解决这个问题,存储器集成电路(100)包括核心单元的阵列(102),每个核心单元具有接地节点(220,222,224)。 接地线(230)将每个核心单元的接地节点耦合到地电位(Vss),并在接地节点和Vss之间建立可变的寄生电位。 为了感测核心单元的数据状态,参考核心单元(252)与阵列核心单元匹配并具有参考接地节点(262)。 电路元件(256)耦合在参考接地节点和Vss之间以建立可变参考电位以匹配可变寄生电位。