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    • 3. 发明授权
    • Non-volatile memory device, operation method thereof, and devices having the non-volatile memory device
    • 非易失性存储器件,其操作方法以及具有非易失性存储器件的器件
    • US08508990B2
    • 2013-08-13
    • US13071727
    • 2011-03-25
    • Kyoung Lae ChoHyuck-Sun KwonJun Jin Kong
    • Kyoung Lae ChoHyuck-Sun KwonJun Jin Kong
    • G11C16/04
    • G11C11/5628G11C16/3454
    • A non-volatile memory device includes a memory cell array including a plurality of multi-level cells each storing data corresponding to one of a plurality of states of a first group of states, and a control circuit. The control circuit is configured to program data corresponding to one of the plurality of states in a first multi-level cell according to a first verify voltage level of a first group of verify voltage levels, and to control the first multi-level cell to be re-programmed to one of a plurality of states of a second group of states according to a first verify voltage level of a second group of verify voltage levels. Each voltage level of the second group of verify voltage levels has a higher level than the verify voltage levels of the first group of verify voltage levels.
    • 非易失性存储器件包括存储单元阵列,该存储单元阵列包括多个多电平单元,每个多电平单元存储对应于第一组状态的多种状态之一的数据,以及控制电路。 控制电路被配置为根据第一组验证电压电平的第一验证电压电平对与第一多电平单元中的多个状态中的一个状态相对应的数据,并且将第一多电平单元控制为 根据第二组验证电压电平的第一验证电压电平,将其重新编程为第二组状态的多个状态之一。 第二组验证电压电平的每个电压电平具有比第一组验证电压电平的验证电压电平更高的电平。
    • 10. 发明申请
    • Memory device and memory programming method
    • 存储器和存储器编程方法
    • US20090296486A1
    • 2009-12-03
    • US12382351
    • 2009-03-13
    • Jae Hong KimKyoung Lae ChoYong June KimDong Hyuk Chae
    • Jae Hong KimKyoung Lae ChoYong June KimDong Hyuk Chae
    • G11C16/06
    • G11C16/10G11C11/5628G11C2211/5621
    • Memory devices and/or memory programming methods are provided. A memory device may include: a memory cell array including a plurality of memory cells; a programming unit configured to apply a plurality of pulses corresponding to a program voltage to a gate terminal of each of the plurality of memory cells, and to apply a program condition voltage to a bit line connected with a memory cell having a threshold voltage lower than a verification voltage from among the plurality of memory cells; and a control unit configured to increase the program voltage during a first time interval by a first increment for each pulse, and to increase the program voltage during a second time interval by a second increment for each pulse. Through this, it may be possible to reduce a width of a distribution of threshold voltages of a memory cell.
    • 提供存储器件和/或存储器编程方法。 存储器件可以包括:包括多个存储器单元的存储单元阵列; 编程单元,被配置为将与编程电压相对应的多个脉冲施加到所述多个存储单元中的每一个的栅极端子,并且将编程状态电压施加到与具有低于阈值电压的阈值电压的存储单元连接的位线 来自所述多个存储单元中的验证电压; 以及控制单元,被配置为在每个脉冲的第一时间间隔期间增加编程电压的第一增量,并且在第二时间间隔期间增加每个脉冲的第二增量的编程电压。 由此,可以减小存储单元的阈值电压分布的宽度。