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    • 5. 发明授权
      US08185786B2 Error recovery within processing stages of an integrated circuit 有权
    • Error recovery within processing stages of an integrated circuit
    • 集成电路处理阶段内的错误恢复
    • US08185786B2
    • 2012-05-22
    • US12923911
    • 2010-10-13
    • Krisztian Flautner , Todd Michael Austin , David Theodore Blaauw , Trevor Nigel Mudge
    • Krisztian Flautner , Todd Michael Austin , David Theodore Blaauw , Trevor Nigel Mudge
    • G06F11/00
    • G06F11/1695 , G06F11/0721 , G06F11/0793 , G06F11/104 , G06F11/1608 , G06F11/167 , G06F11/183
    • An integrated circuit includes a plurality of processing stages each including processing logic, a non-delayed signal-capture element, a delayed signal-capture element and a comparator. The non-delayed signal-capture element captures an output from the processing logic at a non-delayed capture time. At a later delayed capture time, the delayed signal-capture element also captures a value from the processing logic. An error detection circuit and error correction circuit detect and correct random errors in the delayed value and supplies an error-checked delayed value to the comparator. The comparator compares the error-checked delayed value and the non-delayed value and if they are not equal this indicates that the non-delayed value was captured too soon and should be replaced by the error-checked delayed value. The non-delayed value is passed to the subsequent processing stage immediately following its capture and accordingly error recovery mechanisms are used to suppress the erroneous processing which has occurred by the subsequent processing stages, such as gating the clock and allowing the correct signal values to propagate through the subsequent processing logic before restarting the clock. The operating parameters of the integrated circuit, such as the clock frequency, the operating voltage, the body biased voltage, temperature and the like are adjusted so as to maintain a finite non-zero error rate in a manner that increases overall performance.
    • 集成电路包括多个处理级，每个处理级包括处理逻辑，非延迟信号捕获元件，延迟信号捕获元件和比较器。 非延迟信号捕获元件在非延迟捕获时间捕获来自处理逻辑的输出。 在稍后的延迟捕获时间，延迟信号捕获元件还捕获来自处理逻辑的值。 误差检测电路和误差校正电路检测并校正延迟值中的随机误差，并向比较器提供经错误检测的延迟值。 比较器比较错误检查的延迟值和非延迟值，如果它们不相等，则表示非延迟值被捕获太早，应由错误检查的延迟值替换。 非延迟值在其捕获之后立即传递到后续处理阶段，因此使用错误恢复机制来抑制后续处理阶段发生的错误处理，例如选通时钟并允许正确的信号值传播 在重新启动时钟之前通过后续的处理逻辑。 调整集成电路的工作参数，例如时钟频率，工作电压，主体偏置电压，温度等，以便以提高整体性能的方式保持有限的非零错误率。
    • 基本信息 添加关注 加入工作空间 PDF全文 PDF下载 全文下载 相似专利 双屏查看 权利要求书 说明书全文 Espacenet 法律信息 同族专利 专利引用
    • 7. 发明申请
      US20090049331A1 Error propagation control within integrated circuits 有权
    • Error propagation control within integrated circuits
    • 集成电路内的误差传播控制
    • US20090049331A1
    • 2009-02-19
    • US11887106
    • 2005-10-03
    • Jason Andrew Blome , Krisztian Flautner , Daryl Wayne Bradley
    • Jason Andrew Blome , Krisztian Flautner , Daryl Wayne Bradley
    • G06F11/20
    • G06F11/261 , G06F17/5045 , Y02T10/82
    • A method of selecting where error detection circuits should be placed within an integrated circuit uses simulation of a reference and test design with errors injected into the test design and then fan out analysis performed upon those injected errors to identify error propagation characteristics. Thus, registers at which propagated errors are highly likely to manifest themselves or which protect key architectural state, or which protect state not otherwise protected can be identified and so an efficient deployment of error detection mechanisms achieved. Within an integrated circuit output signals from inactive circuit elements may be subject to isolation gating in dependence upon a detected current state of the integrated circuit. Thus, inactive circuit elements in which soft errors occur have inappropriate output signals gated from reaching the rest of the integrated circuit and thus reducing erroneous operation.
    • 选择错误检测电路应放置在集成电路中的方法，使用注入到测试设计中的错误的参考和测试设计的仿真，然后扇出对这些注入错误进行的分析，以识别误差传播特性。 因此，可以识别传播错误很可能表现自身或者保护关键体系结构状态或哪个保护状态没有被其他方式保护的寄存器，从而实现错误检测机制的有效部署。 在集成电路内，根据检测到的集成电路的当前状态，来自非活动电路元件的输出信号可能经受隔离门控。 因此，出现软错误的无效电路元件具有不适当的输出信号，从而不能到达集成电路的其余部分，从而减少错误的操作。
    • 基本信息 添加关注 加入工作空间 PDF全文 PDF下载 全文下载 相似专利 双屏查看 权利要求书 说明书全文 Global Dossier Espacenet 法律信息 同族专利 专利引用
    • 9. 发明授权
      US07337356B2 Systematic and random error detection and recovery within processing stages of an integrated circuit 有权
    • Systematic and random error detection and recovery within processing stages of an integrated circuit
    • 在集成电路的处理阶段内的系统和随机的错误检测和恢复
    • US07337356B2
    • 2008-02-26
    • US10896997
    • 2004-07-23
    • Trevor Nigel Mudge , Todd Michael Austin , David Theodore Blaauw , Krisztian Flautner
    • Trevor Nigel Mudge , Todd Michael Austin , David Theodore Blaauw , Krisztian Flautner
    • G06F11/00
    • G06F11/1695 , G06F9/3861 , G06F9/3869 , G06F11/0721 , G06F11/0793 , G06F11/104 , G06F11/1608 , G06F11/167 , G06F11/183
    • An integrated circuit includes a plurality of processing stages each including processing logic 1014, a non-delayed signal-capture element 1016, a delayed signal-capture element 1018 and a comparator 1024. The non-delayed signal-capture element 1016 captures an output from the processing logic 1014 at a non-delayed capture time. At a later delayed capture time, the delayed signal-capture element 1018 also captures a value from the processing logic 1014. An error detection circuit 1026 and error correction circuit 1028 detect and correct random errors in the delayed value and supplies an error-checked delayed value to the comparator 1024. The comparator 1024 compares the error-checked delayed value and the non-delayed value and if they are not equal this indicates that the non-delayed value was captured too soon and should be replaced by the error-checked delayed value. The non-delayed value is passed to the subsequent processing stage immediately following its capture and accordingly error recovery mechanisms are used to suppress the erroneous processing which has occurred by the subsequent processing stages, such as gating the clock and allowing the correct signal values to propagate through the subsequent processing logic before restarting the clock. The operating parameters of the integrated circuit, such as the clock frequency, the operating voltage, the body biased voltage, temperature and the like are adjusted so as to maintain a finite non-zero error rate in a manner that increases overall performance.
    • 集成电路包括多个处理级，每个处理级包括处理逻辑1014，非延迟信号捕获元件1016，延迟信号捕获元件1018和比较器1024。 非延迟信号捕获元件1016在非延迟捕获时间捕获来自处理逻辑1014的输出。 在稍后延迟的捕获时间，延迟信号捕获元件1018还从处理逻辑1014捕获一个值。 误差检测电路1026和误差校正电路1028检测并校正延迟值中的随机误差，并将错误检测的延迟值提供给比较器1024。 比较器1024比较错误检查的延迟值和非延迟值，如果它们不相等，则表示非延迟值被捕获得太早，应该被错误检查的延迟值替换。 非延迟值在其捕获之后立即传递到后续处理阶段，因此使用错误恢复机制来抑制后续处理阶段发生的错误处理，例如选通时钟并允许正确的信号值传播 在重新启动时钟之前通过后续的处理逻辑。 调整集成电路的工作参数，例如时钟频率，工作电压，主体偏置电压，温度等，以便以提高整体性能的方式保持有限的非零错误率。
    • 基本信息 添加关注 加入工作空间 PDF全文 PDF下载 全文下载 相似专利 双屏查看 权利要求书 说明书全文 Espacenet 法律信息 同族专利 专利引用
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