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1. 发明申请

US20030173576A1 High speed waveguide photodetector 失效
标题翻译：高速波导光电探测器
公开(公告)号：US20030173576A1
公开(公告)日：2003-09-18
申请号：US10350702
申请日：2003-01-24
申请人： Denselight Semiconductors PTE LTD
发明人： Yee Loy Lam , Yuen Chuen Chan , Chai Leng Terence Wee
IPC分类号： H01L033/00
CPC分类号： H01L31/109 , G01J5/20
摘要： The present invention relates to a semiconductor photodetector. The photodetector is a waveguide photodetector, which comprises: a waveguide (1,2,3) having a III-V ridge structure including an active layer (1); a semiconductor layer (4) deposited on top of the ridge structure; and, metal detector electrodes (not shown) on the surface of the higher refractive index semiconductor layer (4). The semiconductor layer (4) has a higher refractive index than the waveguide structure (1,2,3). The ridge structure is configured to widen along the length of the waveguide (1,2,3) such that light passing through the active layer (1) of the waveguide couples more efficiently up into the higher refractive index semiconductor layer (4).
摘要翻译：本发明涉及一种半导体光电探测器。光电检测器是波导光电检测器，其包括：具有包括有源层（1）的III-V脊结构的波导（1,2,3）; 沉积在所述脊结构的顶部上的半导体层（4）; 以及在高折射率半导体层（4）的表面上的金属检测器电极（未示出）。半导体层（4）具有比波导结构（1,2,3）更高的折射率。脊结构被配置为沿着波导（1,2,3）的长度加宽，使得穿过波导的有源层（1）的光更有效地耦合到高折射率半导体层（4）中。

2. 发明申请

US20030091311A1 Planar waveguide facet profiling 审中-公开
标题翻译：平面波导面分析
公开(公告)号：US20030091311A1
公开(公告)日：2003-05-15
申请号：US10272217
申请日：2002-10-16
申请人： Denselight Semiconductors Pte Ltd
发明人： Yee Loy Lam , Woon Loong Daniel Leong , Yuen Chuen Chan
IPC分类号： G02B006/10 , G02B006/26
CPC分类号： H01S5/1082 , G02B6/122 , G02B6/305 , G02B2006/12126 , G02B2006/12176 , H01S5/1014
摘要： In the present invention, profiling of the end facet of an optical waveguide reduces the amount of reflected light propagating in the waveguide. In a conventional waveguide, the effective reflectivity experienced by light at a facet is determined by the modal content of the light and the refractive index of the waveguide (core and cladding) and other material at either side of the dielectric interface, which constitutes the facet. In the present invention, depending upon the modal content of the light, the waveguide dimensions and the refractive indices at the dielectric interfaces, we adjust the profile of the facets so that it is no longer planar and so substantially reduce the amount of reflected light propagating back along the waveguide. This reduction in nulleffective reflectivitynull can be due to an increase in the loss experienced by any reflected light or due to an increase in the amount of light transmitted.
摘要翻译：在本发明中，光波导的端面的轮廓减少了在波导中传播的反射光的量。在常规波导中，由小面处的光所经历的有效反射率由光的模态含量和波导（芯和包层）的折射率以及其构成电介质界面的任一侧的其它材料决定。。在本发明中，根据光的模态含量，波导尺寸和电介质界面处的折射率，我们调整刻面的轮廓，使其不再是平面的，因此基本上减少了传播的反射光的量沿着波导回。 “有效反射率”的这种降低可以归因于任何反射光所经历的损失的增加或由于透射光量的增加。

3. 发明申请

US20030174960A1 Optical tap 失效
标题翻译：光学水龙头
公开(公告)号：US20030174960A1
公开(公告)日：2003-09-18
申请号：US10350989
申请日：2003-01-24
申请人： Denselight Semiconductors PTE LTD
发明人： Yee Loy Lam , Yuen Chuen Chan , Bee Khuan Law
IPC分类号： G02B006/26
CPC分类号： G02B6/2813 , G02B6/125 , G02B6/2852 , G02B2006/12097
摘要： The present invention relates to a semiconductor optical tap comprising: a multimode interferometer (MMI) (6); an input waveguide (1) coupled to the MMI; a first output waveguide (2) coupled to the MMI; and a second output waveguide (3) coupled to the MMI. The first and second output waveguides (2,3) overlap (d) such that unequal portions of light are coupled from the MMI into the first and second output waveguides (2,3). The input waveguide (1) and the first and second output waveguides (2,3) may have a rib structure. They may also be adiabatically tapered waveguides. The first and second output waveguides (2,3) may have different starting widths.
摘要翻译：本发明涉及一种半导体光学抽头，包括：多模干涉仪（MMI）（6）; 耦合到所述MMI的输入波导（1）; 耦合到所述MMI的第一输出波导（2）; 和耦合到MMI的第二输出波导（3）。第一和第二输出波导（2,3）重叠（d），使得光的不相等的部分从MMI耦合到第一和第二输出波导（2,3）中。输入波导（1）和第一和第二输出波导（2,3）可以具有肋结构。它们也可以是绝热的锥形波导。第一和第二输出波导（2,3）可以具有不同的起始宽度。

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