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    • 5. 发明授权
    • Wavelength stabilized laser
    • 波长稳定的激光
    • US06215801B1
    • 2001-04-10
    • US09263713
    • 1999-03-05
    • David Alan AckermanPhilip J. AnthonyJohn VanAtta GatesDirk Joachim Muehlner
    • David Alan AckermanPhilip J. AnthonyJohn VanAtta GatesDirk Joachim Muehlner
    • H01S313
    • H01S5/0687H01S3/1303
    • An apparatus for stabilizing the wavelength of light emitted by a laser or light source comprising a divider for dividing a sample of emitted light into a first and second portion; a first photodetector configured to measure an intensity of the first portion and a second photodetector configured to measure an intensity of the second portion, the second photodetector configured to receive the emitted light via an optical frequency discriminator, such as a dielectric coating, wherein the optical frequency discriminator is configured to modify the intensity of the emitted light at the second photodetector as a function of an optical frequency of the emitted light; and a processor configured to maintain a desired level corresponding to a ratio of the intensity measured by the first photodetector and the intensity measured by the second photodetector, so as to provide a feedback control signal to adjust the wavelength of the emitted light. In one embodiment, the first and second photodetectors are photodetector diodes having a base electrode, a first electrode and a second electrode. The diode is configured to generate an electrical current between the base electrode and the first electrode corresponding to the intensity of light received by the first photodetector and to generate an electrical current between the base electrode and the second electrode corresponding to the intensity of light received by the second photodetector. In still another embodiment, the sample is a back-facet emission emitted by the source, wherein the entire apparatus is disposed on a silicon chip having the frequency discriminating dielectric coating applied directly to its surface.
    • 一种用于稳定由激光或光源发射的光的波长的装置,包括用于将发射光的样本分成第一和第二部分的分割器; 配置为测量第一部分的强度的第一光电检测器和被配置为测量第二部分的强度的第二光电检测器,第二光电检测器被配置为经由诸如电介质涂层的光学鉴别器接收发射的光,其中光学 频率鉴别器被配置为根据发射光的光频率来修改第二光电检测器处的​​发射光的强度; 以及处理器,其被配置为保持对应于由第一光电检测器测量的强度的比率和由第二光电检测器测量的强度的比率的期望水平,以便提供反馈控制信号以调整发射的光的波长。 在一个实施例中,第一和第二光电探测器是具有基极,第一电极和第二电极的光电二极管。 所述二极管被配置为在所述基极和所述第一电极之间产生与由所述第一光电检测器接收的光强度对应的电流,并且在所述基极与所述第二电极之间产生对应于由 第二光电检测器。 在另一个实施例中,样品是由源发射的背面发射,其中整个装置设置在具有直接施加到其表面的频率鉴别电介质涂层的硅芯片上。