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    • 7. 发明授权
    • Method and apparatus for extracting parameters for an electrical structure
    • 用于提取电气结构参数的方法和装置
    • US06539344B1
    • 2003-03-25
    • US09553814
    • 2000-04-21
    • Robert E. StengelDavid E. Bockelman
    • Robert E. StengelDavid E. Bockelman
    • G06F760
    • G06F17/5036
    • A parameter extraction technique for an electrical structure is based on a definition of network parameters that isolates pure mode responses of the electrical structure, and that makes mode conversion responses of the electrical structure negligible. A set of network parameters is obtained that represents pure mode responses for the electrical structure (410). These network parameters are processed to obtain model parameters that characterize each pure mode response (422, 424, 426, 428, 432, 434, 436, 438). Preferably, the mode specific parameters to combined to obtain mode independent parameters, such as coupling factor, propagation constant, and characteristic impedance values (440, 450).
    • 用于电气结构的参数提取技术基于隔离电气结构的纯模式响应的网络参数的定义,并且使得电气结构的模式转换响应可忽略不计。 获得代表电结构(410)的纯模式响应的一组网络参数。 处理这些网络参数以获得表征每个纯模式响应(422,424,426,428,432,434,436,438)的模型参数。 优选地,组合的模式特定参数以获得模式无关参数,例如耦合因子,传播常数和特征阻抗值(440,450)。
    • 8. 发明授权
    • Calibration and measurment technique and apparatus for same
    • 校准和测量技术及仪器相同
    • US5734268A
    • 1998-03-31
    • US628066
    • 1996-04-08
    • David E. Bockelman
    • David E. Bockelman
    • G01R27/28G01R35/00
    • G01R27/28G01R35/005
    • A network analyzer system employs a calibration and measurement technique (300) to compensate for probe tip cross-talk. Calibration technique (310) calibrates standards (400, 500, 600) having variable probe separations. Error terms are produced for each separation. Continuous functions (702, 704, 706) are developed for the error terms as a function of distance. A device under test (802) can then be measured and a set of error terms is generated based on the separation between the probes. These error terms (902) are then used to correct the measurement of the device under test (802). A device under test (802) can thus be measured with various probe tip separations and differing impedances without having to re-calibrate the network analyzer.
    • 网络分析仪系统采用校准和测量技术(300)来补偿探头尖端串扰。 校准技术(310)校准具有可变探针分离的标准(400,500,600)。 产生每个分离的错误项。 连续功能(702,704,706)被开发用于作为距离的函数的误差项。 然后可以测量被测器件(802),并且基于探针之间的间隔产生一组误差项。 然后使用这些误差项(902)来校正被测设备的测量(802)。 因此,可以用各种探针尖端分离和不同阻抗来测量被测器件(802),而无需重新校准网络分析仪。