专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明授权

US07145977B2 Diagnostic method and apparatus for non-destructively observing latch data 失效
标题翻译：用于非破坏性观察锁存数据的诊断方法和装置
公开(公告)号：US07145977B2
公开(公告)日：2006-12-05
申请号：US10604550
申请日：2003-07-30
申请人： Darren L Anand , John R Goss , Peter O Jakobsen , Michael R Ouellette , Thomas G Sopchak , Donald L Wheater
发明人： Darren L Anand , John R Goss , Peter O Jakobsen , Michael R Ouellette , Thomas G Sopchak , Donald L Wheater
IPC分类号： G11C19/00
CPC分类号： G11C19/00 , G11C29/003
摘要： The invention provides a circuit that can observe data within shift registers without altering the data. The circuit includes selectors connected to the inputs and outputs of the shift registers. The selectors selectively connect the input with the output of a selected shift register to form a wiring loop for the selected shift register. A control device connected to the wiring loop uses the wiring loop to cause the data to be continually transferred from the output of the selected shift register to the input of the selected shift register and back through the selected shift register in a circular manner. The control device includes a counter used for determining the length of a selected shift register and a set of registers to store, for future use when rotating data in the shift registers, the length of each shift register. The control device also includes a data output accessible from outside the circuit. An observation wire is connected to the wiring loop, and the data passes from the wiring loop to the control device through the observation wire. The control device outputs data appearing on the wiring loop as the data is circulated through the selected shift register to permit data within the selected shift register to be observed outside the circuit without altering the data within the selected shift register.
摘要翻译：本发明提供一种可以观察移位寄存器内的数据而不改变数据的电路。该电路包括连接到移位寄存器的输入和输出的选择器。选择器选择性地将输入与所选移位寄存器的输出连接，以形成所选移位寄存器的布线回路。连接到布线回路的控制装置使用布线回路使得数据从所选择的移位寄存器的输出连续地传送到所选择的移位寄存器的输入端并循环地返回所选择的移位寄存器。控制装置包括用于确定所选择的移位寄存器的长度的计数器和一组寄存器，用于存储当在移位寄存器中旋转数据时将来使用的每个移位寄存器的长度。控制装置还包括从电路外部可访问的数据输出。观察线连接到布线回路，数据通过观察线从布线回路传递到控制装置。当数据通过选定的移位寄存器循环时，控制装置输出出现在布线环路上的数据，以允许在电路外观察所选移位寄存器内的数据，而不改变所选移位寄存器内的数据。

2. 发明申请

US20080018356A1 A SYSTEM FOR ACQUIRING DEVICE PARAMETERS 有权
标题翻译：用于获取设备参数的系统
公开(公告)号：US20080018356A1
公开(公告)日：2008-01-24
申请号：US11459367
申请日：2006-07-24
申请人： Darren L Anand , Nazmul Habib , Robert J. McMahon , Troy J. Perry
发明人： Darren L Anand , Nazmul Habib , Robert J. McMahon , Troy J. Perry
IPC分类号： G01R31/26
CPC分类号： G01R31/318511 , G01R31/31723 , G01R31/31724
摘要： A system for performing device-specific testing and acquiring parametric data on custom integrated circuits, for example ASICs, such that each chip is tested individually without excessive test time requirements, additional silicon, or special test equipment. The testing system includes a device test structure integrated into unused backfill space in an ASIC design which tests a set of dummy devices that are identical to some of those of the ASIC. The device test structure includes control logic for designating the type of test and which device types to activate (e.g. pFETs or nFETs), a protection circuit for protecting the SPM when the test is inactive, an isolation circuit for isolating the devices under test (DUT) from any leakage current during test, and a decode circuit for providing test input (e.g. voltages) to the DUT. By controlling which devices to test and the voltage conditions of those devices, the system calculates the relative product yield and health of the line on a die by die basis.
摘要翻译：用于执行特定于设备的测试和获取定制集成电路（例如ASIC）的参数数据的系统，使得每个芯片被单独测试而没有过多的测试时间要求，附加的硅或特殊的测试设备。测试系统包括在ASIC设计中集成到未使用的回填空间中的器件测试结构，其测试与ASIC中的一些相同的一组虚设器件。器件测试结构包括用于指定测试类型和要激活的器件类型（例如pFET或nFET）的控制逻辑，用于在测试无效时保护SPM的保护电路，用于隔离被测器件（DUT）的隔离电路）和测试期间的任何漏电流的解码电路，以及用于向DUT提供测试输入（例如电压）的解码电路。通过控制要测试的设备和这些设备的电压条件，系统通过模具计算芯片上的线路的相对产品产量和健康状况。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式