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    • 5. 发明申请
    • PROCESS KIT WITH PLASMA-LIMITING GAP
    • 具有等离子体差距的工艺包
    • US20130256128A1
    • 2013-10-03
    • US13435956
    • 2012-03-30
    • ALAN RITCHIEDONNY YOUNG
    • ALAN RITCHIEDONNY YOUNG
    • C23C14/34
    • C23C14/34H01J37/32495H01J37/32642H01J37/32651H01J37/3405
    • Apparatus for processing substrates are provided herein. In some embodiments, an apparatus includes a process kit comprising a shield having one or more sidewalls configured to surround a first volume, the first volume disposed within an inner volume of a process chamber; and a first ring moveable between a first position, wherein the first ring rests on the shield, and a second position, wherein a gap is formed between an outer surface of the first ring and an inner surface of the one or more sidewalls, wherein a width of the gap is less than about two plasma sheath widths for a plasma formed at a frequency of about 40 MHz or higher and at a pressure of about 140 mTorr or lower.
    • 本文提供了处理基板的设备。 在一些实施例中,装置包括处理套件,其包括具有一个或多个侧壁的屏蔽件,该侧壁被配置为围绕第一容积,第一容积设置在处理室的内部容积内; 以及第一环,其可在第一位置和第二位置之间移动,第一位置在第一位置和第二位置之间,其中在第一环的外表面和一个或多个侧壁的内表面之间形成间隙,其中, 在约40MHz或更高的频率和约140mTorr或更低的压力下形成的等离子体的间隙宽度小于约两个等离子体护套宽度。
    • 7. 发明申请
    • PHYSICAL VAPOR DEPOSITION CHAMBER WITH ROTATING MAGNET ASSEMBLY AND CENTRALLY FED RF POWER
    • 具有旋转磁铁组件和中央射频功率的物理蒸气沉积室
    • US20110240466A1
    • 2011-10-06
    • US13075841
    • 2011-03-30
    • ALAN RITCHIEKEITH MILLER
    • ALAN RITCHIEKEITH MILLER
    • C23C14/35
    • H01J37/3405H01J37/3455
    • Embodiments of the present invention provide improved methods and apparatus for physical vapor deposition (PVD) processing of substrates. In some embodiments, an apparatus for physical vapor deposition (PVD) may include a target assembly having a target comprising a source material to be deposited on a substrate, an opposing source distribution plate disposed opposite a backside of the target and electrically coupled to the target along a peripheral edge of the target, and a cavity disposed between the backside of the target and the source distribution plate; an electrode coupled to the source distribution plate at a point coincident with a central axis of the target; and a magnetron assembly comprising a rotatable magnet disposed within the cavity and having an axis of rotation that is aligned with a central axis of the target assembly, wherein the magnetron assembly is not driven through the electrode.
    • 本发明的实施例提供了用于衬底的物理气相沉积(PVD)处理的改进的方法和装置。 在一些实施例中,用于物理气相沉积(PVD)的设备可以包括目标组件,其具有靶,其包括待沉积在衬底上的源材料,相对的源极分布板,与靶的背面相对并且电耦合到靶 沿着靶的外围边缘,以及设置在靶的背面和源分布板之间的空腔; 在与所述目标的中心轴重合的点处耦合到所述源分配板的电极; 以及磁控管组件,其包括设置在所述空腔内并具有与所述目标组件的中心轴线对准的旋转轴线的可旋转磁体,其中所述磁控管组件不被驱动通过所述电极。
    • 8. 发明申请
    • METHODS FOR DEPOSITING METAL IN HIGH ASPECT RATIO FEATURES
    • 用于在高比例特征中沉积金属的方法
    • US20120149192A1
    • 2012-06-14
    • US13223788
    • 2011-09-01
    • KARL BROWNALAN RITCHIEJOHN PIPITONEYING RUIDANIEL J. HOFFMAN
    • KARL BROWNALAN RITCHIEJOHN PIPITONEYING RUIDANIEL J. HOFFMAN
    • H01L21/768
    • C23C14/046C23C14/185C23C14/3492
    • Methods of depositing metal in high aspect ratio features are provided herein. In some embodiments, a method of processing a substrate includes applying RF power at VHF frequency to a target comprising metal disposed in the PVD chamber above the substrate to form a plasma from a plasma-forming gas, sputtering metal atoms from the target using the plasma while maintaining a first pressure in the PVD chamber sufficient to ionize a predominant portion of the sputtered metal atoms, depositing the ionized metal atoms on a bottom surface of the opening and on a first surface of the substrate, applying a first RF power to redistribute at least some of the deposited metal atoms from the bottom surface and upper surface to sidewalls of the opening, and repeating the deposition the redistribution processes until a first layer of metal is deposited on substantially all surfaces of the opening.
    • 本文提供了以高纵横比特征沉积金属的方法。 在一些实施例中,处理衬底的方法包括以VHF频率将RF功率施加到包括设置在衬底上的PVD室中的金属的靶以形成来自等离子体形成气体的等离子体,使用等离子体溅射来自靶的金属原子 同时保持PVD室中的第一压力足以电离溅射的金属原子的主要部分,将离子化的金属原子沉积在开口的底表面上并在衬底的第一表面上,施加第一RF功率以在 至少一些沉积的金属原子从开口的底表面和上表面到侧壁,并且重新沉积重新分布过程,直到第一金属层沉积在开口的基本上所有的表面上。