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    • 2. 发明申请
    • Nonvolatile memory cell programming
    • 非易失性存储单元编程
    • US20070058434A1
    • 2007-03-15
    • US11209294
    • 2005-08-23
    • Craig CavinsMartin NisetLaureen Parker
    • Craig CavinsMartin NisetLaureen Parker
    • G11C16/04
    • G11C16/0425G11C16/12
    • A method for programming a non-volatile memory (NVM) cell includes applying an increasing voltage to the current electrode that is used as a source during a read. The initial programming source voltage results in a relatively small number of electrons being injected into the storage layer. Because of the relatively low initial voltage level, the vertical field across the gate dielectric is reduced. The subsequent elevation of the source voltage does not raise the vertical field significantly due to the electrons in the storage layer establishing a field that reduces the vertical field. With less damage to the gate dielectric during programming, the endurance of the NVM cell is improved.
    • 一种用于对非易失性存储器(NVM)单元进行编程的方法包括:在读取期间向用作源的当前电极施加增加的电压。 初始编程源电压导致相对少量的电子被注入到存储层中。 由于初始电压电平相对较低,栅电介质的垂直场减小。 由于存储层中的电子建立了减小垂直场的场,源电压的随后升高不会显着提高垂直场。 在编程期间对栅极电介质的损害较小,NVM单元的耐久性得到改善。