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    • 1. 发明申请
    • Methods and apparatuses for cross-ontologial analytics
    • 交叉本体分析的方法和装置
    • US20080025617A1
    • 2008-01-31
    • US11493503
    • 2006-07-25
    • Christian PosseAntonio P. SanfilippoBanu GopalanRoderick M. RienscheRobert L. Baddeley
    • Christian PosseAntonio P. SanfilippoBanu GopalanRoderick M. RienscheRobert L. Baddeley
    • G06K9/62
    • G06K9/62G06F19/24G06F19/28G06K9/6892
    • Methods and apparatuses for quantifying the similarity between nodes in a plurality of electronic classification schemes are disclosed according to some aspects. In one embodiment, quantification of the similarity between a first node in a first electronic classification scheme and a second node in a second electronic classification scheme comprises finding a third node among those in the first electronic classification scheme, wherein a first product value of an inter-scheme similarity value between the second and third nodes and an intra-scheme similarity value between the first and third nodes is a maximum. It further comprises finding a fourth node among those in the second electronic classification scheme, wherein a second product value of an inter-scheme similarity value between the first and fourth nodes and an intra-scheme similarity value between the second and fourth nodes is a maximum. The maximum between the first and second product values represents a measure of similarity between the first and second nodes.
    • 根据一些方面公开了用于量化多个电子分类方案中的节点之间的相似性的方法和装置。 在一个实施例中,在第一电子分类方案中的第一节点与第二电子分类方案中的第二节点之间的相似度的量化包括在第一电子分类方案中找到第三节点之间的第三节点,其中, 第二节点和第三节点之间的节目相似度值和第一节点与第三节点之间的方案间相似度值是最大的。 其还包括在第二电子分类方案中找到第四节点,其中第一和第四节点之间的方案间相似度值的第二乘积值与第二和第四节点之间的方案间相似度值是最大值 。 第一和第二乘积值之间的最大值表示第一和第二节点之间的相似性度量。