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    • 1. 发明申请
    • QUALITY CONTROL OF THE FRIT FOR OLED SEALING
    • OLED密封件的质量控制
    • US20100118912A1
    • 2010-05-13
    • US12267737
    • 2008-11-10
    • Changyi LaiStephan Lvovich LogunovJohn David LoreyVitor Marino Schneider
    • Changyi LaiStephan Lvovich LogunovJohn David LoreyVitor Marino Schneider
    • G01N25/18
    • G01N25/72H01L51/5246
    • A method of finding defects in sealing material formed as a frame line on a glass plate includes irradiating the frame line of sealing material. A temperature of the irradiated sealing material is measured and a change of the temperature caused by a nonuniformity in sealing material is detected. Another aspect features a method of hermetically sealing a thin film device between glass plates. Sealing material is dispensed on a cover glass plate in the form of a frame line cell. The sealing material is pre-sintered onto the cover glass plate and cooled. A laser beam is moved around the frame line on the sealing material. A temperature of the sealing material contacted with the laser beam is measured. A change in the temperature (ΔT) caused by a nonuniformity in the sealing material is measured. Further aspects include a feedback process, infrared imaging and use of delta temperature data to increase sensitivity of temperature measurement data.
    • 在玻璃板上形成为框线的密封材料中发现缺陷的方法包括照射密封材料的框线。 测量照射的密封材料的温度,并检测由密封材料不均匀引起的温度变化。 另一方面的特征在于在玻璃板之间气密密封薄膜装置的方法。 密封材料以框线形电池的形式分配在盖玻璃板上。 将密封材料预先烧结到盖玻璃板上并冷却。 激光束围绕密封材料上的框架线移动。 测量与激光束接触的密封材料的温度。 测量由密封材料不均匀引起的温度变化(&Dgr; T)。 其他方面包括反馈过程,红外成像和使用增量温度数据以增加温度测量数据的灵敏度。
    • 4. 发明申请
    • METHODS AND APPARATUS FOR PACKAGING ELECTRONIC COMPONENTS
    • 包装电子元件的方法和装置
    • US20110037383A1
    • 2011-02-17
    • US12884335
    • 2010-09-17
    • Stephan Lvovich LogunovJohn David LoreyVitor Marino Schneider
    • Stephan Lvovich LogunovJohn David LoreyVitor Marino Schneider
    • H01J1/62
    • H01L51/5246
    • Packages for elements, e.g., OLEDs, that are temperature sensitive are provided. The packages have a first glass substrate (12), a second glass substrate (16), and a wall (14) that separates the first and second substrates (12,16) and hermetically seals at least one temperature sensitive element (18,28,36) between the substrates (12,16). The wall (14) comprises a sintered frit and at least a portion of the wall is laser sealed to the second substrate (16) by melting a glass component of the sintered frit. The minimum width (40) of the laser-sealed portion of the wall (14) at any location along the wall (14) is greater than or equal to 2 millimeters so as to provide greater hermeticity and strength to the package. The laser sealing is performed without substantially degrading the temperature sensitive element(s) (18,28,36) housed in the package.
    • 提供了对温度敏感的元件(例如OLED)的包装。 包装件具有第一玻璃基板(12),第二玻璃基板(16)和分隔第一和第二基板(12,16)并将气密密封至少一个温度敏感元件(18,28)的壁(14) ,36)之间。 所述壁(14)包括烧结的玻璃料,并且所述壁的至少一部分通过熔化所述烧结玻璃料的玻璃组分而激光密封到所述第二基板(16)。 在壁(14)的任何位置处的壁(14)的激光密封部分的最小宽度(40)大于或等于2毫米,以便为包装提供更大的气密性和强度。 执行激光密封而基本上不降低容纳在包装中的温度敏感元件(18,28,36)。
    • 5. 发明授权
    • Methods and apparatus for packaging electronic components
    • 电子元件包装方法和装置
    • US07815480B2
    • 2010-10-19
    • US11998600
    • 2007-11-30
    • Stephan Lvovich LogunovJohn David LoreyVitor Marino Schneider
    • Stephan Lvovich LogunovJohn David LoreyVitor Marino Schneider
    • H01J9/26H01J9/32
    • H01L51/5246
    • Packages for elements, e.g., OLEDs, that are temperature sensitive are provided. The packages have a first glass substrate (12), a second glass substrate (16), and a wall (14) that separates the first and second substrates (12,16) and hermetically seals at least one temperature sensitive element (18,28,36) between the substrates (12,16). The wall (14) comprises a sintered frit and at least a portion of the wall is laser sealed to the second substrate (16) by melting a glass component of the sintered frit. The minimum width (40) of the laser-sealed portion of the wall (14) at any location along the wall (14) is greater than or equal to 2 millimeters so as to provide greater hermeticity and strength to the package. The laser sealing is performed without substantially degrading the temperature sensitive element(s) (18,28,36) housed in the package.
    • 提供了对温度敏感的元件(例如OLED)的包装。 包装件具有第一玻璃基板(12),第二玻璃基板(16)和分隔第一和第二基板(12,16)并将气密密封至少一个温度敏感元件(18,28)的壁(14) ,36)之间。 所述壁(14)包括烧结的玻璃料,并且所述壁的至少一部分通过熔化所述烧结玻璃料的玻璃组分而激光密封到所述第二基板(16)。 在壁(14)的任何位置处的壁(14)的激光密封部分的最小宽度(40)大于或等于2毫米,以便为包装提供更大的气密性和强度。 执行激光密封而基本上不降低容纳在包装中的温度敏感元件(18,28,36)。
    • 9. 发明申请
    • METHODS OF CHARACTERIZING AND MEASURING PARTICULATE FILTER ACCUMULATION
    • 表征和测量颗粒过滤器累积的方法
    • US20100108890A1
    • 2010-05-06
    • US12582981
    • 2009-10-21
    • Natarajan GunasekaranVitor Marino SchneiderCharlene Marie SmithCarlo Anthony Kosik Williams
    • Natarajan GunasekaranVitor Marino SchneiderCharlene Marie SmithCarlo Anthony Kosik Williams
    • G01J5/02
    • G01N21/94G01N21/3504G01N21/3577G01N21/3581G01N2201/129
    • Methods of characterizing and measuring particulate accumulation in a family of particulate filters (10) are disclosed. The disclosure can be applied to diesel, gasoline and natural gas fueled engines, fluid streams bearing dust, and chemical and biological substances such as may be found in laboratory fluids, for example, air. In one embodiment, the disclosure is directed to measuring diesel particulate accumulation in a family of diesel particulate filters. The methods include measuring calibration complex terahertz transmission spectra (PC(f)) of at least a portion (17) of at least one particulate or diesel particulate filter in the family for different known particulate or diesel particulate amounts (ADP). The method also involves performing a partial least squares (PLS) analysis on the calibration complex terahertz transmission spectra to establish a calibration relationship between the complex terahertz transmission spectra and the particulate or diesel particulate amounts. The complex transmission spectrum of a subject particulate filter or diesel particulate filter having an unknown amount of particulate or diesel particulate accumulation is then determined and compared to the linear calibration relationship to establish a measured amount of particulates or diesel particulates. The methods include using a terahertz (THz) system (100) to obtain the complex terahertz transmission spectra for the calibration and subject particulate or diesel particulate filters.
    • 公开了在微粒过滤器(10)系列中表征和测量颗粒积聚的方法。 本公开可以应用于柴油,汽油和天然气燃料发动机,带有灰尘的流体流,以及诸如可以在实验室流体例如空气中发现的化学和生物物质。 在一个实施方案中,本公开涉及测量柴油颗粒过滤器系列中的柴油颗粒物积聚。 所述方法包括测量家族中至少一种颗粒或柴油颗粒​​过滤器的至少一部分(17)的校准复数太赫兹透射光谱(PC(f)),用于不同的已知颗粒或柴油颗粒​​量(ADP)。 该方法还涉及对校准复数太赫兹透射光谱进行偏最小二乘法(PLS)分析,以建立复数太赫兹透射光谱与颗粒或柴油颗粒​​量之间的校准关系。 然后确定具有未知量的颗粒或柴油颗粒​​物积聚的目标颗粒过滤器或柴油颗粒​​过滤器的复杂透射光谱,并将其与线性校准关系进行比较,以建立测量量的颗粒物或柴油颗粒​​物。 这些方法包括使用太赫兹(THz)系统(100)来获得用于校准和主体颗粒或柴油颗粒​​过滤器的复数太赫兹透射光谱。