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    • 3. 发明授权
    • Voltage booster for semiconductor device and semiconductor memory device using same
    • 用于半导体器件的电压升压器和使用其的半导体存储器件
    • US07521988B2
    • 2009-04-21
    • US11730651
    • 2007-04-03
    • Chang-Ho Shin
    • Chang-Ho Shin
    • G05F1/10G05F3/02
    • G11C5/145G11C7/20G11C11/4072G11C11/4074
    • A semiconductor device has a power-saving mode and a normal mode. A voltage booster within the semiconductor device responds to the normal mode and the power-saving mode by controlling various internal operating voltages of the semiconductor device using a level shifter, an internal voltage booster, and a voltage boosting circuit. The initial voltage booster is configured to transmit an external power supply voltage through an initial boosting node to a voltage boosting terminal in response to the level shifter output signal during the normal mode, and to block transmission of the external power supply voltage to the initial boosting node to decrease a voltage level of the initial boosting node during the power-saving mode.
    • 半导体器件具有省电模式和正常模式。 半导体器件内的升压器通过使用电平转换器,内部升压器和升压电路控制半导体器件的各种内部工作电压来响应正常模式和功率节省模式。 初始升压器被配置为响应于在正常模式期间的电平移位器输出信号而将外部电源电压通过初始升压节点发送到升压端子,并且阻止外部电源电压发送到初始升压 节点,以在节电模式期间降低初始升压节点的电压电平。
    • 5. 发明授权
    • Semiconductor memory device having a voltage boosting circuit
    • 具有升压电路的半导体存储器件
    • US07558128B2
    • 2009-07-07
    • US11473402
    • 2006-06-24
    • Chang-Ho ShinJong-Hyun Choi
    • Chang-Ho ShinJong-Hyun Choi
    • G11C5/14
    • G11C5/145G11C5/147
    • A semiconductor memory device includes a cell array internal voltage generating circuit for generating cell array reference voltage and a cell array internal voltage from a first external power voltage, a peripheral circuit internal voltage generating circuit for generating a peripheral circuit reference voltage and a peripheral circuit internal voltage from the first external power voltage, and a voltage boosting circuit power voltage generating circuit for generating a voltage boosting circuit reference voltage and a voltage boosting circuit power voltage from a second external power voltage.
    • 一种半导体存储器件,包括用于产生单元阵列参考电压的单元阵列内部电压产生电路和来自第一外部电源电压的单元阵列内部电压,用于产生外围电路参考电压的外围电路内部电压产生电路和外部电路内部电路的外围电路 来自第一外部电源电压的电压,以及用于从第二外部电源电压产生升压电路参考电压和升压电路电源电压的升压电路电源电压产生电路。
    • 6. 发明申请
    • Voltage booster for semiconductor device and semiconductor memory device using same
    • 用于半导体器件的电压升压器和使用其的半导体存储器件
    • US20080018381A1
    • 2008-01-24
    • US11730651
    • 2007-04-03
    • Chang-Ho Shin
    • Chang-Ho Shin
    • G05F1/10G11C5/14
    • G11C5/145G11C7/20G11C11/4072G11C11/4074
    • A semiconductor device has a power-saving mode and a normal mode. A voltage booster within the semiconductor device responds to the normal mode and the power-saving mode by controlling various internal operating voltages of the semiconductor device using a level shifter, an internal voltage booster, and a voltage boosting circuit. The initial voltage booster is configured to transmit an external power supply voltage through an initial boosting node to a voltage boosting terminal in response to the level shifter output signal during the normal mode, and to block transmission of the external power supply voltage to the initial boosting node to decrease a voltage level of the initial boosting node during the power-saving mode.
    • 半导体器件具有省电模式和正常模式。 半导体器件内的升压器通过使用电平转换器,内部升压器和升压电路控制半导体器件的各种内部工作电压来响应正常模式和功率节省模式。 初始升压器被配置为响应于在正常模式期间的电平移位器输出信号而将外部电源电压通过初始升压节点发送到升压端子,并且阻止外部电源电压发送到初始升压 节点,以在节电模式期间降低初始升压节点的电压电平。
    • 9. 发明授权
    • Circuit and method for power-on reset
    • 上电复位电路及方法
    • US07348816B2
    • 2008-03-25
    • US11338202
    • 2006-01-24
    • Chang-Ho Shin
    • Chang-Ho Shin
    • H03L7/00
    • H03K17/223
    • In a power-on reset circuit and a method of generating a power-on reset signal tolerant of variation of an ambient temperature, the power-on reset circuit includes a first power-on reset unit, a second power-on reset unit and a logic gate. The first power-on reset unit generates a first power-on reset signal that is activated at a first level of a power supply voltage at a first temperature, and is activated at a second level of the power supply voltage at a second temperature. The second power-on reset unit generates a second power-on reset signal that is activated at the second level at the first temperature, and is activated at the first level at the second temperature. The logic gate executes a logical disjunction operation or a logical conjunction operation of the first power-on reset signal and the second power-on reset signal and generates a third power-on reset signal.
    • 在上电复位电路和产生允许环境温度变化的上电复位信号的方法中,上电复位电路包括第一上电复位单元,第二上电复位单元和第二上电复位单元 逻辑门 第一上电复位单元产生在第一温度的电源电压的第一电平下被激活的第一上电复位信号,并且在第二温度的电源电压的第二电平下被激活。 第二上电复位单元产生在第二温度下在第二电平激活的第二上电复位信号,并且在第二温度下在第一电平激活。 逻辑门执行第一上电复位信号和第二上电复位信号的逻辑分离操作或逻辑连接操作,并产生第三上电复位信号。
    • 10. 发明申请
    • Semiconductor memory device
    • 半导体存储器件
    • US20060291279A1
    • 2006-12-28
    • US11473402
    • 2006-06-24
    • Chang-Ho ShinJong-Hyun Choi
    • Chang-Ho ShinJong-Hyun Choi
    • G11C11/34
    • G11C5/145G11C5/147
    • A semiconductor memory device includes a cell array internal voltage generating circuit for generating cell array reference voltage and a cell array power voltage from a first external power voltage, a peripheral circuit internal voltage generating circuit for generating a peripheral circuit reference voltage and a peripheral circuit power voltage from the first external power voltage, and a voltage boosting circuit power voltage generating circuit for generating a voltage boosting circuit reference voltage and a voltage boosting circuit power voltage from a second external power voltage.
    • 一种半导体存储器件,包括用于从第一外部电源电压产生单元阵列参考电压和单元阵列电源电压的单元阵列内部电压产生电路,用于产生外围电路参考电压的外围电路内部电压产生电路和外围电路电源 来自第一外部电源电压的电压,以及用于从第二外部电源电压产生升压电路参考电压和升压电路电源电压的升压电路电源电压产生电路。